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INOVENSO INTRODUCES IEM DESKTOP SEM.

Authors :
Wagner, Larry
Source :
Electronic Device Failure Analysis. May2018, Vol. 20 Issue 2, p45-45. 1/2p.
Publication Year :
2018

Abstract

The article offers information about the IEM Series of desktop scanning electron microscope from Inovenso.

Subjects

Subjects :
*SCANNING electron microscopes
*TESTING equipment
*EVALUATION

Details

Language :
English
ISSN :
15370755
Volume :
20
Issue :
2
Database :
Academic Search Index
Journal :
Electronic Device Failure Analysis
Publication Type :
Academic Journal
Accession number :
129248205

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Authors Abstract Subjects Details