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Strain Mapping of Interfaces by Quantitative High-Resolution TEM

Authors :
Yan Zhu
CL Johnson
Source :
Microscopy and Microanalysis. 11
Publication Year :
2005
Publisher :
Oxford University Press (OUP), 2005.

Subjects

Subjects :
Optics
Materials science
business.industry
High resolution
Strain mapping
business
Instrumentation

Details

ISSN :
14358115 and 14319276
Volume :
11
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........8d004a5ccec0eeed8e45cebcb930ad43
Full Text :
https://doi.org/10.1017/s1431927605506743
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