Cite
Ultrahigh-Resolution Transversal Polarization-Sensitive Optical Coherence Tomography: Structural Analysis and Strain-Mapping
MLA
David Stifter, et al. Ultrahigh-Resolution Transversal Polarization-Sensitive Optical Coherence Tomography: Structural Analysis and Strain-Mapping. Jan. 2008. EBSCOhost, https://doi.org/10.1007/1-4020-4972-2_287.
APA
David Stifter, Michael Pircher, Christoph K. Hitzenberger, Gabi Grützner, Gisela Ahrens, Karin Wiesauer, Reinhold Oster, & Rainer Engelke. (2008). Ultrahigh-Resolution Transversal Polarization-Sensitive Optical Coherence Tomography: Structural Analysis and Strain-Mapping. https://doi.org/10.1007/1-4020-4972-2_287
Chicago
David Stifter, Michael Pircher, Christoph K. Hitzenberger, Gabi Grützner, Gisela Ahrens, Karin Wiesauer, Reinhold Oster, and Rainer Engelke. 2008. “Ultrahigh-Resolution Transversal Polarization-Sensitive Optical Coherence Tomography: Structural Analysis and Strain-Mapping,” January. doi:10.1007/1-4020-4972-2_287.