Strain mapping in Ge microstructures using X-ray white beam Laue microdiffraction

MLA

Samuel Tardif. “Strain Mapping in Ge Microstructures Using X-Ray White Beam Laue Microdiffraction.” Acta Crystallographica Section A Foundations and Advances, vol. 72, Aug. 2016, p. s150. EBSCOhost, https://doi.org/10.1107/s2053273316097771.

APA

Samuel Tardif. (2016). Strain mapping in Ge microstructures using X-ray white beam Laue microdiffraction. Acta Crystallographica Section A Foundations and Advances, 72, s150. https://doi.org/10.1107/s2053273316097771

Chicago

Samuel Tardif. 2016. “Strain Mapping in Ge Microstructures Using X-Ray White Beam Laue Microdiffraction.” Acta Crystallographica Section A Foundations and Advances 72 (August): s150. doi:10.1107/s2053273316097771.