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Nano-scale Strain Mapping Using Advanced STEM with a Direct Electron Detector

Authors :
Christoph Gammer
Andrew M. Minor
M.C. Sarahan
V. B. Özdöl
Source :
Microscopy and Microanalysis. 20:1046-1047
Publication Year :
2014
Publisher :
Oxford University Press (OUP), 2014.

Subjects

Subjects :
Materials science
business.industry
Detector
Analytical chemistry
Optoelectronics
Strain mapping
Electron
business
Instrumentation
Nanoscopic scale

Details

ISSN :
14358115 and 14319276
Volume :
20
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........ce70a87662c7d0329de497f90ffd8350
Full Text :
https://doi.org/10.1017/s1431927614006953
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