Strain mapping in Ge microstructures using X-ray white beam Laue microdiffraction

Authors :: Samuel Tardif
Source :: Acta Crystallographica Section A Foundations and Advances. 72:s150-s150
Publication Year :: 2016
Publisher :: International Union of Crystallography (IUCr), 2016.

Subjects :: Materials science
business.industry
X-ray
Strain mapping
Condensed Matter Physics
Microstructure
Biochemistry
Inorganic Chemistry
Optics
Structural Biology
General Materials Science
Physical and Theoretical Chemistry
business
Beam (structure)

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