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Analysis of bias effects on the total-dose response of a bipolar voltage comparator

Authors :
Bernard, M.F.
Dusseau, L.
Boch, J.
Vaille, J.-R.
Saigne, F.
Schrimpf, R.D.
Lorfevre, E.
David, J.P.
Source :
IEEE Transactions on Nuclear Science. Dec, 2006, Vol. 53 Issue 6, p3232, 5 p.
Publication Year :
2006

Abstract

The impact of the bias condition during irradiation on the total-dose response of a bipolar voltage comparator is investigated. Experimental results obtained with input pins biased asymmetrically during irradiation exhibit completely different total-dose response compared to irradiation with all pins grounded. Circuit analysis shows that asymmetrical biasing of the input stage creates a mismatch of the gain degradation in the transistors constituting the differential pair. Index Terms--Bipolar analog circuits, circuitry, integrated circuits (ICs), linear voltage comparator, total dose.

Details

Language :
English
ISSN :
00189499
Volume :
53
Issue :
6
Database :
Gale General OneFile
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
edsgcl.157362102