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TESCAN Introduces First Plasma FIB-FESEM Workstation.
- Source :
-
Electronic Device Failure Analysis . Feb2012, Vol. 14 Issue 1, p43-43. 1/2p. - Publication Year :
- 2012
-
Abstract
- The article offers brief information on field-emission scanning electron microscope (FESEM) developed by TESCAN.
- Subjects :
- *SCANNING electron microscopes
*EVALUATION
Subjects
Details
- Language :
- English
- ISSN :
- 15370755
- Volume :
- 14
- Issue :
- 1
- Database :
- Academic Search Index
- Journal :
- Electronic Device Failure Analysis
- Publication Type :
- Academic Journal
- Accession number :
- 70712936