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FEI Announces New Quanta 50 Series SEM.
- Source :
-
Electronic Device Failure Analysis . Aug2009, Vol. 11 Issue 3, p44-44. 1/2p. - Publication Year :
- 2009
-
Abstract
- The article evaluates the Quanta 50 Series scanning electron microscope (SEM) from FEI Co.
- Subjects :
- *SCANNING electron microscopes
*EVALUATION
Subjects
Details
- Language :
- English
- ISSN :
- 15370755
- Volume :
- 11
- Issue :
- 3
- Database :
- Academic Search Index
- Journal :
- Electronic Device Failure Analysis
- Publication Type :
- Academic Journal
- Accession number :
- 42734938