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This article compares the diagnostic performance of two methods for evaluating adnexal masses for malignancy: IOTA's newer model for quantitative methodical assessment (ADNEX) and expert subjective assessment (SA). The study reviewed 17 articles and extracted results for 6,077 adnexal masses, which were confirmed by postoperative pathology. ADNEX demonstrated a sensitivity of 91.3% and a specificity of 84.1%, while SA had a sensitivity of 89.4% and a specificity of 96%. The study found that SA had significantly higher specificity compared to ADNEX, but there was no statistically significant difference in sensitivity between the two methods. The authors suggest that more research should be conducted to determine the superiority of ADNEX over subjective assessment in evaluating adnexal masses for malignancy via ultrasound. [Extracted from the article]

This article compares the diagnostic performance of two methods, the IOTA Simple Rules (SR) and expert subjective assessment (SA), in evaluating adnexal masses for malignancy. The study analyzed 19 articles published between 2016 and 2024, which included a total of 6,012 adnexal masses. The results showed that SA had significantly higher sensitivity and specificity compared to SR assessment. These findings suggest that diagnostic criteria like simple rules may influence the subjective assessment of adnexal masses by physicians. Further research is needed to explore this phenomenon and its implications for clinical practice. [Extracted from the article]

The total ionizing dose effect on a commercial Flash-based field programmable gate array is investigated by gamma ray radiation. The floating-gate threshold and logic propagation delay are measured with respect to the total dose. A physical model is also developed to express the threshold in terms of total dose for both unbiased- and biased-radiation conditions. Experimental data of the threshold fit this model for extracting the modeling parameters. The modeling predictions match further experimental data very well for low to moderate total dose. Using modeling and SPICE simulation together, the prediction of the propagation delay is compared to the experimental data. The biased condition has a good fit while the unbiased prediction over-degrades the propagation delay with respect to the experimental data. Index Terms--Field programmable gate array (FPGA), floating gate transistor, ionizing radiation effects, nonvolatile memory.

This article compares the diagnostic performance of a quantitative methodical assessment called IOTA logistic regression 2 (LR2) and expert subjective assessment (SA) in evaluating the malignancy of known adnexal masses. The study analyzed 9 primary articles published between 2016 and 2024, which included a total of 2,602 adnexal masses. The results showed that SA had significantly higher sensitivity and specificity compared to LR2. The authors suggest that further research should be conducted to determine if physicians subconsciously use diagnostic criteria like LR2 when subjectively assessing adnexal masses via ultrasound. [Extracted from the article]

This article compares the performance of two ultrasound models, the ADNEX test and the Simple Rules (SR) test, in differentiating between benign and malignant adnexal masses. The meta-analysis included 26 articles and a total of 9,058 adnexal masses. The results showed that ADNEX had a sensitivity of 91.3% and a specificity of 84.1%, while SR had a sensitivity of 86.3% and a specificity of 90.5%. The study concluded that clinicians should consider these differences when choosing the most appropriate approach for diagnosing and managing adnexal masses. [Extracted from the article]

A meta-analysis compared the performance of two quantitative ultrasound models, IOTA ADNEX and logistic regression 2 (LR2), in differentiating between benign and malignant adnexal masses. The study found that ADNEX had a higher sensitivity (91.3%) compared to LR2 (84%) in correctly identifying malignancy. However, there was no statistically significant difference in specificity between the two models. The findings suggest that ADNEX may be superior to LR2 as an ultrasound criterion for assessing adnexal masses, but further research is needed to determine if ADNEX should replace LR2 as the gold standard criterion. [Extracted from the article]

This article compares the performance of two ultrasound models, IOTA logistic regression 2 (LR2) and simple rules (SR), in differentiating between benign and malignant adnexal masses. The study used a meta-analysis of primary articles published between 2016 and 2024 to compare the sensitivities and specificities of the two models. The results showed that SR had a higher sensitivity and superior specificity compared to LR2. The authors suggest that more research should be conducted to support the hypothesis that SR should be preferred over LR2 for adnexal mass sonography. [Extracted from the article]

The single event effects and hardening of a 0.15 [micro]m antifuse FPGA, the AX device, were investigated by beam test and computer simulation. The beam test showed no permanent damage mode. Functional failures were observed and attributed to the upsets in a control logic circuit, the startup sequencer. Clock upsets were observed and attributed to the single event transients in the clock network. Upsets were also measured in the user flip-flop and embedded SRAM. The hardening technique dealing with each upset mode is discussed in detail. SPICE and three-dimensional mixed-mode simulations were used to determine the design rules for mitigating the multiple upsets due to glancing angle and charge sharing. The hardening techniques have been implemented in the newly fabricated RTAXS device. Preliminary heavy-ion-beam test data show that all the hard-wired hardening solutions are working successfuliy. Index Terms--Antifuse, device simulation, FPGA, radiation hardening, single event effect (SEE), single event upset (SEU).

Manufacturers of field programmable gate arrays (FPGAs) take different technological and architectural approaches that directly affect radiation performance. Similar technological and architectural features are used in related technologies such as programmable substrates and quick-turn application specific integrated circuits (ASICs). After analyzing current technologies and architectures and their radiation-effects implications, this paper includes extensive test data quantifying various devices' total dose and single event susceptibilities, including performance degradation effects and temporary or permanent re-configuration faults. Test results will concentrate on recent technologies being used in space flight electronic systems and those being developed for use in the near term. This paper will provide the first extensive study of various configuration memories used in programmable devices. Radiation performance limits and their impacts will be discussed for each design. In addition, the interplay between device scaling, process, bias voltage, design, and architecture will be explored. Lastly, areas of ongoing research will be discussed.

Quantitative imaging in very thin silicon dioxide films reveals a new low-voltage contrast mechanism, the true oxide electron-beam-induced current, for the local defects in the films at 3.5 MV per cm of electric fields. The new low-voltage contrast mechanism has an opposite sign to tunneling current microscopy contrast mechanism. The local thinning defect is hence bright and dark at high and low bias voltages, respectively.

An SRAM (static random access memory)-based re-programmable FPGA (field programmable gate array) is investigated for space applications. A new commercial prototype, named the RS family, was used as an example for the investigation. The device is fabricated in a 0.25[micro]m CMOS technology. Its architecture is reviewed to provide a better understanding of the impact of single event upset (SEU) on the device during operation. The SEU effect of different memories available on the device is evaluated. Heavy ion test data and SPICE simulations are used integrally to extract the threshold LET (linear energy transfer). Together with the saturation cross-section measurement from the layout, a rate prediction is done on each memory type. The SEU in the configuration SRAM is identified as the dominant failure mode and is discussed in detail. The single event transient error in combinational logic is also investigated and simulated by SPICE. SEU mitigation by hardening the memories and employing EDAC (error detection and correction) at the device level are presented. For the configuration SRAM (CSRAM) cell, the trade-off between resistor de-coupling and redundancy hardening techniques are investigated with interesting results. Preliminary heavy ion test data show no sign of SEL (single event latch-up). With regard to ionizing radiation effects, the increase in static leakage current (static [I.sub.CC)) measured indicates a device tolerance of approximately 50krad(Si).

Architecture and process, combined, significantly affect the hardness of programmable technologies. The effects of high energy ions, ferroelectric memory architectures, and shallow trench isolation are investigated. A detailed single event latchup (SEL) study has been performed.

Field programmable gate array (FPGA) devices, heavily used in spacecraft electronics, have grown substantially in size over the past few years, causing designers to work at a higher conceptual level, with computer aided engineering (CAE) tools synthesizing and optimizing the logic from a description. It is shown that the use of commercial-off-the-shelf (COTS) CAE tools can produce unreliable circuit designs when the device is used in a radiation environment and a flip-flop is upset. At a lower level, software can be used to improve the SEU performance of a flip-flop, exploiting the configurable nature of FPGA technology and on-chip delay, parasitic resistive, and capacitive circuit elements.

The single event effects and hardening of a 0.15 μm antifuse FPGA, the AX device, were investigated by beam test and computer simulation. The beam test showed no permanent damage mode. Functional failures were observed and attributed to the upsets In a control logic circuit, the startup sequencer Clock upsets were observed and attributed to the single event transients in the clock network. Upsets were also measured In the user flip-flop and embedded SRAM. The hardening technique dealing with each upset mode is discussed in detail. SPICE and three-dimensional mixed-mode simulations were used to determine the design rules for mitigating the multiple upsets due to glancing angle and charge sharing. The hardening techniques have been implemented in the newly fabricated RTAXS device. Preliminary heavy-ion-beam test data show that all the hard-wired hardening solutions are working successfully. [ABSTRACT FROM AUTHOR]