1. Advanced In Situ TEM Microchip with Excellent Temperature Uniformity and High Spatial Resolution.
- Author
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Zhang, Xuelin, Zhou, Yufan, Chen, Ying, Li, Ming, Yu, Haitao, and Li, Xinxin
- Subjects
SPATIAL resolution ,HIGH temperatures ,SCIENTIFIC method ,TRANSMISSION electron microscopy ,MICROELECTROMECHANICAL systems - Abstract
Transmission electron microscopy (TEM) is a highly effective method for scientific research, providing comprehensive analysis and characterization. However, traditional TEM is limited to observing static material structures at room temperature within a high-vacuum environment. To address this limitation, a microchip was developed for in situ TEM characterization, enabling the real-time study of material structure evolution and chemical process mechanisms. This microchip, based on microelectromechanical System (MEMS) technology, is capable of introducing multi-physics stimulation and can be used in conjunction with TEM to investigate the dynamic changes of matter in gas and high-temperature environments. The microchip design ensures a high-temperature uniformity in the sample observation area, and a system of tests was established to verify its performance. Results show that the temperature uniformity of 10 real-time observation windows with a total area of up to 1130 μm
2 exceeded 95%, and the spatial resolution reached the lattice level, even in a flowing atmosphere of 1 bar. [ABSTRACT FROM AUTHOR]- Published
- 2023
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