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Your search keyword '"SCANNING electron microscopes"' showing total 22 results
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22 results on '"SCANNING electron microscopes"'

1. LOW NOISE, TWO-CHANNEL STEM EBIC SYSTEM.

Author

Kolasa, Ted

Subjects
*TRANSMISSION electron microscopes, *SCANNING electron microscopes, *ELECTRON energy loss spectroscopy, *ELECTRONIC equipment
Abstract

The article reviews STEM EBIC SYSTEM from NanoElectronic Imaging (NEI) with advanced features for high-resolution imaging, conductivity, and temperature mapping.

Published
2023

2. PRODUCT NEWS.

Author

Wagner, Larry

Subjects
*FAILURE analysis, *SCANNING electron microscopes, *OSCILLOSCOPES, *RAMAN microscopy, *EQUIPMENT & supplies, *EVALUATION
Abstract

The article offers information on several products for failure analysis including Apreo scanning electron microscope (SEM) from FEI, WaveRunner 8000 oscilloscopes from Teledyne LeCroy, and inVia Qontor Raman microscope from Renishaw.

Published
2016

5. PRODUCT NEWS.

Author

Wagner, Larry

Subjects
*SCANNING electron microscopes, *ATOMIC force microscopes, *NANOFABRICATION, *EVALUATION
Abstract

The article features several electronic devices and appliances for enhancing productivity and nanofabrication that include the Verios G4 Extreme High-Resolution Scanning Electron Microscope (SEM) and Hyperion II Fast & Efficient Nanoprober from Thermo Fisher Scientific and VELION FIB-SEM instrument from Raith.

Published
2018

6. Product News.

Author

Wagner, Larry

Subjects
*COMMERCIAL product evaluation, *OSCILLOSCOPES, *SCANNING electron microscopes, *EVALUATION
Abstract

The article evaluates several commercial products including the 100MHz U1610A and 200 MHz U1620A oscilloscopes from Agilent Technologies Inc., the defect-review scanning electron microscope (DR-SEM) from Applied Materials Inc. and the 3.0 numerical aperture (NA) solid immersion lens (SIL) technology from Checkpoint Technologies LLC.

Published
2012

7. OLYMPUS LAUNCHES LASER CONFOCAL SCANNING MICROSCOPE.

Author

Wagner, Larry

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article evaluates the OLYMPUS LEXT OLS5000 3-D laser confocal scanning microscope from Olympus Corp.

Published
2018

8. New helium microscope reveals startling details without frying the sample.

Author

Ivy Shih

Subjects
*PROTOTYPES, *HELIUM, *SCANNING electron microscopes, *ELECTRON microscopes
Abstract

The article offers information prototype scanning helium microscope (SHeM) developed by Paul Dastoor and his team at the University of Newcastle, in New South Wales which developed technology that uses a beam of neutral helium atoms to form images. It mentions prototype scanning helium microscope (SHeM) offers a more delicate touch than electron microscopes. It also mentions SHeM presents an opportunity to help further understanding of surface physics.

Published
2017

9. PHENOM-WORLD LAUNCHES NEW DESKTOP SEMS.

Author

Wagner, Larry

Subjects
*SCANNING electron microscopes, *ELECTRON microscopes, *EVALUATION
Abstract

The article offers information about the fifth-generation Phenom Pro and ProX SEMs from Phenom-World.

Published
2018

10. INOVENSO INTRODUCES IEM DESKTOP SEM.

Author

Wagner, Larry

Subjects
*SCANNING electron microscopes, *TESTING equipment, *EVALUATION
Abstract

The article offers information about the IEM Series of desktop scanning electron microscope from Inovenso.

Published
2018

11. FEI's Tecnai Osiris S/TEM goes for speed in analytics.

Author

D. V.

Subjects
*SCANNING electron microscopes, *TRANSMISSION electron microscopes, *EVALUATION
Abstract

The article evaluates the Tecnai Osiris scanning/transmission electron microscope (S/TEM) from Fei Co.

Published
2009

13. Phenom XL desktop scanning electron microscope.

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article offers brief information on the Phenom XL desktop scanning electron microscope (SEM) from ATA Scientific Pty. Ltd.

Published
2015

15. FEI eyes 3D structures with intergated SEM/FIB platform.

Author

D. V.

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article evaluates the Helios NanoLabx50 DualBeam Series 450(S) and 650 structures for the integration of extreme high-resolution scanning electron microscope (XHR SEM) from Fei Co.

Published
2010

16. NEW PRODUCTS.

Subjects
*EVALUATION, *LABORATORY equipment & supplies, *LIFE sciences equipment & supplies, *SPECTROPHOTOMETERS, *SCANNING electron microscopes, *IMMUNOGENETICS
Abstract

The article reviews products designed for use in life science laboratories including Jenway's 67 series spectrophotometers from Bibby Scientific, the Merlin field emission scanning electron microscope (FE-SEM) from Carl Zeiss, and the Dip and Read Immunogenicity Assay Kit from ForteBio.

Published
2010
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17. FEI Announces New Quanta 50 Series SEM.

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article evaluates the Quanta 50 Series scanning electron microscope (SEM) from FEI Co.

Published
2009

19. Scanning electron microscope.

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article evaluates the Nova NanoSEM 30 series scanning electron microscope for Nova Corp.

Published
2007

20. Quanta 3D SEM/FIB Dual Beam.

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article evaluates the Quanta 3D FEG analytical DualBeam from FEI Co.

Published
2007

21. Magnetic Field Cancellation.

Subjects
*MAGNETIC instruments, *MAGNETIC fields, *SCANNING electron microscopes, *OPTICAL instruments
Abstract

The article evaluates the magnetic field cancellation system Mag-NetX from Technical Manufacturing Corp. and offers information on its features including its ability to compensate magnetic interference that diminishes the performance of scanning and transmission microscope.

Published
2006

22. Wet-sample scanning electron microscope.

Subjects
*SCANNING electron microscopes, *ELECTRON microscopes, *NEW product development, *SCIENTIFIC apparatus & instruments
Abstract

Presents a product review of ISI's scanning electron microscope (SEM) that eliminates the need for many sample preparation steps such as fixing, dehydrating, critical point drying and coating. Operation of the Wet-SEM; Features of the instrument.

Published
1989

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