44 results on '"Saigne, F."'
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2. Development of new methodology to model synergistic effects between TID and ASETs
3. Prediction of multiple cell upset induced by heavy ions in a 90 nm bulk SRAM
4. Temperature effect on heavy-ion-induced single-event transient propagation in CMOS bulk 0.18 [micro]m inverter chain
5. Oxide thickness dependence of swift heavy ion-induced surface tracks formation in silicon dioxide on silicon structures at grazing incidence
6. Innovative simulations of heavy ion cross sections in 130 nm CMOS SRAM
7. Temperature effect on heavy-ion induced parasitic current on SRAM by device simulation: effect on SEU sensitivity
8. Simultaneous evaluation of TID and displacement damage dose using a single OSL sensor
9. Measurement of the energy depositions in a silicon volume by 14 MeV neutrons
10. Physical model for the low-dose-rate effect in bipolar devices
11. Analysis of bias effects on the total-dose response of a bipolar voltage comparator
12. Analysis of quasi-monoenergetic neutron and proton SEU cross sections for terrestrial applications
13. Analysis of total-dose response of a bipolar voltage comparator combining radiation experiments and design data
14. Charge sharing study in the case of neutron induced SEU on 130 nm bulk SRAM modeled by 3-d device simulation
15. DASIE analytical version: a predictive tool for neutrons, protons and heavy ions induced SEU cross section
16. Laser mapping of SRAM sensitive cells: a way to obtain input parameters for DASIE calculation code
17. Estimation of low-dose-rate degradation on bipolar linear integrated circuits using switching experiments
18. Online dosimetry based on optically stimulated luminescence materials
19. Neutron-induced SEU in SRAMs: simulations with n-Si and n-O interactions
20. Monte-Carlo simulations to quantify neutron-induced multiple bit upsets in advanced SRAMs
21. Criterion for SEU occurrence in SRAM deduced from circuit and device simulations in case of neutron-induced SER
22. Neutron-induced SEU in bulk SRAMs in terrestrial environment: simulations and experiments
23. Methodology to compute neutron-induced alphas contribution on the SEU cross section in sensitive RAMs
24. Total dose effects on bipolar integrated circuits: characterization of the saturation region
25. Effect of thermal annealing on radiation-induced degradation of bipolar technologies when the dose rate is switched from high to low
26. Hardening of a radiation sensor based on optically stimulated luminescence
27. Impact of mechanical stress on total-dose effects in bipolar ICs
28. Comparison of NMOS and PMOS transistor sensitivity to SEU in SRAMs by device simulation
29. Model for high-temperature radiation effects in n-p-n bipolar-junction transistors
30. Evaluation and prediction of the degradation of a COTS CCD induced by displacement damage
31. Dose and dose-rate effects on NPN bipolar junction transistors irradiated at high temperature
32. Analysis of the proton-induced permanent degradation in an optocoupler
33. Evaluation of MOS devices' total dose response using the isochronal annealing method
34. High-energy particle irradiation of optically stimulated luminescent films at CERN
35. Modeling low-dose-rate effects in irradiated bipolar-base oxides
36. Experimental validation of an accelerated method of oxide-trap-level characterization for predicting long term thermal effects in metal oxide semiconductor devices
37. Experimental determination of the frequency factor of thermal annealing processes in metal-oxide-semiconductor gate-oxide structures
38. Prediction of low dose-rate effects in power metal oxide semiconductor field effect transistors based on isochronal annealing measurements
39. Determination of the deposited energy in a silicon volume by n-Si nuclear interaction
40. An Integrated Sensor Using Optically Stimulated Luminescence for In-Flight Dosimetry
41. Experimental Procedure to Predict the Competition Between the Degradation Induced by Irradiation and Thermal Annealing of Oxide Trapped Charge in MOSFETs
42. Prediction of the One-Year Thermal Annealing of Irradiated Commercial Devices Based on Experimental Isochronal Curves
43. High Energy Electron Dose-Mapping Using Optically Stimulated Luminescent Films
44. Use of the Radiation-Induced Charge Neutralization Mechanism to Achieve Annealing of 0.35 [micro]m SRAMs
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