Degradation and recovery of polarization under synchrotron x rays in SrBi(sub 2)Ta(sub 2)O9 ferroelectric capacitors

Authors :: Menou, M.
Castagnos, A, -M.
Muller, Ch.
Goguenheim, D.
Goux, L
Wouters, D. J.
Hodeau, J. -L
Dooryhee, E.
Barrett, R.
Source :: Journal of Applied Physics. Feb 15, 2005, Vol. 97 Issue 4, 044106-1-044106-8
Publication Year :: 2005
Abstract: The elementary Pt/SrBi2Ta2O9/Pt ferroelectric capacitors are characterized by x-ray diffraction using highly brilliant synchrotron radiation. The mechanisms of charge trapping proposed are discussed to explain aging and rejuvenation.

Subjects :: Synchrotron radiation -- Analysis
Transmission electron microscopes -- Observations
Electrolytic capacitors -- Structure
Electrolytic capacitors -- Properties
X-rays -- Diffraction
X-rays -- Analysis
Physics

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