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Ultrahigh-Resolution Transversal Polarization-Sensitive Optical Coherence Tomography: Structural Analysis and Strain-Mapping

Authors :
David Stifter
Michael Pircher
Christoph K. Hitzenberger
Gabi Grützner
Gisela Ahrens
Karin Wiesauer
Reinhold Oster
Rainer Engelke
Source :
Fracture of Nano and Engineering Materials and Structures ISBN: 9781402049712, Scopus-Elsevier
Publication Year :
2008
Publisher :
Springer Netherlands, 2008.

Abstract

Optical coherence tomography (OCT), originally developed and so far nearly exclusively used for biomedical applications (e.g., [1,2]), is a contact-free, non-destructive technique based on low-coherence interferometry to image structures within translucent and turbid materials. Commonly, cross-sectional reflectivity images with a depth-resolution determined by the coherence length of the near-infrared light source are obtained. When OCT is performed in a polarization sensitive way (PS-OCT), additional information about birefringence within a material is obtained by mapping the retardation between ordinary and extraordinary rays [3]. Because birefringence is induced when strain occurs, PS-OCT provides depth resolved information about the internal stress within a sample.

Details

ISBN :
978-1-4020-4971-2
ISBNs :
9781402049712
Database :
OpenAIRE
Journal :
Fracture of Nano and Engineering Materials and Structures ISBN: 9781402049712, Scopus-Elsevier
Accession number :
edsair.doi.dedup.....b3eafb7cfd458edaaa4c2c56555b398a
Full Text :
https://doi.org/10.1007/1-4020-4972-2_287