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Strain mapping at the interface of InP/In x Ga1-x As/InP as measured by the scanning transmission electron microscope-moiré fringe method

Authors :
Yoshifumi Oshima
Tongmin Chen
Masashi Akabori
Source :
Applied Physics Express. 12:105504
Publication Year :
2019
Publisher :
IOP Publishing, 2019.

Subjects

Subjects :
Materials science
business.industry
Interface (computing)
Scanning transmission electron microscopy
General Engineering
General Physics and Astronomy
Optoelectronics
Strain mapping
Moiré pattern
business

Details

ISSN :
18820786 and 18820778
Volume :
12
Database :
OpenAIRE
Journal :
Applied Physics Express
Accession number :
edsair.doi...........5656ed65ebf2b23cf17fa336f5d764d9
Full Text :
https://doi.org/10.7567/1882-0786/ab4604
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