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Your search keyword '"Dooryhee, E."' showing total 5 results
Start Over Author "Dooryhee, E." Topic physics
5 results on '"Dooryhee, E."'

1. X-ray diffraction studies of the effects of N incorporation in amorphous CNx materials

Author

Walters, J.K., Kuhn, M., Spaeth, C., Dooryhee, E., and Newport, R.J.

Subjects
Nitrogen -- Isotopes, Physics
Abstract

The incorporation of only 5 at. % N leads to significant differences in the atomic-scale structure of amorphous CNx samples. Changes in structure continue as further N is added. It has been established that CNx is mainly a tetrahedrally bonded amorphous network. There is a more marked change between 5 at. % N and 20 at. % N, which more clearly shows the growth of CCN mixed second neighbour correlations. The fraction of sp2 bonded carbon atoms rises with increasing N concentration.

Published
1998

2. Structural and electrical damage induced by high-energy heavy ions in SiO2/Si structures

Author

Busch, M.C., Slaoui, A., Siffert, P., Dooryhee, E., and Toulemonde, M.

Subjects
Silicon crystals, Effect of radiation on -- Research, Ion bombardment -- Research, Silicon oxide films -- Research, Physics
Abstract

Silicon dioxide/silicon (SiO2/Si) structures were irradiated by high-energy xenon and nickel ions. Analysis of the irradiated structures by infrared spectroscopy shows atomic displacements as well as broken and strained silicon-oxygen bonds. There was anincrease of the interface-state density and oxide trapped-charge density with ion fluence. The electrically active point defects detected in irradiated silicon were associated with vacancy complexes.

Published
1992

3. Investigation of strain relaxation mechanisms and transport properties in epitaxial SmNi[O.sub.3] films

Author

Conchon, F., Boulle, A., Guinebretiere, R., Dooryhee, E., Hodeau, J.-L., Girardot, C., Pignard, S., Kreisel, J., Weiss, F., Libralesso, L., and Lee, T.L.

Subjects
Chemical vapor deposition -- Analysis, Nickel alloys -- Mechanical properties, Nickel alloys -- Electric properties, Samarium -- Mechanical properties, Samarium -- Electric properties, Shear (Mechanics) -- Analysis, Physics
Abstract

The strain relaxation in SmNi[O.sub.3] epitaxial films deposited by chemical vapor deposition on SrTi[O.sub.3] substrates is studied. A phenomenological model is used for particular planar faults that give rise to extended diffuse scattering on transverse scans.

Published
2008

4. Degradation and recovery of polarization under synchrotron x rays in SrBi(sub 2)Ta(sub 2)O9 ferroelectric capacitors

Author

Menou, M., Castagnos, A, -M., Muller, Ch., Goguenheim, D., Goux, L, Wouters, D. J., Hodeau, J. -L, Dooryhee, E., and Barrett, R.

Subjects
Synchrotron radiation -- Analysis, Transmission electron microscopes -- Observations, Electrolytic capacitors -- Structure, Electrolytic capacitors -- Properties, X-rays -- Diffraction, X-rays -- Analysis, Physics
Abstract

The elementary Pt/SrBi2Ta2O9/Pt ferroelectric capacitors are characterized by x-ray diffraction using highly brilliant synchrotron radiation. The mechanisms of charge trapping proposed are discussed to explain aging and rejuvenation.

Published
2005

5. Revealing the powdering methods of black makeup in ancient Egypt by fitting microstructure based Fourier coefficients to the whole x-ray diffraction profiles of galena

Author

Ungar, T., Martinetto, P., Ribarik, G., Dooryhee, E., Walter, Ph., and Anne, M.

Subjects
Lead compounds -- Research, Lead compounds -- Optical properties, Galena -- Research, Galena -- Optical properties, Physics
Abstract

The average microstructure of ga lena is identified in several black eye makeups in ancient Egypt, using high-resolution x-ray diffraction data. The data enables us to describe the procedures of eye makeup manufacturing in the Middle and New Kingdoms of Egypt some 2000 years before Christ.

Published
2002

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