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1. Design-In Reliability for 90-65nm CMOS Nodes Submitted to Hot-Carriers and NBTI Degradation

2. 65 nm LP/GP mix low cost platform for multi-media wireless and consumer applications

10. Origin of Vt instabilities in high-k dielectrics: Jahn-Tellet effects or oxygen vacancies

21. New Extensive MVHR Breakdown Models

25. Low cost 65nm CMOS platform for Low Power & General Purpose applications

46. 65nm LP/GP mix low cost platform for multi-media wireless and consumer applications

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