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Strain mapping accuracy improvement using super-resolution techniques
- Source :
- Journal of microscopy. 262(1)
- Publication Year :
- 2015
-
Abstract
- Super-resolution (SR) software-based techniques aim at generating a final image by combining several noisy frames with lower resolution from the same scene. A comparative study on high-resolution high-angle annular dark field images of InAs/GaAs QDs has been carried out in order to evaluate the performance of the SR technique. The obtained SR images present enhanced resolution and higher signal-to-noise (SNR) ratio and sharpness regarding the experimental images. In addition, SR is also applied in the field of strain analysis using digital image processing applications such as geometrical phase analysis and peak pairs analysis. The precision of the strain mappings can be improved when SR methodologies are applied to experimental images.
- Subjects :
- 010302 applied physics
Histology
Field (physics)
Computer science
business.industry
Resolution (electron density)
Strain mapping
02 engineering and technology
Iterative reconstruction
021001 nanoscience & nanotechnology
Accuracy improvement
computer.software_genre
01 natural sciences
Dark field microscopy
Pathology and Forensic Medicine
Optics
Software
Computer Science::Computer Vision and Pattern Recognition
0103 physical sciences
Digital image processing
Data mining
0210 nano-technology
business
computer
Subjects
Details
- ISSN :
- 13652818
- Volume :
- 262
- Issue :
- 1
- Database :
- OpenAIRE
- Journal :
- Journal of microscopy
- Accession number :
- edsair.doi.dedup.....6e61115713f3be6dd1864816609fe9a3