Nano-scale strain mapping in complete nanowire-based electronic devices by Bragg coherent X-ray diffraction

Authors :: Dmitry Dzhigaev
Source :: Acta Crystallographica Section A Foundations and Advances. 75:e642-e642
Publication Year :: 2019
Publisher :: International Union of Crystallography (IUCr), 2019.

Subjects :: Materials science
business.industry
Nanowire
Strain mapping
Condensed Matter Physics
Biochemistry
Inorganic Chemistry
Structural Biology
X-ray crystallography
Optoelectronics
General Materials Science
Electronics
Physical and Theoretical Chemistry
business
Nanoscopic scale

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