Analysis of quasi-monoenergetic neutron and proton SEU cross sections for terrestrial applications

This paper investigates the single event upset sensitivity of Bulk SRAMs for terrestrial applications. The technology sensitivity is analyzed with both quasi-monoenergetic neutron and proton experiments in an energy range from 14 to 180 MeV. Analytical and simulation based correction methods of the neutron cross section are presented and validated. Then, neutron and proton cross section are compared. Soft Error Rate (for the terrestrial neutron spectrum) calculated with either proton or quasi-monoenergetic neutron data are also presented and compared. Index Terms--Bulk technologies, neutron and proton effects, soft error rate (SER), single-event upset (SEU).