67 results on '"Strain mapping"'
Search Results
2. Annealing of focused ion beam damage in gold microcrystals: an in situ Bragg coherent X-ray diffraction imaging study
- Author
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Ross Harder, Wonsuk Cha, Nicholas W. Phillips, Felix Hofmann, David Yang, and Kay Song
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Diffraction ,Nuclear and High Energy Physics ,strain mapping ,Materials science ,Physics::Instrumentation and Detectors ,Annealing (metallurgy) ,Thermal resistance ,Bragg coherent X-ray diffraction imaging ,FOS: Physical sciences ,Physics::Optics ,chemistry.chemical_element ,02 engineering and technology ,Focused ion beam ,Crystal ,03 medical and health sciences ,Gallium ,Instrumentation ,030304 developmental biology ,Condensed Matter - Materials Science ,0303 health sciences ,Radiation ,business.industry ,Materials Science (cond-mat.mtrl-sci) ,cross-correlation ,021001 nanoscience & nanotechnology ,Research Papers ,facet growth ,3. Good health ,Reflection (mathematics) ,chemistry ,X-ray crystallography ,Optoelectronics ,annealing ,0210 nano-technology ,business - Abstract
Focused ion beam (FIB) techniques are commonly used to machine, analyse and image materials at the micro- and nanoscale. However, FIB modifies the integrity of the sample by creating defects that cause lattice distortions. Methods have been developed to reduce FIB-induced strain, however these protocols need to be evaluated for their effectiveness. Here we use non-destructive Bragg coherent X-ray diffraction imaging to study the in situ annealing of FIB-milled gold microcrystals. We simultaneously measure two non-collinear reflections for two different crystals during a single annealing cycle, demonstrating the ability to reliably track the location of multiple Bragg peaks during thermal annealing. The thermal lattice expansion of each crystal is used to calculate the local temperature. This is compared to thermocouple readings, which are shown to be substantially affected by thermal resistance. To evaluate the annealing process, we analyse each reflection by considering facet area evolution, cross-correlation maps of displacement field and binarised morphology, and average strain plots. The crystal's strain and morphology evolve with increasing temperature, which is likely to be caused by the diffusion of gallium in gold below ~280{\deg}C and the self-diffusion of gold above ~280{\deg}C. The majority of FIB-induced strains are removed by 380-410\degree C, depending on which reflection is being considered. Our observations highlight the importance of measuring multiple reflections to unambiguously interpret material behaviour., Comment: 51 pages, 16 figures
- Published
- 2021
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3. Machine Learning Based Precision Orientation and Strain Mapping from 4D Diffraction Datasets
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Jiong Zhang, Lingfeng He, Renliang Yuan, and Jian-Min Zuo
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Diffraction ,Materials science ,business.industry ,Strain mapping ,Computer vision ,Artificial intelligence ,Orientation (graph theory) ,business ,Instrumentation - Published
- 2021
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4. Correlation between Electrical Transport and Nanoscale Strain in InAs/In0.6Ga0.4As Core–Shell Nanowires
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Andrew M. Minor, Thomas Kanne Nordqvist, Eva Olsson, Lunjie Zeng, Christoph Gammer, Wolfgang Jäger, Peter Krogstrup, Jesper Nygård, and Burak Ozdol
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Materials science ,Nanostructure ,Letter ,strain mapping ,Band gap ,Nanowire ,Bioengineering ,02 engineering and technology ,Conductivity ,010402 general chemistry ,01 natural sciences ,piezoresistance ,Strain engineering ,transmission electron microscopy ,General Materials Science ,business.industry ,Mechanical Engineering ,General Chemistry ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,Piezoresistive effect ,InAs nanowire ,0104 chemical sciences ,Semiconductor ,Optoelectronics ,Charge carrier ,0210 nano-technology ,business - Abstract
Free-standing semiconductor nanowires constitute an ideal material system for the direct manipulation of electrical and optical properties by strain engineering. In this study, we present a direct quantitative correlation between electrical conductivity and nanoscale lattice strain of individual InAs nanowires passivated with a thin epitaxial In0.6Ga0.4As shell. With an in situ electron microscopy electromechanical testing technique, we show that the piezoresistive response of the nanowires is greatly enhanced compared to bulk InAs, and that uniaxial elastic strain leads to increased conductivity, which can be explained by a strain-induced reduction in the band gap. In addition, we observe inhomogeneity in strain distribution, which could have a reverse effect on the conductivity by increasing the scattering of charge carriers. These results provide a direct correlation of nanoscale mechanical strain and electrical transport properties in free-standing nanostructures.
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- 2018
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5. In situ nanobeam electron diffraction strain mapping of planar slip in stainless steel
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Christoph Gammer, Jim Ciston, Andrew M. Minor, Thomas C. Pekin, and Colin Ophus
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In situ ,Materials science ,02 engineering and technology ,Planar slip ,01 natural sciences ,Condensed Matter::Materials Science ,Optics ,Residual strain ,0103 physical sciences ,General Materials Science ,Composite material ,010302 applied physics ,Strain (chemistry) ,business.industry ,Mechanical Engineering ,technology, industry, and agriculture ,Metals and Alloys ,Strain mapping ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,Electron diffraction ,Mechanics of Materials ,Dislocation ,Deformation (engineering) ,0210 nano-technology ,business - Abstract
Nanobeam electron diffraction strain mapping has been used to measure the strain evolution in stainless steel under in situ deformation. As the amount of deformation increases, the leading dislocation of a planar slip band leaves behind a residual strain in the form of a small lattice expansion. Dislocation analysis confirmed that the dislocations involved were type. While the characteristic residual strain of planar slip has often been observed, it has never before been directly measured. Our results provide a view into the dynamic mechanisms of planar slip, and showcase the possibilities of multidimensional in situ imaging.
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- 2018
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6. Full-Field Mechanical Strain Mapping Using Digital Holographic Microscopy
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Cao Runyu, Xiao Wen, Wu Xintong, and Pan Feng
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Shearing (physics) ,Digital image correlation ,Materials science ,business.industry ,Phase contrast microscopy ,Strain mapping ,02 engineering and technology ,Full field ,021001 nanoscience & nanotechnology ,01 natural sciences ,law.invention ,010309 optics ,Optics ,law ,0103 physical sciences ,Digital holographic microscopy ,0210 nano-technology ,business ,Holographic recording - Abstract
We proposed a method for mapping full-field shearing strain distributions in x and y direction. Displacements and strain maps of living osteocytes can be estimated from phase maps recorded by a digital holographic microscopy.
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- 2020
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7. Optical coherence elastography by ambient pressure modulation for high-resolution strain mapping applied to patterned cross-linking
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Sabine Kling
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elastography ,Materials science ,Ultraviolet Rays ,Riboflavin ,Biomedical Engineering ,Biophysics ,Measure (physics) ,High resolution ,Bioengineering ,Biochemistry ,Biomaterials ,Cornea ,03 medical and health sciences ,Optical coherence elastography ,0302 clinical medicine ,Optics ,medicine ,Animals ,Life Sciences–Engineering interface ,030304 developmental biology ,0303 health sciences ,medicine.diagnostic_test ,business.industry ,Strain mapping ,eye ,eye diseases ,Biomechanical Phenomena ,Rats ,non-contact ,Cross-Linking Reagents ,cross-linking ,Ambient pressure ,strain map ,Modulation ,030221 ophthalmology & optometry ,Elasticity Imaging Techniques ,Elastography ,sense organs ,Collagen ,business ,Axial symmetry ,Tomography, Optical Coherence ,Biotechnology - Abstract
Journal of the Royal Society. Interface, 17 (162), ISSN:1742-5689, ISSN:1742-5662
- Published
- 2020
8. Probing local order in multiferroics by transmission electron microscopy
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Rolf Erni, Marco Campanini, and Marta D. Rossell
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0303 health sciences ,business.industry ,General Physics and Astronomy ,Strain mapping ,02 engineering and technology ,General Chemistry ,021001 nanoscience & nanotechnology ,03 medical and health sciences ,Order (biology) ,Transmission electron microscopy ,Scanning transmission electron microscopy ,Optoelectronics ,General Materials Science ,Multiferroics ,0210 nano-technology ,business ,030304 developmental biology - Abstract
The ongoing trend toward miniaturization has led to an increased interest in the magnetoelectric effect, which could yield entirely new device concepts, such as electric field-controlled magnetic data storage. As a result, much work is being devoted to developing new robust room temperature (RT) multiferroic materials that combine ferromagnetism and ferroelectricity. However, the development of new multiferroic devices has proved unexpectedly challenging. Thus, a better understanding of the properties of multiferroic thin films and the relation with their microstructure is required to help drive multiferroic devices toward technological application. This review covers in a concise manneradvancedanalytical imaging methods based on (scanning) transmission electron microscopy which can potentially be used to characterize complex multiferroic materials. It consists of a first broad introduction to the topic followed by a section describing the so-called phase-contrast methods, which can be used to map the polar and magnetic order in magnetoelectric multiferroics at different spatial length scales down to atomic resolution. Section 3 is devoted to electron nanodiffraction methods. These methods allow measuring local strains, identifying crystal defects and determining crystal structures, and thus offer important possibilities for the detailed structural characterization of multiferroics in the ultrathin regime or inserted in multilayers or superlattice architectures. Thereafter, in Section 4, methods are discussed which allow for analyzing local strain, whereas in Section 5 methods are addressed which allow for measuring local polarization effects on a length scale of individual unit cells. Here, it is shown that the ferroelectric polarization can be indirectly determined from the atomic displacements measured in atomic resolution images. Finally, a brief outlook is given on newly established methods to probe the behavior of ferroelectric and magnetic domains and nanostructures during in situ heating/electrical biasing experiments. These in situ methods are just about at the launch of becoming increasingly popular, particularly in the field of magnetoelectric multiferroics, and shall contribute significantly to understanding the relationship between the domain dynamics of multiferroics and the specific microstructure of the films providing important guidance to design new devices and to predict and mitigate failures.
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- 2019
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9. Patterned probes for high precision 4D-STEM bragg measurements
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Karen C. Bustillo, Andrew M. Minor, Colin Ophus, Alexander Müller, Benjamin H. Savitzky, Lauren A. Hughes, and Steven E. Zeltmann
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Diffraction ,Accuracy and precision ,Materials science ,Aperture ,FOS: Physical sciences ,Bioengineering ,Applied Physics (physics.app-ph) ,02 engineering and technology ,Optical Physics ,01 natural sciences ,Atomic ,Optics ,Electron diffraction ,Particle and Plasma Physics ,0103 physical sciences ,Scanning transmission electron microscopy ,Nanobeam electron diffraction ,Nuclear ,Instrumentation ,Image resolution ,010302 applied physics ,Microscopy ,Condensed Matter - Materials Science ,Scattering ,business.industry ,Shot noise ,Materials Science (cond-mat.mtrl-sci) ,Molecular ,Physics - Applied Physics ,021001 nanoscience & nanotechnology ,Atomic and Molecular Physics, and Optics ,cond-mat.mtrl-sci ,Electronic, Optical and Magnetic Materials ,Other Physical Sciences ,Reciprocal lattice ,Strain mapping ,0210 nano-technology ,business ,physics.app-ph ,4D-STEM - Abstract
Nanoscale strain mapping by four-dimensional scanning transmission electron microscopy (4D-STEM) relies on determining the precise locations of Bragg-scattered electrons in a sequence of diffraction patterns, a task which is complicated by dynamical scattering, inelastic scattering, and shot noise. These features hinder accurate automated computational detection and position measurement of the diffracted disks, limiting the precision of measurements of local deformation. Here, we investigate the use of patterned probes to improve the precision of strain mapping. We imprint a "bullseye" pattern onto the probe, by using a binary mask in the probe-forming aperture, to improve the robustness of the peak finding algorithm to intensity modulations inside the diffracted disks. We show that this imprinting leads to substantially improved strain-mapping precision at the expense of a slight decrease in spatial resolution. In experiments on an unstrained silicon reference sample, we observe an improvement in strain measurement precision from 2.7% of the reciprocal lattice vectors with standard probes to 0.3% using bullseye probes for a thin sample, and an improvement from 4.7% to 0.8% for a thick sample. We also use multislice simulations to explore how sample thickness and electron dose limit the attainable accuracy and precision for 4D-STEM strain measurements., 29 pages, 7 figures; revision 1
- Published
- 2019
10. A demonstration of the mechanical sensing capability of individually contacted vertical piezoelectric nanowires arranged in matrices
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Edgar A.A. Leon Perez, Mitesh Parmar, Elise Saoutieff, Emmanuelle Pauliac-Vaujour, Mireille Mouis, Gustavo Ardila, Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC ), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), and Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)
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Materials science ,Fabrication ,Nanowire ,02 engineering and technology ,010402 general chemistry ,01 natural sciences ,Deflection (engineering) ,General Materials Science ,Electrical and Electronic Engineering ,[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics ,Pixel ,Piezotronics ,Renewable Energy, Sustainability and the Environment ,business.industry ,Mechanical sensor ,Biasing ,021001 nanoscience & nanotechnology ,Piezoelectricity ,0104 chemical sciences ,Volumetric flow rate ,Electrode ,Optoelectronics ,ZnO nanowires ,Strain mapping ,Microfabrication ,0210 nano-technology ,business - Abstract
International audience; This paper reports the fabrication of arrays of vertical piezoelectric nanowires which are individually contacted at their base, and demonstrates that an electrical response to strain can be obtained from individual nanowires from the array, without external biasing exploiting the piezotronic effect. Such a technology could thus be used for the fabrication of self-powered sensors for mechanical strain mapping, where each individually contacted nanowire would act as the strain sensing equivalent of a pixel. Lateral mapping resolutions in the micrometer range can be obtained. Here, the hydrothermal method was used to grow vertical ZnO nanowires selectively between two electrodes that had been patterned beforehand. For the sake of demonstration, nanowires deflection was produced by subjecting the array of nanowires to an incident lateral gas flow of controlled rate, which was switched on and off repeatedly across the sample while electrical response was measured. Different experimental configurations were tested in terms of flow rate, flow orientation, or nanowire position with respect to tube outlet. Experiments were carried out with compressed nitrogen and air. The experimental results are fully consistent with the piezoelectric and piezotronic response which can be expected with this geometry. Moreover, it is shown that the electrical response under nitrogen flow is a linear function of flow rate and that its sign provides information about flow direction. These results demonstrate the very promising prospects of this new technology for high-resolution mapping, with potential applications in gas or liquid flow sensing, fingerprints detection or human-machine interfaces.
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- 2019
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11. Strain mapping in the Achilles tendon – A systematic review
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Koen Peers, Hannelore Desmet, Pieter Slagmolen, and Stijn Bogaerts
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Diagnostic Imaging ,medicine.medical_specialty ,Biomedical Engineering ,Biophysics ,Strain (injury) ,Achilles Tendon ,Weight-Bearing ,Transverse strain ,03 medical and health sciences ,0302 clinical medicine ,Humans ,Medicine ,Orthopedics and Sports Medicine ,Achilles tendon ,business.industry ,Rehabilitation ,Strain mapping ,030229 sport sciences ,medicine.disease ,Global strain ,Tendon ,medicine.anatomical_structure ,Strain distribution ,Tendinopathy ,Physical therapy ,Stress, Mechanical ,business ,030217 neurology & neurosurgery - Abstract
Achilles tendinopathy remains one of the most prevalent overuse injuries in elite as well as recreational athletes. Regardless of the fact that the aetiology of tendinopathy has not been fully understood, therapeutic mechanical loading programs have emerged as being the treatment of choice. In this light, mechanical properties of the tendon and their response to changes in loading or unloading have been the subject of many previous investigations. One of these properties often investigated is strain, a measure of relative deformation. By means of a systematic review, an overview was given of research in this field, with a primary objective to list the methods used and secondary aim to synthesize data on strain mapping in the Achilles tendon. Following the guidelines of the PRISMA statement, 47 articles were found appropriate for qualitative assessment. Achilles tendon strain has been investigated across a variety of contexts, including the response to exercise, walking, unloading, ageing, hormonal changes and weight. Only three studies investigated the effect of the presence of tendinopathy on strain. Ultrasound was the most often used imaging modality to measure or estimate strain. Further methodological parameters, e.g. the location of measurement, differed greatly between all different studies. Nearly all studies considered global strain. Some studies investigated the transverse strain response of the Achilles tendon. Recently, however, the role of local - intratendinous - strain distribution has been found to be of critical importance and further studies should focus on imaging modalities to investigate these local changes.
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- 2016
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12. Obtaining the J-integral by diffraction-based crack-field strain mapping
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S.M. Barhli, Thorsten Hermann Becker, Chris Simpson, Philip J. Withers, Thomas James Marrow, Mahmoud Mostafavi, and Luis Saucedo-Mora
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Diffraction ,strain mapping ,Materials science ,Field (physics) ,XRD ,diffraction ,02 engineering and technology ,law.invention ,Condensed Matter::Materials Science ,0203 mechanical engineering ,law ,Stress intensity factor ,Earth-Surface Processes ,J-integral ,Strain (chemistry) ,business.industry ,Stress-Intensity Factor ,Mathematical analysis ,Elastic energy ,Structural engineering ,021001 nanoscience & nanotechnology ,Finite element method ,Synchrotron ,020303 mechanical engineering & transports ,EDXRD ,Crystallite ,0210 nano-technology ,business - Abstract
The analysis by diffraction of polycrystalline materials can determine the full tensor of the elastic strains within them. Point-by-point maps of elastic strain can thus be obtained in fine-grained engineering alloys, typically using synchrotron X-rays or neutrons. In this paper, a novel approach is presented to calculate the elastic strain energy release rate of a loaded crack from two-dimensional strain maps that are obtained by diffraction. The method is based on a Finite Element approach, which uses diffraction data to obtain the parameters required to calculate the J-integral via the contour integral method. The J integral is robust to uncertainties in the crack tip position and to poor definition of the field in the crack vicinity, and does not rely on theoretical assumptions of the field shape. A validation of the technique is presented using a synthetic dataset from a finite element model. Its experimental application is demonstrated in an analysis of a synchrotron X-ray diffraction strain map for a loaded fatigue crack in a bainitic steel.
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- 2016
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13. Combining 2 nm Spatial Resolution and 0.02% Precision for Deformation Mapping of Semiconductor Specimens in a Transmission Electron Microscope by Precession Electron Diffraction
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Nicolas Bernier, David Cooper, Jean-Luc Rouvière, Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Laboratoire d'Etude des Matériaux par Microscopie Avancée (LEMMA ), Modélisation et Exploration des Matériaux (MEM), Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), European Project: 306535,HOLOVIEW, and Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut de Recherche Interdisciplinaire de Grenoble (IRIG)
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Relaxation ,Strain Mapping ,Materials science ,Thin-Films ,Holography ,Bioengineering ,02 engineering and technology ,Deformation (meteorology) ,01 natural sciences ,Strain-Measurements ,law.invention ,Stress (mechanics) ,Optics ,law ,0103 physical sciences ,Devices ,Transmission ,Precession electron diffraction ,Electron Microscopy ,General Materials Science ,Image resolution ,[PHYS]Physics [physics] ,010302 applied physics ,Fields ,business.industry ,Mechanical Engineering ,technology, industry, and agriculture ,General Chemistry ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,Semiconductor ,Semiconductors ,Transmission electron microscopy ,Precession Diffraction ,Si ,Electron microscope ,0210 nano-technology ,business - Abstract
International audience; Precession electron diffraction has been used to provide accurate deformation maps of a device structure showing that this technique can provide a spatial resolution of better than 2 nm and a precision of better than 0.02%. The deformation maps have been fitted to simulations that account for thin specimen relaxation. By combining the experimental deformation maps and simulations, we have been able to separate the effects of the stressor and recessed sources and drains and show that the Si3N4 stressor increases the in-plane deformation in the silicon channel from 0.92 to 1.52 +/- 0.02%. In addition, the stress in the deposited Si3N4 film has been calculated from the simulations, which is an important parameter for device design.
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- 2015
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14. Precisely detecting atomic position of atomic intensity images
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Yaohe Zhou, Sai Tang, Junjie Li, Zhijun Wang, Yaolin Guo, and Jincheng Wang
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Condensed Matter::Quantum Gases ,Phase field crystal ,Chemistry ,business.industry ,Atomic force microscopy ,Strain mapping ,Atomic and Molecular Physics, and Optics ,Electronic, Optical and Magnetic Materials ,Optics ,Position (vector) ,Transmission electron microscopy ,Physics::Atomic and Molecular Clusters ,Physics::Atomic Physics ,Atomic physics ,business ,Instrumentation ,Intensity (heat transfer) - Abstract
We proposed a quantitative method to detect atomic position in atomic intensity images from experiments such as high-resolution transmission electron microscopy, atomic force microscopy, and simulation such as phase field crystal modeling. The evaluation of detection accuracy proves the excellent performance of the method. This method provides a chance to precisely determine atomic interactions based on the detected atomic positions from the atomic intensity image, and hence to investigate the related physical, chemical and electrical properties.
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- 2015
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15. Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles
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Jakob Schiøtz, Jakob Birkedal Wagner, Pei Liu, Jacob Madsen, and Thomas Willum Hansen
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Accuracy and precision ,Materials science ,02 engineering and technology ,01 natural sciences ,Atomic units ,Noise (electronics) ,Optics ,High-resolution transmission electron microscopy ,0103 physical sciences ,Microscopy ,lcsh:QD901-999 ,Chemical Engineering (miscellaneous) ,Energy filtered transmission electron microscopy ,Radiology, Nuclear Medicine and imaging ,lcsh:Science (General) ,010306 general physics ,Spectroscopy ,business.industry ,Surface strain ,Research ,021001 nanoscience & nanotechnology ,Tilt (optics) ,Transmission electron microscopy ,Nanoparticles ,Strain mapping ,lcsh:Crystallography ,0210 nano-technology ,business ,lcsh:Q1-390 - Abstract
Strain analysis from high-resolution transmission electron microscopy (HRTEM) images offers a convenient tool for measuring strain in materials at the atomic scale. In this paper we present a theoretical study of the precision and accuracy of surface strain measurements directly from aberration-corrected HRTEM images. We examine the influence of defocus, crystal tilt and noise, and find that absolute errors of at least 1–2% strain should be expected. The model structures include surface relaxations determined using molecular dynamics, and we show that this is important for correctly evaluating the errors introduced by image aberrations. Electronic supplementary material The online version of this article (doi:10.1186/s40679-017-0047-0) contains supplementary material, which is available to authorized users.
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- 2017
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16. Image-guided failure assessment of human trabecular bone - Inverse finite element modelling for characterization of elastic properties
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Ralph Müller, Alexander Zwahlen, Philipp Schneider, Werner Schmölz, Davide Ruffoni, and David Christen
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Image-guided failure assessment ,Computer science ,business.industry ,Biomedical Engineering ,Inverse ,Strain mapping ,Structural engineering ,Finite element method ,Characterization (materials science) ,Image (mathematics) ,Trabecular bone ,Inverse μFE modeling ,Synchrotron radiation μCT ,business ,Failure assessment - Abstract
Biomedical Engineering / Biomedizinische Technik, 58 (Supplement 1), ISSN:0013-5585, ISSN:1862-278X
- Published
- 2017
17. Atomap: a new software tool for the automated analysis of atomic resolution images using two-dimensional Gaussian fitting
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Thomas Tybell, Per Erik Vullum, Randi Holmestad, Magnus Nord, and Ian MacLaren
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Materials science ,Gaussian ,Analytical chemistry ,Oxide ,Image processing ,02 engineering and technology ,Non-rigid registration ,01 natural sciences ,Quantitative STEM ,symbols.namesake ,chemistry.chemical_compound ,Condensed Matter::Materials Science ,Software ,Lattice (order) ,0103 physical sciences ,Scanning transmission electron microscopy ,Chemical Engineering (miscellaneous) ,Radiology, Nuclear Medicine and imaging ,Spectroscopy ,010302 applied physics ,business.industry ,Research ,Heterojunction ,021001 nanoscience & nanotechnology ,Dark field microscopy ,Computational physics ,chemistry ,symbols ,Strain mapping ,Oxygen octahedral distortion ,0210 nano-technology ,business - Abstract
Scanning transmission electron microscopy (STEM) data with atomic resolution can contain a large amount of information about the structure of a crystalline material. Often, this information is hard to extract, due to the large number of atomic columns and large differences in intensity from sublattices consisting of different elements. In this work, we present a free and open source software tool for analysing both the position and shapes of atomic columns in STEM-images, using 2-D elliptical Gaussian distributions. The software is tested on variants of the perovskite oxide structure. By first fitting the most intense atomic columns and then subtracting them, information on all the projected sublattices can be obtained. From this, we can extract changes in the lattice parameters and shape of A-cation columns from annular dark field images of perovskite oxide heterostructures. Using annular bright field images, shifts in oxygen column positions are also quantified in the same heterostructure. The precision of determining the position of atomic columns is compared between STEM data acquired using standard acquisition, and STEM-images obtained as an image stack averaged after using non-rigid registration. © The Author(s) 2017. This article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made.
- Published
- 2017
18. OC22.04: Ultrasound-based strain mapping for contraction frequency in the non-pregnant uterus
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Massimo Mischi, N.P. Kuijsters, F. Sammali, Y. Huang, Benedictus C. Schoot, and C. Blank
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Radiological and Ultrasound Technology ,business.industry ,Ultrasound ,Contraction frequency ,Uterus ,Obstetrics and Gynecology ,Strain mapping ,General Medicine ,Anatomy ,Non pregnant ,medicine.anatomical_structure ,Reproductive Medicine ,Medicine ,Radiology, Nuclear Medicine and imaging ,business - Published
- 2018
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19. Strain mapping at the interface of InP/In x Ga1-x As/InP as measured by the scanning transmission electron microscope-moiré fringe method
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Yoshifumi Oshima, Tongmin Chen, and Masashi Akabori
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Materials science ,business.industry ,Interface (computing) ,Scanning transmission electron microscopy ,General Engineering ,General Physics and Astronomy ,Optoelectronics ,Strain mapping ,Moiré pattern ,business - Published
- 2019
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20. Nano-scale strain mapping in complete nanowire-based electronic devices by Bragg coherent X-ray diffraction
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Dmitry Dzhigaev
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Materials science ,business.industry ,Nanowire ,Strain mapping ,Condensed Matter Physics ,Biochemistry ,Inorganic Chemistry ,Structural Biology ,X-ray crystallography ,Optoelectronics ,General Materials Science ,Electronics ,Physical and Theoretical Chemistry ,business ,Nanoscopic scale - Published
- 2019
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21. Optimization of phase-resolved optical coherence elastography for highly-sensitive monitoring of slow-rate strains
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G. V. Gelikonov, Alexander I. Omelchenko, A. V. Yuzhakov, Sergey Yu. Ksenofontov, Olga I. Baum, Lev A. Matveev, Emil N. Sobol, A. L. Matveyev, A. A. Sovetsky, Vladimir Y. Zaitsev, and Dmitry V. Shabanov
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Optical coherence elastography ,Optics ,Materials science ,Physics and Astronomy (miscellaneous) ,business.industry ,Slow rate ,Phase (waves) ,Strain mapping ,business ,Instrumentation ,Highly sensitive - Published
- 2019
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22. Atherosclerosis characterization using lipid-specific photoacoustic imaging and 4D ultrasound strain mapping in mice
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Gurneet S Sangha and Craig J. Goergen
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Materials science ,Acoustics and Ultrasonics ,Strain (chemistry) ,business.industry ,Ultrasound ,Hemodynamics ,Photoacoustic imaging in biomedicine ,Strain mapping ,symbols.namesake ,Arts and Humanities (miscellaneous) ,symbols ,Lipid localization ,business ,Doppler effect ,4d ultrasound ,Biomedical engineering - Abstract
Dual-modality photoacoustic tomography (PAT) and four-dimensional ultrasound (4DUS) imaging have recently been used study atherosclerosis progression in small animals. PAT uses pulsed laser light to induce acoustic waves and reconstruct lipid-specific compositional images of tissue. 4DUS captures dynamic volumetric information and can be used to estimate three-dimensional (3D) Green-Lagrange strain using a direct deformation estimation method. Here, we hypothesized that PAT/4DUS can be used to correlate changes in arterial strain and hemodynamics with lipid localization and density in animals that have undergone partial carotid ligation (PCL) induced-atherosclerosis. A 40 MHz transducer (Vevo2100, VisualSonics) and a ND:YAG pulsed laser (Surelite EX, Continuum) were used to image five apolipoprotein-E deficient mice that underwent PCL of the left carotid artery while being fed a Western diet. Animals were imaged using 4DUS at days 0, 1, 4, 7, 10, and 14 to obtain pulsed-wave Doppler for hemodynamic characterization and 4DUS images for strain mapping. At day 14 all animals were euthanized and 3D in situ PAT images of the left carotid artery were acquired using 1210 nm light. The results show that atherosclerotic lesions can be characterized via PAT to localize both lipid accumulation and density and 4DUS to identify regions of low strain.
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- 2019
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23. A non-destructive view with X-rays into the strain state of bronze axes
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Leif Glaser, Andre Rothkirch, Simone Techert, and Mechtild Freudenberg
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Diffraction ,Materials science ,060102 archaeology ,Square Centimeter ,Experimental archaeology ,business.industry ,Metallurgy ,Synchrotron radiation ,Strain mapping ,06 humanities and the arts ,02 engineering and technology ,Scintillator ,engineering.material ,021001 nanoscience & nanotechnology ,Analytical Chemistry ,Optics ,Non destructive ,engineering ,0601 history and archaeology ,Bronze ,0210 nano-technology ,business ,Spectroscopy - Abstract
In this paper we present a new approach using highly surface sensitive X-ray diffraction methods for archaeometrical investigation highlighted on the Neolithic Axe of Ahneby. Applying the sin 2 Ψ-method with a scintillation detector and a MAXIM camera setup, both were usually applied for material strain analysis on modern metal fabrics. We can distinguish between different production states of bronze axes: cast, forged and tempered. The method can be applied as a local probe of some 100th of μm 2 or integrative on a square centimeter surface area. We applied established synchrotron radiation based methods of material strain mapping and diffraction on a Neolithic bronze axe as well as replicated material for noninvasive analysis. The main goal of the described investigations was to identify the effects upon the bronze objects of post-cast surface treatment with stone tools and of heat treatment.
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- 2016
24. Three-dimensional strain mapping using in situ X-ray synchrotron microtomography
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Hiroyuki Toda, Yoshimitsu Aoki, Masakazu Kobayashi, Eric Maire, Matériaux, ingénierie et science [Villeurbanne] (MATEIS), Centre National de la Recherche Scientifique (CNRS)-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon), and Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)
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In situ ,medicine.medical_specialty ,Materials science ,Synchrotron radiation ,02 engineering and technology ,Tracking (particle physics) ,01 natural sciences ,X ray synchrotron ,[SPI.MAT]Engineering Sciences [physics]/Materials ,Optics ,0103 physical sciences ,Microscopy ,medicine ,Medical physics ,ComputingMilieux_MISCELLANEOUS ,010302 applied physics ,business.industry ,Applied Mathematics ,Mechanical Engineering ,Resolution (electron density) ,Strain mapping ,021001 nanoscience & nanotechnology ,Experimental research ,Mechanics of Materials ,Modeling and Simulation ,0210 nano-technology ,business - Abstract
Recent advances in X-ray microtomography have created the opportunity to image the interior of materials. Microstructural images that are similar to or about an order of magnitude higher in resolution than those currently obtained with light microscopy can now be obtained in three-dimensions using synchrotron radiation. Local strain mapping is readily enabled by processing these high-resolution tomographic images using either the microstructural tracking technique or the digital volume correlation technique. This article is a review of the methodology behind these techniques and discusses recent experimental research on three-dimensional (3D) strain mapping. Potential future research directions are also outlined.
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- 2011
25. Strain Mapping by Scanning Low Energy Electron Microscopy
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Ondřej Man, Miloslav Kouřil, Miloš Hovorka, Ilona Müllerová, Šárka Mikmeková, Luděk Frank, and Libor Pantělejev
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Pressing ,Materials science ,Relative scarcity ,Annealing (metallurgy) ,business.industry ,Mechanical Engineering ,chemistry.chemical_element ,Strain mapping ,Microstructure ,Copper ,Low-energy electron microscopy ,Optics ,chemistry ,Mechanics of Materials ,General Materials Science ,business - Abstract
The use of the scanning low energy electron microscopy (SLEEM) has been slowly making its way into the field of materials science, hampered not by limitations in the technique but rather by relative scarcity of these instruments in research institutes and laboratories. This paper reports the results obtained from an investigation of the microstructure of ultra fine-grained (UFG) copper fabricated using equal channel angular pressing (ECAP) method, namely in the as-pressed state and after annealing. SLEEM is very sensitive to the perfection of crystal lattice and using SLEEM, local strain can be effectively imaged.
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- 2011
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26. Regional myocardial contractile function: multiparametric strain mapping☆
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Michael K. Pasque, Ajay K. Taggar, Lina M. Reynolds, Jennifer S. Lawton, and Brian P. Cupps
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Adult ,Pulmonary and Respiratory Medicine ,Cardiac function curve ,medicine.medical_specialty ,Myocardial Ischemia ,Infarction ,Article ,Ventricular Function, Left ,Young Adult ,Predictive Value of Tests ,Internal medicine ,Systolic strain ,Animals ,Humans ,Medicine ,Systole ,Geographic difference ,Sheep ,medicine.diagnostic_test ,business.industry ,Myocardium ,Magnetic resonance imaging ,Strain mapping ,medicine.disease ,Magnetic Resonance Imaging ,Myocardial Contraction ,Disease Models, Animal ,medicine.anatomical_structure ,Ventricle ,Cardiology ,Surgery ,Cardiology and Cardiovascular Medicine ,business - Abstract
Magnetic resonance imaging (MRI) with tissue tagging enables the quantification of multiple strain indices that can be combined through normalization into a single multiparametric index of regional myocardial contractile function. The aim of this study was to test the ability of multiparametric strain analysis to quantify regional differences in contractile function in an ovine model of myocardial injury. Regional variance in myocardial contractile function was induced in eight sheep by the ligation of the blood supply to the anterior and apical left ventricular myocardial walls. Left ventricular systolic strain was obtained from tissue tagged MRI images. A normal strain database (n = 50) defines all parameters of systolic strain and allows normalization of regional function at 15,300 left ventricular points by calculation of a Z-score. Multiparametric systolic strain Z-scores were therefore determined for 15,300 points in each injured sheep left ventricle. Multiparametric Z-scores were found to vary significantly by region (p < 0.001). Z-scores in regions remote to the infarct were found to be significantly smaller than those in the regions most likely to include infarcted myocardium. In this pre-clinical evaluation of MRI-based multiparametric strain analysis, it accurately quantified and visually defined regional differences in myocardial contractile function.
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- 2010
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27. High resolution skin colorimetry, strain mapping and mechanobiology
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A. Schreder, V. Docquier, Piérard-Franchimont C, Gérald Pierard, and Devillers C
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Aging ,Dermatoscopy ,integumentary system ,medicine.diagnostic_test ,business.industry ,Pharmaceutical Science ,High resolution ,Strain mapping ,Dermatology ,Melanocyte ,Biology ,medicine.disease ,Colorimetry (chemical method) ,Mechanobiology ,Tension lines ,Colloid and Surface Chemistry ,medicine.anatomical_structure ,Optics ,Chemistry (miscellaneous) ,Drug Discovery ,medicine ,Biophysics ,Striae distensae ,business - Abstract
Skin colours are notoriously different between individuals. They are governed by ethnicities and phototypes, and further influenced by a variety of factors including photoexposures and sustained mechanical stress. Indeed, mechanobiology is a feature affecting the epidermal melanization. High-resolution epiluminescence colorimetry helps in deciphering the effects of forces generated by Langer's lines or relaxed skin tension lines on the melanocyte activity. The same procedure shows a prominent laddering pattern of melanization in striae distensae contrasting with the regular honeycomb pattern in the surrounding skin.
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- 2010
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28. Formation Characteristics of Inversion Domains in P-GaN and P-AlGaN Layers By Using TEM Observation
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Y. I. Chang, Kyuho Park, M. J. Cho, Hui-Youn Shin, and Sang‐Koo Kwon
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Materials science ,business.industry ,General Physics and Astronomy ,Inversion (meteorology) ,Strain mapping ,Electron ,Chemical vapor deposition ,Convergent beam ,Molecular physics ,Optics ,Transmission electron microscopy ,Residual strain ,High-resolution transmission electron microscopy ,business - Abstract
The formation characteristics of the inversion domains in p-GaN and p-AlGaN layers were investigated by using transmission electron microscopy (TEM). The inversion domains induced by Mg-doped p-type GaN (p-GaN) and p-AlGaN layers were formed on a sapphire substrate by using a metalorganic chemical vapor deposition (MOVCD) method. The induced inversion domains were analyzed by using high-resolution TEM (HRTEM) and convergent beam electron di raction (CBED) and the residual strain distribution was evaluated by using a strain mapping simulation. The results revealed that pyramidal defects of various sizes were formed at the p-GaN/p-AlGaN interface. Also, a large number of inversion domains were observed to be initiated exclusively on (0002) plane of the pyramidal defects, which were above 10 nm toward the [000 1] direction, resulting in a rough, island-shaped p-GaN surface due to the inhibition of GaN growth by the inversion domains. In this study, the formation characteristics of inversion domains were correlated with the in uence of structural defects existing at the p-GaN/p-AlGaN interface.
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- 2008
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29. Differential phase-contrast dark-field electron holography for strain mapping
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Martin Hÿtch, Thibaud Denneulin, Florent Houdellier, Centre d'élaboration de matériaux et d'études structurales (CEMES), Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut de Chimie de Toulouse (ICT), Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Université de Toulouse (UT)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS), Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie de Toulouse (ICT-FR 2599), Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Institut de Chimie du CNRS (INC)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche pour le Développement (IRD)-Institut de Chimie du CNRS (INC)-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), and Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)
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Diffraction ,electron beam ,strain mapping ,Holographic technique ,Condenser (optics) ,microscope image ,Holography ,Plane wave ,Physics::Optics ,High resolution transmission electron microscopy ,02 engineering and technology ,01 natural sciences ,law.invention ,Strain ,dark field electron holography ,law ,Differential phase ,Instrumentation ,010302 applied physics ,[PHYS]Physics [physics] ,In-line holography ,quantitative analysis ,Holograms ,Condenser systems ,021001 nanoscience & nanotechnology ,Atomic and Molecular Physics, and Optics ,Electronic, Optical and Magnetic Materials ,Numerical differentiation ,Mapping ,0210 nano-technology ,Materials science ,Differentiation (calculus) ,Phase (waves) ,Electrons ,investigative procedures ,Electron holography ,Article ,Condensed Matter::Materials Science ,Optics ,0103 physical sciences ,transmission electron microscopy ,Differential phase contrast ,controlled study ,High-resolution transmission electron microscopy ,intermethod comparison ,business.industry ,Dark field microscopy ,Dark field ,holography ,business ,Dark-field electron holographies - Abstract
cited By 6; International audience; Strain mapping is an active area of research in transmission electron microscopy. Here we introduce a dark-field electron holographic technique that shares several aspects in common with both off-axis and in-line holography. Two incident and convergent plane waves are produced in front of the specimen thanks to an electrostatic biprism in the condenser system of a transmission electron microscope. The interference of electron beams diffracted by the illuminated crystal is then recorded in a defocused plane. The differential phase recovered from the hologram is directly proportional to the strain in the sample. The strain can be quantified if the separation of the images due to the defocus is precisely determined. The present technique has the advantage that the derivative of the phase is measured directly which allows us to avoid numerical differentiation. The distribution of the noise in the reconstructed strain maps is isotropic and more homogeneous. This technique was used to investigate different samples: a Si/SiGe superlattice, transistors with SiGe source/drain and epitaxial PZT thin films. © 2015 Elsevier B.V.
- Published
- 2016
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30. Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope
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Armand Béché, Thibaud Denneulin, David Cooper, Nicolas Bernier, Jean-Luc Rouvière, Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Laboratoire d'Etude des Matériaux par Microscopie Avancée (LEMMA ), Modélisation et Exploration des Matériaux (MEM), Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), European Project: 306535,EC:FP7:ERC,ERC-2012-StG_20111012,HOLOVIEW(2012), and Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut de Recherche Interdisciplinaire de Grenoble (IRIG)
- Subjects
Diffraction ,Reflection high-energy electron diffraction ,Materials science ,Local-Structure ,Thin-Films ,General Physics and Astronomy ,State Analysis ,02 engineering and technology ,01 natural sciences ,Electron holography ,Optics ,Geometrical phase analysis ,Structural Biology ,0103 physical sciences ,Scanning transmission electron microscopy ,Imaging Conditions ,General Materials Science ,Geometric Phase-Analysis ,Nanobeam Diffraction ,010302 applied physics ,[PHYS]Physics [physics] ,business.industry ,Dark field electron holography ,Resolution (electron density) ,Cell Biology ,021001 nanoscience & nanotechnology ,Dark field microscopy ,Semiconductors ,Transmission electron microscopy ,Strain mapping ,0210 nano-technology ,business ,Electron backscatter diffraction ,Precession diffraction - Abstract
International audience; The last few years have seen a great deal of progress in the development of transmission electron microscopy based techniques for strain mapping. New techniques have appeared such as dark field electron holography and nanobeam diffraction and better known ones such as geometrical phase analysis have been improved by using aberration corrected ultra-stable modern electron microscopes. In this paper we apply dark field electron holography, the geometrical phase analysis of high angle annular dark field scanning transmission electron microscopy images, nanobeam diffraction and precession diffraction, all performed at the state-of-the-art to five different types of semiconductor samples. These include a simple calibration structure comprising 10-nm-thick SiGe layers to benchmark the techniques. A SiGe recessed source and drain device has been examined in order to test their capabilities on 2D structures. Devices that have.been strained using a nitride stressor have been examined to test the sensitivity of the different techniques when applied to systems containing low values of deformation. To test the techniques on modern semiconductors, an electrically tested device grown on a SOI wafer has been examined. Finally a GaN/AlN superlattice was tested in order to assess the different methods of measuring deformation on specimens that do not have a perfect crystalline structure. The different deformation mapping techniques have been compared to one another and the strengths and weaknesses of each are discussed. (C) 2015 The Authors. Published by Elsevier Ltd. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/).
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- 2016
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31. Tip-Enhanced Raman Spectroscopy: Applications to Carbon Nanomaterials
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Gennaro Picardi, Giovanni Maria Vanacore, Razvigor Ossikovski, Alberto Tagliaferri, Monica Bollani, and Marc Chaigneau
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Materials science ,business.industry ,Nano ,Optoelectronics ,Stress profile ,Strain mapping ,business ,Tip-enhanced Raman spectroscopy - Published
- 2015
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32. Strain mapping accuracy improvement using super-resolution techniques
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A. D. Utrilla, David González, M. P. Guerrero-Lebrero, JM José Maria Ulloa, Alvaro Mayoral, D. Fernández-Reyes, Pedro L. Galindo, Elisa Guerrero, and Guillermo Bárcena-González
- Subjects
010302 applied physics ,Histology ,Field (physics) ,Computer science ,business.industry ,Resolution (electron density) ,Strain mapping ,02 engineering and technology ,Iterative reconstruction ,021001 nanoscience & nanotechnology ,Accuracy improvement ,computer.software_genre ,01 natural sciences ,Dark field microscopy ,Pathology and Forensic Medicine ,Optics ,Software ,Computer Science::Computer Vision and Pattern Recognition ,0103 physical sciences ,Digital image processing ,Data mining ,0210 nano-technology ,business ,computer - Abstract
Super-resolution (SR) software-based techniques aim at generating a final image by combining several noisy frames with lower resolution from the same scene. A comparative study on high-resolution high-angle annular dark field images of InAs/GaAs QDs has been carried out in order to evaluate the performance of the SR technique. The obtained SR images present enhanced resolution and higher signal-to-noise (SNR) ratio and sharpness regarding the experimental images. In addition, SR is also applied in the field of strain analysis using digital image processing applications such as geometrical phase analysis and peak pairs analysis. The precision of the strain mappings can be improved when SR methodologies are applied to experimental images.
- Published
- 2015
33. An approach to the systematic distortion correction in aberration-corrected HAADF images
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Richard Beanland, Ana M. Sanchez, Meiken Falke, Peter Goodhew, Pedro L. Galindo, and Sławomir Kret
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Condensed Matter::Materials Science ,Histology ,Optics ,Materials science ,Distortion correction ,business.industry ,Distortion ,Strain mapping ,Substrate (printing) ,business ,Electromagnetic interference ,Pathology and Forensic Medicine - Abstract
Systematic distortion has been analysed in high-angle annular dark-field (HAADF) images which may be caused by electrical interference. Strain mapping techniques have been applied to a strain-free GaAs substrate in order to provide a broad analysis of the influence of this distortion on the determination of local strain in the heterostructure. We have developed a methodology for estimating the systematic distortion, and we correct the original images by using an algorithm that removes this systematic distortion.
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- 2006
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34. Practical obstacles and their mitigation strategies in compressional optical coherence elastography of biological tissues
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Elena V. Zagaynova, A. L. Matveyev, Ekaterina V. Gubarkova, Alex Vitkin, Natalia D. Gladkova, A. A. Sovetsky, Vladimir Y. Zaitsev, Grigory V. Gelikonov, Marina A. Sirotkina, and Lev A. Matveev
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strain mapping ,phase-resolved methods ,Biomedical Engineering ,Medicine (miscellaneous) ,Young's modulus ,02 engineering and technology ,Curvature ,Tissue surface ,lcsh:Technology ,01 natural sciences ,010309 optics ,Optical coherence elastography ,symbols.namesake ,020210 optoelectronics & photonics ,Optics ,Optical coherence tomography ,0103 physical sciences ,0202 electrical engineering, electronic engineering, information engineering ,medicine ,stiffness characterization ,lcsh:QC350-467 ,Physics ,optical coherence tomography ,medicine.diagnostic_test ,lcsh:T ,business.industry ,Stiffness ,Strain mapping ,Atomic and Molecular Physics, and Optics ,Electronic, Optical and Magnetic Materials ,Nonlinear system ,symbols ,medicine.symptom ,business ,lcsh:Optics. Light - Abstract
In this paper, we point out some practical obstacles arising in realization of compressional optical coherence elastography (OCE) that have not attracted sufficient attention previously. Specifically, we discuss (i) complications in quantification of the Young modulus of tissues related to partial adhesion between the OCE probe and soft intervening reference layer sensor, (ii) distorting influence of tissue surface curvature/corrugation on the subsurface strain distribution mapping, (iii) ways of signal-to-noise ratio (SNR) enhancement in OCE strain mapping when periodic averaging is not realized, and (iv) potentially significant influence of tissue elastic nonlinearity on quantification of its stiffness. Potential practical approaches to mitigate the effects of these complications are also described.
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- 2017
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35. EP31.03: Ultrasound-based strain mapping for quantitative characterisation of uterine activity outside pregnancy
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N.P. Kuijsters, Benedictus C. Schoot, C. Blank, Y. Huang, Massimo Mischi, and F. Sammali
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medicine.medical_specialty ,Uterine activity ,Pregnancy ,Radiological and Ultrasound Technology ,Obstetrics ,business.industry ,Ultrasound ,Obstetrics and Gynecology ,Strain mapping ,General Medicine ,medicine.disease ,Reproductive Medicine ,medicine ,Radiology, Nuclear Medicine and imaging ,business - Published
- 2017
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36. Impact of column bending in high-resolution transmission electron microscopy on the strain evaluation of GaAs/InAs/GaAs heterostructures
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Markus Lentzen, R Rosenfeld, and K Tillmann
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Materials science ,business.industry ,Strain mapping ,Heterojunction ,Condensed Matter::Mesoscopic Systems and Quantum Hall Effect ,Molecular physics ,Atomic and Molecular Physics, and Optics ,Finite element method ,Electronic, Optical and Magnetic Materials ,Condensed Matter::Materials Science ,Optics ,Transmission electron microscopy ,Strain distribution ,Lattice (order) ,Thin film ,business ,High-resolution transmission electron microscopy ,Instrumentation - Abstract
The accuracy of strain profiles obtained by a quantitative analysis of lattice fringe spacings from high-resolution micrographs is discussed. Focusing on highly lattice mismatched GaAs/InAs/GaAs heterostructures the local strain distribution of the layers is calculated by finite element simulations to determine the atom positions in elastically relaxed transmission electron microscopy specimens. By analysing simulated images a significant decoupling between the layer structure and the contrast pattern motifs is found for relevant imaging conditions, which may result in an incorrect determination of strain profiles and layer compositions when examining experimental micrographs.
- Published
- 2000
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37. Bragg-Edge Transmission as an Additional Tool for Strain Measurements
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Kay Meggers, Sven C. Vogel, Meinhard Stalder, Walter J. Trela, Ralf Bless, and H.G. Priesmeyer
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Crystallography ,Materials science ,Optics ,Strain (chemistry) ,Transmission (telecommunications) ,business.industry ,Solid-state ,Strain mapping ,Crystallite ,Tomography ,Neutron scattering ,Edge (geometry) ,business - Abstract
Solid state information from coherent neutron scattering can be extracted from transmission experiments on polycrystalline materials. The transmission technique has been applied to dynamic structural and phase change investigations and will be developed to cover the fields of strain mapping and structural tomography.
- Published
- 1999
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38. In Vivo 3-Dimensional Strain Mapping Confirms Large Optic Nerve Head Deformations Following Horizontal Eye Movements
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Tin A. Tun, Nicholas G. Strouthidis, Mani Baskaran, Shamira A. Perera, Meghna R. Beotra, Michael J A Girard, Tin Aung, Dan Milea, and Xiaofei Wang
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Adult ,Male ,medicine.medical_specialty ,Lamina ,Intraocular pressure ,Eye Movements ,genetic structures ,Finite Element Analysis ,Optic Disk ,Optic disk ,Young Adult ,03 medical and health sciences ,Imaging, Three-Dimensional ,0302 clinical medicine ,In vivo ,Ophthalmology ,Optic Nerve Diseases ,Humans ,Medicine ,Peripapillary atrophy ,Intraocular Pressure ,business.industry ,Eye movement ,Strain mapping ,Anatomy ,Healthy Volunteers ,eye diseases ,030221 ophthalmology & optometry ,Optic nerve ,Female ,sense organs ,business ,Tomography, Optical Coherence ,030217 neurology & neurosurgery - Abstract
Purpose To measure lamina cribrosa (LC) strains (deformations) following abduction and adduction in healthy subjects and to compare them with those resulting from a relatively high acute intraocular pressure (IOP) elevation. Methods A total of 16 eyes from 8 healthy subjects were included. Among the 16 eyes, 11 had peripapillary atrophy (PPA). For each subject, both optic nerve heads (ONHs) were imaged using optical coherence tomography (OCT) at baseline (twice), in different gaze positions (adduction and abduction of 20°) and following an acute IOP elevation of approximately 20 mm Hg from baseline (via ophthalmodynamometry). Strains of LC for all loading scenarios were mapped using a three-dimensional tracking algorithm. Results In all 16 eyes, LC strains induced by adduction and abduction were 5.83% ± 3.78% and 3.93% ± 2.57%, respectively, and both significantly higher than the control strains measured from the repeated baseline acquisitions (P < 0.01). Strains of LC in adduction were on average higher than those in abduction, but the difference was not statistically significant (P = 0.07). Strains of LC induced by IOP elevations (on average 21.13 ± 7.61 mm Hg) were 6.41% ± 3.21% and significantly higher than the control strains (P < 0.0005). Gaze-induced LC strains in the PPA group were on average larger than those in the non-PPA group; however, the relationship was not statistically significant. Conclusions Our results confirm that horizontal eye movements generate significant ONH strains, which is consistent with our previous estimations using finite element analysis. Further studies are needed to explore a possible link between ONH strains induced by eye movements and axonal loss in optic neuropathies.
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- 2016
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39. Optical coherence tomography for visualizing transient strains and measuring large deformations in laser-induced tissue reshaping
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Vladimir Y. Zaitsev, Alexander L. Matveyev, Alexander I. Omelchenko, Dmitry V. Shabanov, V. M. Svistushkin, Emil N. Sobol, Olga I. Baum, Grigory V. Gelikonov, and Lev A. Matveev
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Materials science ,genetic structures ,Physics and Astronomy (miscellaneous) ,Context (language use) ,02 engineering and technology ,01 natural sciences ,law.invention ,010309 optics ,Speckle pattern ,020210 optoelectronics & photonics ,Optics ,Optical coherence tomography ,law ,0103 physical sciences ,0202 electrical engineering, electronic engineering, information engineering ,medicine ,Instrumentation ,medicine.diagnostic_test ,business.industry ,Strain mapping ,Laser ,Phase unwrapping ,eye diseases ,sense organs ,Transient (oscillation) ,business - Abstract
In the context of the development of emerging laser-assisted thermo-mechanical technologies for non-destructive reshaping of avascular collagenous tissues (cartilages and cornea), we report the first application of phase-sensitive optical coherence tomography (OCT) for visualizing transient strains involving supra-wavelength inter-frame displacements of scatterers. Usually phase-sensitive OCT assumes the visualization of sub-pixel and even sub-wavelength displacements of scatterers and fairly small strains (say
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- 2016
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40. Strain mapping in Ge microstructures using X-ray white beam Laue microdiffraction
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Samuel Tardif
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Materials science ,business.industry ,X-ray ,Strain mapping ,Condensed Matter Physics ,Microstructure ,Biochemistry ,Inorganic Chemistry ,Optics ,Structural Biology ,General Materials Science ,Physical and Theoretical Chemistry ,business ,Beam (structure) - Published
- 2016
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41. Strain mapping of ultrathin epitaxial ZnTe and MnTe layers embedded in CdTe
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Henri Mariette, Guy Feuillet, Joel Cibert, Pierre-Henri Jouneau, A. Tardot, Nanophysique et Semiconducteurs (NPSC), PHotonique, ELectronique et Ingénierie QuantiqueS (PHELIQS), Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Laboratoire de Spectrométrie Physique (LSP), and Université Joseph Fourier - Grenoble 1 (UJF)-Centre National de la Recherche Scientifique (CNRS)
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[PHYS]Physics [physics] ,Materials science ,business.industry ,Superlattice ,General Physics and Astronomy ,Heterojunction ,Strain mapping ,Crystal structure ,Image processing software ,Epitaxy ,Cadmium telluride photovoltaics ,law.invention ,Crystallography ,law ,Optoelectronics ,Electron microscope ,business - Abstract
High-resolution electron microscopy is used to investigate the morphology of ultrathin pseudomorphic (001) ZnTe and MnTe strained layers grown in CdTe. Local distortions of the crystal lattice are measured directly on high-resolution images by use of image processing software. In the case of ZnTe/CdTe superlattices, the method yields the location of Zn within each place in the heterostructure and the total amount of Zn per period. For MnTe layers embedded in CdTe, one can deduce the atomic morphology of the interfaces which are shown to present a clear asymmetry.
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- 1994
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42. Life cycle strain mapping of composite airframe structures by using FBG sensors
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Y. Koshioka, I. Takahashi, Masami Kume, Hajime Takeya, Shu Minakuchi, Nobuo Takeda, Kazushi Sekine, and Yutaka Iwahori
- Subjects
Materials science ,business.industry ,Composite number ,Carbon fibers ,Strain mapping ,Structural engineering ,Fibre-reinforced plastic ,Fiber Bragg grating ,Machining ,visual_art ,Airframe ,visual_art.visual_art_medium ,business ,Strain monitoring - Abstract
The objective of this work is to develop a system for monitoring the structural integrity of composite airframe structures by strain mapping over the entire lifecycle of the structure. Specifically, we use fiber Bragg grating sensors to measure strain in a pressure bulkhead made of carbon fiber reinforced plastics (CFRPs) through a sequence of lifecycle stages (molding, machining, assembly, operation and maintenance) and detect the damage, defects, and deformation that occurs at each stage from the obtained strain distributions. In previous work, we have evaluated strain monitoring at each step in the FRP molding and machining stages of the lifecycle. In the work reported here, we evaluate the monitoring of the changes in strain that occur at the time of bolt fastening during assembly. The results show that the FBG sensors can detect the changes in strain that occur when a load is applied to the structure during correction of thermal deformation or when there is an offset in the hole position when structures are bolted together. We also conducted experiments to evaluate the detection of damage and deformation modes that occur in the pressure bulkhead during operation. Those results show that the FBG sensors detect the characteristic changes in strain for each mode.
- Published
- 2011
- Full Text
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43. Applications of Automated High Resolution Strain Mapping in TEM on the Study of Strain Distribution in MOSFETs
- Author
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Catherine Vartuli, Amith Darbal, T. Aoki, J. K. Weiss, Raman D. Narayan, Stavros Nicolopoulos, and J. Mardinly
- Subjects
Materials science ,Strain distribution ,business.industry ,Optoelectronics ,High resolution ,Strain mapping ,business ,Instrumentation - Published
- 2014
- Full Text
- View/download PDF
44. Nano-scale Strain Mapping Using Advanced STEM with a Direct Electron Detector
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Christoph Gammer, Andrew M. Minor, M.C. Sarahan, and V. B. Özdöl
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Materials science ,business.industry ,Detector ,Analytical chemistry ,Optoelectronics ,Strain mapping ,Electron ,business ,Instrumentation ,Nanoscopic scale - Published
- 2014
- Full Text
- View/download PDF
45. Dual Lens Electron Holography for High Spatial Resolution Junction and Strain Mapping of Semiconductor Devices
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Y.Y. Wang and J. Bruley
- Subjects
Lens (optics) ,Optics ,Materials science ,law ,business.industry ,High spatial resolution ,Optoelectronics ,Strain mapping ,Semiconductor device ,business ,Instrumentation ,Electron holography ,law.invention - Published
- 2014
- Full Text
- View/download PDF
46. Strain mapping using electron backscatter diffraction
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Angus J. Wilkinson, Graham Meaden, and David J. Dingley
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Optics ,Materials science ,business.industry ,Angular error ,Strain mapping ,business ,Strain gradient ,Electron backscatter diffraction - Abstract
In this chapter we review the progress that has been made toward elastic strain (i.e., stress) mapping using electron backscatter diffraction. In particular we focus on development of an analysis method based on using cross-correlation to determine small shifts in the EBSD patterns with respect to a reference pattern. The pattern shifts are determined at many subregions dispersed across the wide angular span of the EBSD pattern, and the magnitude and angular distribution of shifts allows the strain and rotation tensor to be determined. Pattern shifts at a resolution of ±0.05 pixels, or in some cases even better, have been reported, which corresponds to a sensitivity of ∼±10-4 in the components of the strain and rotation tensor. © Springer Science+Business Media, LLC 2009. All rights reserved.
- Published
- 2009
47. Validation and Optimization of ARCMAC and Strain Mapping Systems for Creep Measurement
- Author
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Iain Palmer, John P. Dear, and Chris Maharaj
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Digital image correlation ,Light intensity ,Materials science ,Creep strain ,Piping ,Creep ,business.industry ,Image acquisition ,Strain mapping ,Structural engineering ,Repeatability ,business - Abstract
Research is ongoing to validate and optimize the E.ON UK auto-reference creep management and control (ARCMAC) system for high temperature piping creep measurement. In conjunction with the ARCMAC system, research is also being undertaken to incorporate digital image correlation (DIC) into creep strain evaluation, via a rugged high temperature pattern. The aim is to have comprehensive monitoring of creep strain in high temperature steam pipes including bends, joints, welds and other pipe structural features. This paper firstly presents work done into the determination of the best method to capture and process ARCMAC images. It was found that a bi-cubic interpolation resizing function with a combined high light intensity image gives the best results with respect to accuracy and repeatability of image acquisition. Also presented was the testing of a modified (prototype) ARCMAC camera with modified (prototype) ARCMAC gauges. The prototype ARCMAC camera, based on a DSLR camera, is approaching the accuracy of the conventional ARCMAC but an improved lens system would be desirable. For the prototype gauge, it was found that the edge-finding technique using the knife-edge was just as accurate as using the target ball reflection for strain analysis. Both techniques can be used independently to evaluate creep strain. Finally, preliminary high temperature testing results for both the ARMCAC and DIC technique are presented. For the ARCMAC gauge and the DIC high temperature pattern, small changes in strains were observed over time that were not due to sample deformation. Reasons for these small changes in strain were identified and solutions arrived at. All results are very promising and it is foreseen that a combined ARCMAC/DIC tested technique will be applied to plant piping components soon.
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- 2009
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48. Ultrahigh-Resolution Transversal Polarization-Sensitive Optical Coherence Tomography: Structural Analysis and Strain-Mapping
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David Stifter, Michael Pircher, Christoph K. Hitzenberger, Gabi Grützner, Gisela Ahrens, Karin Wiesauer, Reinhold Oster, and Rainer Engelke
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Materials science ,Birefringence ,genetic structures ,medicine.diagnostic_test ,business.industry ,Strain mapping ,Coherence length ,Interferometry ,Polarization sensitive ,Optics ,Ultrahigh resolution ,Optical coherence tomography ,Transversal (combinatorics) ,medicine ,sense organs ,business - Abstract
Optical coherence tomography (OCT), originally developed and so far nearly exclusively used for biomedical applications (e.g., [1,2]), is a contact-free, non-destructive technique based on low-coherence interferometry to image structures within translucent and turbid materials. Commonly, cross-sectional reflectivity images with a depth-resolution determined by the coherence length of the near-infrared light source are obtained. When OCT is performed in a polarization sensitive way (PS-OCT), additional information about birefringence within a material is obtained by mapping the retardation between ordinary and extraordinary rays [3]. Because birefringence is induced when strain occurs, PS-OCT provides depth resolved information about the internal stress within a sample.
- Published
- 2008
- Full Text
- View/download PDF
49. Structural and analytical characterization by scanning transmission electron microscopy of silicon-based nanostructures
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Roberto Balboni, Andrea Parisini, and Aldo Armigliato
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Conventional transmission electron microscope ,Nanostructure ,Materials science ,business.industry ,Polymer characterization ,Scanning confocal electron microscopy ,Scanning Transmission Electron microscopy ,Characterization (materials science) ,Electron diffraction ,Analytical characterizations ,Scanning transmission electron microscopy ,Scanning ion-conductance microscopy ,Optoelectronics ,Energy filtered transmission electron microscopy ,Strain mapping ,business ,Dopant profiles - Abstract
A few recent applications of scanning transmission electron microscopy (STEM) methods to problems of interest for nanoelectronics are reported. They include nanometer-scaled dopant profiles by Z-contrast and strain mapping by convergent beam diffraction.
- Published
- 2007
- Full Text
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50. Strain Mapping of Interfaces by Quantitative High-Resolution TEM
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Yan Zhu and CL Johnson
- Subjects
Optics ,Materials science ,business.industry ,High resolution ,Strain mapping ,business ,Instrumentation - Published
- 2005
- Full Text
- View/download PDF
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