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Origin of Vt instabilities in high-k dielectrics: Jahn-Tellet effects or oxygen vacancies
- Source :
- IEEE Transactions on Device and Materials Reliability, IEEE Transactions on Device and Materials Reliability, Institute of Electrical and Electronics Engineers, 2006, 6, pp.132, HAL
- Publication Year :
- 2006
- Publisher :
- HAL CCSD, 2006.
-
Abstract
- International audience
Details
- Language :
- English
- ISSN :
- 15304388
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Device and Materials Reliability, IEEE Transactions on Device and Materials Reliability, Institute of Electrical and Electronics Engineers, 2006, 6, pp.132, HAL
- Accession number :
- edsair.dedup.wf.001..b9c5a437ce20aeb6ec513ba1f2bacfd8