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Strain mapping accuracy improvement using super-resolution techniques

Authors :
A. D. Utrilla
David González
M. P. Guerrero-Lebrero
JM José Maria Ulloa
Alvaro Mayoral
D. Fernández-Reyes
Pedro L. Galindo
Elisa Guerrero
Guillermo Bárcena-González
Source :
Journal of microscopy. 262(1)
Publication Year :
2015

Abstract

Super-resolution (SR) software-based techniques aim at generating a final image by combining several noisy frames with lower resolution from the same scene. A comparative study on high-resolution high-angle annular dark field images of InAs/GaAs QDs has been carried out in order to evaluate the performance of the SR technique. The obtained SR images present enhanced resolution and higher signal-to-noise (SNR) ratio and sharpness regarding the experimental images. In addition, SR is also applied in the field of strain analysis using digital image processing applications such as geometrical phase analysis and peak pairs analysis. The precision of the strain mappings can be improved when SR methodologies are applied to experimental images.

Details

ISSN :
13652818
Volume :
262
Issue :
1
Database :
OpenAIRE
Journal :
Journal of microscopy
Accession number :
edsair.doi.dedup.....6e61115713f3be6dd1864816609fe9a3