Back to Search
Start Over
FEI's Tecnai Osiris S/TEM goes for speed in analytics.
- Source :
-
Solid State Technology . Oct2009, Vol. 52 Issue 10, p9-19. 2p. - Publication Year :
- 2009
-
Abstract
- The article evaluates the Tecnai Osiris scanning/transmission electron microscope (S/TEM) from Fei Co.
- Subjects :
- *SCANNING electron microscopes
*TRANSMISSION electron microscopes
*EVALUATION
Subjects
Details
- Language :
- English
- ISSN :
- 0038111X
- Volume :
- 52
- Issue :
- 10
- Database :
- Academic Search Index
- Journal :
- Solid State Technology
- Publication Type :
- Academic Journal
- Accession number :
- 44909409