Author: "Franck, Delmotte" / Topic: 0103 physical sciences - Searchworks@Jio Institute Digital Library Search Results

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53 results on '"Franck, Delmotte"'

1. The Solar Orbiter EUI instrument: The Extreme Ultraviolet Imager

Author: J. Hansotte, R. Müller, M. Hailey, P. Schlatter, A. Lawrenson, M. Monecke, Hardi Peter, Julien Rosin, Koen Stegen, Jean-Claude Vial, S. Parenti, Ali BenMoussa, Etienne Renotte, N. Szwec, Marie-Laure Hellin, R. Enge, M. Haberreiter, A. Philippon, P. Coker, B. Giordanengo, L. Dolla, K. Heerlein, Werner Schmutz, Matthew J. West, K. Ruane, J.-F. Hochedez, M. Chaigneau, M. Kahle, Emmanuel Mazy, J. Scanlan, J. Tandy, J. Barbay, B. Chares, T. Appourchaux, Laurence Rossi, C. Dumesnil, E. Pylyser, R. Aznar Cuadrado, Louise K. Harra, S. Meyer, F. Cabé, Benoit Marquet, Evgueni Meltchakov, Andrei Zhukov, D. Westwood, Bogdan Nicula, G. Willis, M.-F. Ravet-Krill, B. Borgo, S. Hemsley, Isabelle Tychon, N. Guerreiro, D. Linder, R. Mercier, Sylvie Liébecq, Thomas Wiegelmann, Philip J. Smith, M. Gyo, L. Mountney, G. Davison, Frédéric Rabecki, Jean-Marie Gillis, P. Langer, P. Roth, Sami K. Solanki, Luciano Rodriguez, Jean-Philippe Halain, L. Cadiergues, P. Addison, V. Büchel, D. Markiewicz-Innes, X. Zhang, Daniel Pfiffner, M. Roulliay, Antoine Rousseau, Stéphane Roose, Udo Schühle, M. Spescha, Jean-Yves Plesseria, Lionel Jacques, J. C. Le Clec’h, Yvan Stockman, G. Del Zanna, T. Kennedy, C. Beurthe, B. Mampaey, Franck Delmotte, C. Theobald, C. Choque Cortez, S. Meining, S. François, David Long, M. Bergmann, F. Rouesnel, S. Koller, C. Tamiatto, M. Bouzit, David Berghmans, D. Bates, L. Bradley, E. Kotsialos, A. Hafiz, D. Davies, J. B. L. Jones, S. Smit, Véronique Delouille, Gilles Morinaud, Aline Hermans, S. Coumar, J. Rebellato, Yvette Houbrechts, Stephan Werner, Werner Curdt, J. Cutler, K. Bonte, Daniel B. Seaton, Jean-Marc Defise, F. Moron, M. Klaproth, Eric Buchlin, J.-J. Fourmond, I. Phillips, Jörg Büchner, Pierre Rochus, M. Kolleck, Christophe Hecquet, Sarah A. Matthews, L. van Driel-Gesztelyi, Lucie M. Green, Cis Verbeeck, S. Gissot, F. Dürig, M. Condamin, Cedric Lenaerts, F. Auchère, K. Ihsan, K. Silliman, A. Guilbaud, Luca Teriaca, E. Kraaikamp, F. Monfort, A. Jérôme, Andreas Zerr, E. Marsch, Berend Winter, D. N. Baker, Alexandra Mazzoli, A. Spencer, V. Hervier, Institut d'astrophysique spatiale (IAS), Centre National de la Recherche Scientifique (CNRS)-Institut national des sciences de l'Univers (INSU - CNRS)-Université Paris-Saclay, Centre Spatial de Liège (CSL), Université de Liège, Institut national des sciences de l'Univers (INSU - CNRS)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), Royal Observatory of Belgium [Brussels] (ROB), Mullard Space Science Laboratory (MSSL), University College of London [London] (UCL), Physikalisch-Meteorologisches Observatorium Davos/World Radiation Center (PMOD/WRC), Max-Planck-Institut für Sonnensystemforschung (MPS), Max-Planck-Gesellschaft, Max Planck Institute for Solar System Research (MPS), Laboratoire Charles Fabry / Optique XUV, Laboratoire Charles Fabry (LCF), Institut d'Optique Graduate School (IOGS)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), Centre National d'Études Spatiales [Toulouse] (CNES), Faculty of mathematics Centre for Mathematical Sciences [Cambridge] (CMS), and University of Cambridge [UK] (CAM)
Subjects: 010504 meteorology & atmospheric sciences, Field of view, Context (language use), Astrophysics, 01 natural sciences, 7. Clean energy, law.invention, Orbiter, law, 0103 physical sciences, Astrophysics::Solar and Stellar Astrophysics, Aerospace engineering, 010303 astronomy & astrophysics, Chromosphere, ComputingMilieux_MISCELLANEOUS, 0105 earth and related environmental sciences, Physics, business.industry, [SDU.ASTR.SR]Sciences of the Universe [physics]/Astrophysics [astro-ph]/Solar and Stellar Astrophysics [astro-ph.SR], Ecliptic, Astrophysics::Instrumentation and Methods for Astrophysics, Astronomy and Astrophysics, Corona, 13. Climate action, Space and Planetary Science, Extreme ultraviolet, Physics::Space Physics, Astrophysics::Earth and Planetary Astrophysics, business, [PHYS.ASTR]Physics [physics]/Astrophysics [astro-ph], Heliosphere
Abstract: Context.The Extreme Ultraviolet Imager (EUI) is part of the remote sensing instrument package of the ESA/NASA Solar Orbiter mission that will explore the inner heliosphere and observe the Sun from vantage points close to the Sun and out of the ecliptic. Solar Orbiter will advance the “connection science” between solar activity and the heliosphere.Aims.With EUI we aim to improve our understanding of the structure and dynamics of the solar atmosphere, globally as well as at high resolution, and from high solar latitude perspectives.Methods.The EUI consists of three telescopes, the Full Sun Imager and two High Resolution Imagers, which are optimised to image in Lyman-αand EUV (17.4 nm, 30.4 nm) to provide a coverage from chromosphere up to corona. The EUI is designed to cope with the strong constraints imposed by the Solar Orbiter mission characteristics. Limited telemetry availability is compensated by state-of-the-art image compression, onboard image processing, and event selection. The imposed power limitations and potentially harsh radiation environment necessitate the use of novel CMOS sensors. As the unobstructed field of view of the telescopes needs to protrude through the spacecraft’s heat shield, the apertures have been kept as small as possible, without compromising optical performance. This led to a systematic effort to optimise the throughput of every optical element and the reduction of noise levels in the sensor.Results.In this paper we review the design of the two elements of the EUI instrument: the Optical Bench System and the Common Electronic Box. Particular attention is also given to the onboard software, the intended operations, the ground software, and the foreseen data products.Conclusions.The EUI will bring unique science opportunities thanks to its specific design, its viewpoint, and to the planned synergies with the other Solar Orbiter instruments. In particular, we highlight science opportunities brought by the out-of-ecliptic vantage point of the solar poles, the high-resolution imaging of the high chromosphere and corona, and the connection to the outer corona as observed by coronagraphs.
Published: 2020
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2. Lifetime Stability and Microstructure Properties of Cr/B4C X-ray Reflective Multilayer Coatings

Author: Julien E. Rault, Evgueni Meltchakov, Franck Delmotte, Regina Soufli, Christopher C. Walton, Catherine Burcklen, Eric M. Gullikson, Jennifer Rebellato, Laboratoire Charles Fabry / Optique XUV, Laboratoire Charles Fabry (LCF), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS), Lawrence Livermore National Laboratory (LLNL), Synchrotron SOLEIL (SSOLEIL), Centre National de la Recherche Scientifique (CNRS), and Lawrence Berkeley National Laboratory [Berkeley] (LBNL)
Subjects: Diffraction, Materials science, 010308 nuclear & particles physics, Chrominum, Biomedical Engineering, Analytical chemistry, Soft X-rays, Bioengineering, General Chemistry, Photon energy, Condensed Matter Physics, Microstructure, 01 natural sciences, 010309 optics, Diffusion layer, Boron Carbide, Multilayers, Electron diffraction, Transmission electron microscopy, 0103 physical sciences, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], General Materials Science, Spectroscopy, Layer (electronics)
Abstract: International audience; This paper demonstrates that highly reflective Cr/B 4 C multilayer interference coatings with nano-metric layer thicknesses, designed to operate in the soft X-ray photon energy range, have stable reflective performance for a period of 3 years after deposition. The microstructure and chemical composition of layers and interfaces within Cr/B 4 C multilayers is also examined, with emphasis on the B 4 Con -Cr interface where a significant diffusion layer is formed and on the oxide in the top B 4 C layer. Multiple characterization techniques (X-ray reflectivity at different photon energies, X-ray pho-toelectron spectroscopy, transmission electron microscopy, electron diffraction and X-ray diffraction) are employed and the results reveal a consistent picture of the Cr/B 4 C layer structure.
Published: 2019
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3. Optical constants of magnetron sputtered Pt thin films with improved accuracy in the N- and O-electronic shell absorption regions

Author: Farhad Salmassi, Franck Delmotte, David Girou, Julia Meyer-Ilse, Nicolai Brejnholt, Sonny Massahi, Eric M. Gullikson, Regina Soufli, Finn Erland Christensen, Lawrence Livermore National Laboratory (LLNL), Laboratoire Charles Fabry / Optique XUV, Laboratoire Charles Fabry (LCF), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS), Center for X-Ray Optics [LBNL Berkeley] (CXRO), Lawrence Berkeley National Laboratory [Berkeley] (LBNL), and Danish Technical University
Subjects: 010302 applied physics, Range (particle radiation), [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Materials science, Shell (structure), General Physics and Astronomy, Physics::Optics, 02 engineering and technology, Photon energy, 021001 nanoscience & nanotechnology, 01 natural sciences, Molecular physics, Photoexcitation, 0103 physical sciences, Cavity magnetron, Thin film, 0210 nano-technology, Absorption (electromagnetic radiation), Refractive index, ComputingMilieux_MISCELLANEOUS
Abstract: We present an experimental, self-consistent determination of the optical constants (refractive index) of Pt using a combination of photoabsorption and reflectance data in the photon energy range 25–778 eV, which includes the N- and O-shell electronic absorption edges of Pt. We compare our new experimental values with Pt optical constant data sets from the literature. Our Pt optical constant values reveal highly resolved absorption-edge fine structure around the O2,3 and N6,7 edges in both the absorptive and dispersive portions of the refractive index, which were missing in the earlier literature.We present an experimental, self-consistent determination of the optical constants (refractive index) of Pt using a combination of photoabsorption and reflectance data in the photon energy range 25–778 eV, which includes the N- and O-shell electronic absorption edges of Pt. We compare our new experimental values with Pt optical constant data sets from the literature. Our Pt optical constant values reveal highly resolved absorption-edge fine structure around the O2,3 and N6,7 edges in both the absorptive and dispersive portions of the refractive index, which were missing in the earlier literature.
Published: 2019
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4. Laboratory grazing-incidence X-ray fluorescence spectroscopy as an analytical tool for the investigation of sub-nanometer CrSc multilayer water window optics

Author: Ulrich Waldschläger, Philippe Jonnard, Meiyi Wu, Jonas Baumann, Ioanna Mantouvalou, Veronika Szwedowski-Rammert, Armin Gross, Gesa Goetzke, Evgueni Meltchakov, Franck Delmotte, Birgit Kanngießer, Philipp Hönicke, Technical University of Berlin, Physikalisch-Technische Bundesanstalt [Berlin] (PTB), Laboratoire de Chimie Physique - Matière et Rayonnement (LCPMR), Institut de Chimie du CNRS (INC)-Sorbonne Université (SU)-Centre National de la Recherche Scientifique (CNRS), Bruker Nano GmbH, and Institut d'Optique Graduate School (IOGS)
Subjects: Physics - Instrumentation and Detectors, Materials science, FOS: Physical sciences, Synchrotron radiation, Applied Physics (physics.app-ph), Radiation, 01 natural sciences, Analytical Chemistry, Optics, 0103 physical sciences, Instrumentation, ComputingMilieux_MISCELLANEOUS, Spectroscopy, 010302 applied physics, Profiling (computer programming), Water window, business.industry, 010401 analytical chemistry, Physics - Applied Physics, Instrumentation and Detectors (physics.ins-det), X-Ray Fluorescence Spectroscopy, Atomic and Molecular Physics, and Optics, 0104 chemical sciences, [PHYS.COND.CM-GEN]Physics [physics]/Condensed Matter [cond-mat]/Other [cond-mat.other], Nanometre, business, Layer (electronics)
Abstract: Efficient multilayer optics for radiation in the water window range are difficult to manufacture due to extremely small layer thicknesses and severe intermixing of elements between the layers. Therefore, adequate analytics and short feedback loops are of utmost importance for manufacturers to improve performance and efficiency. We show the possibility for non-destructive elemental depth profiling with commercial laboratory equipment using four real-life CrSc multilayer samples. Comparative measurements at the laboratory of PTB at the synchrotron radiation facility BESSY II confirm the results and prove the potential of laboratory equipment for the reliable analysis of stratified materials with sub-nanometer layer thicknesses.
Published: 2020
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5. High efficiency Al/Sc-based multilayer coatings in the EUV wavelength range above 40 nanometers

Author: Jennifer Rebellato, Regina Soufli, Franck Delmotte, Evgueni Meltchakov, Eric M. Gullikson, Sébastien de Rossi, Laboratoire Charles Fabry / Optique XUV, Laboratoire Charles Fabry (LCF), Institut d'Optique Graduate School (IOGS)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), Centre National d'Études Spatiales [Toulouse] (CNES), Lawrence Livermore National Laboratory (LLNL), and Lawrence Berkeley National Laboratory [Berkeley] (LBNL)
Subjects: [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Materials science, business.industry, Attosecond, Extreme ultraviolet lithography, 02 engineering and technology, 021001 nanoscience & nanotechnology, Laser, 01 natural sciences, Atomic and Molecular Physics, and Optics, law.invention, 010309 optics, Wavelength, Optics, Transmission electron microscopy, law, Extreme ultraviolet, 0103 physical sciences, Nanometre, Thin film, 0210 nano-technology, business, ComputingMilieux_MISCELLANEOUS
Abstract: In this Letter, we have developed new and highly efficient periodic multilayer mirrors Al/Sc, Al/Sc/SiC, and Mo/Al/Sc with optimized reflectance at wavelengths between 40 and 65 nm. We have reached record values in measured peak reflectance: 57.5% at 44.7 nm and 46.5% at 51 nm, with Al/Sc/SiC at near-normal incidence. Furthermore, to the best of our knowledge, we have achieved the largest reported bandwidth with Mo/Al/Sc at 57 nm and the narrowest bandwidth with Al/Sc at a 60 nm wavelength. These new and promising results demonstrate that Al/Sc-based multilayer coatings are excellent candidates for future generations of extreme ultraviolet (EUV) instruments for solar physics, EUV lasers, and attosecond science, in a wavelength range that has not been fully explored.
Published: 2020
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6. Analyses of tabulated optical constants for thin films in the EUV range and application to solar physics multilayer coatings

Author: Regina Soufli, Franck Delmotte, Jennifer Rebellato, F. Auchère, Sébastien de Rossi, Xueyan Zhang, Evgueni Meltchakov, Laboratoire Charles Fabry / Optique XUV, Laboratoire Charles Fabry (LCF), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS), Centre National d'Études Spatiales [Toulouse] (CNES), Lawrence Livermore National Laboratory (LLNL), Institut d'astrophysique spatiale (IAS), and Université Paris-Sud - Paris 11 (UP11)-Institut national des sciences de l'Univers (INSU - CNRS)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Zirconium, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Materials science, business.industry, Extreme ultraviolet lithography, chemistry.chemical_element, 02 engineering and technology, Boron carbide, 021001 nanoscience & nanotechnology, 01 natural sciences, Spectral line, 010309 optics, chemistry.chemical_compound, chemistry, Extreme ultraviolet, 0103 physical sciences, Silicon carbide, Transmittance, Optoelectronics, Thin film, [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat], 0210 nano-technology, business, ComputingMilieux_MISCELLANEOUS
Abstract: The thin film optical constants are key parameters to carry out optical simulation or optimization of multilayer mirrors with high efficiency. However, for most materials, different sets of optical constants can be found in the literature especially in the EUV range, as these parameters are not as well-known in the EUV as in the visible or wavelength range. In this work, we have used several reflectance and transmittance measurements in the wavelength range from 10 nm to 60 nm. Different optical constant files have been tested and compared with the IMD simulation software. We will present some experimental spectra and theoretical simulations to highlight the existing problem on the reliability of optical constants sets and to discuss potential solutions. We focus our research on a few materials of particular interest in the EUV range such as aluminum, aluminum oxide, molybdenum, zirconium, magnesium, silicon carbide, and boron carbide. These analyses lead us to select the most reliable and accurate optical constants set, or to create the best one from the concatenation of existing data for each material of interest.
Published: 2018
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7. Kossel interferences of proton-induced X-ray emission lines in periodic multilayers

Author: Philippe Jonnard, Sébastien de Rossi, D. Schmaus, Catherine Burcklen, Françoise Bridou, Meiyi Wu, Franck Delmotte, Karine Le Guen, Evgueni Meltchakov, Jean-Michel André, Emrick Briand, Vita Ilakovac, Ian Vickridge, S. Steydli, Laboratoire de Chimie Physique - Matière et Rayonnement ( LCPMR ), Université Pierre et Marie Curie - Paris 6 ( UPMC ) -Centre National de la Recherche Scientifique ( CNRS ), Institut des Nanosciences de Paris ( INSP ), Laboratoire Charles Fabry / XUV, Laboratoire Charles Fabry ( LCF ), Institut d'Optique Graduate School ( IOGS ) -Centre National de la Recherche Scientifique ( CNRS ) -Université Paris-Sud - Paris 11 ( UP11 ) -Institut d'Optique Graduate School ( IOGS ) -Centre National de la Recherche Scientifique ( CNRS ) -Université Paris-Sud - Paris 11 ( UP11 ), The multilayer sample has been deposited as part of CEMOX (Centrale d’Elaboration et de Métrologie d’Optique X), a platform of LUMAT federation (CNRS FR2764)., Laboratoire de Chimie Physique - Matière et Rayonnement (LCPMR), Université Pierre et Marie Curie - Paris 6 (UPMC)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Institut des Nanosciences de Paris (INSP), Université Pierre et Marie Curie - Paris 6 (UPMC)-Centre National de la Recherche Scientifique (CNRS), Sorbonne Université (SU)-Centre National de la Recherche Scientifique (CNRS), Couches nanométriques : formation, interfaces, défauts (INSP-E5), Sorbonne Université (SU)-Centre National de la Recherche Scientifique (CNRS)-Sorbonne Université (SU)-Centre National de la Recherche Scientifique (CNRS), Sorbonne Université (SU), SAFIR - Système d'Analyse par Faisceaux d'Ions Rapides, Sorbonne Université (SU)-Centre National de la Recherche Scientifique (CNRS)-Sorbonne Université (SU)-Centre National de la Recherche Scientifique (CNRS)-Institut des Nanosciences de Paris (INSP), Laboratoire Charles Fabry / Optique XUV, Laboratoire Charles Fabry (LCF), and Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Nuclear and High Energy Physics, Materials science, Physics - Instrumentation and Detectors, Proton, [ SPI.MAT ] Engineering Sciences [physics]/Materials, FOS: Physical sciences, 02 engineering and technology, Kossel line, 01 natural sciences, [SPI.MAT]Engineering Sciences [physics]/Materials, Optics, Stack (abstract data type), 0103 physical sciences, PIXE, Emission spectrum, Irradiation, [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det], periodic multilayer, Instrumentation, [ PHYS.PHYS.PHYS-INS-DET ] Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det], 010302 applied physics, business.industry, Oscillation, Bragg's law, Instrumentation and Detectors (physics.ins-det), 021001 nanoscience & nanotechnology, Wavelength, [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic, [ SPI.OPTI ] Engineering Sciences [physics]/Optics / Photonic, Atomic physics, 0210 nano-technology, business, Intensity (heat transfer)
Abstract: International audience; The Kossel interferences generated by characteristic x-ray lines produced inside a periodic multilayer have been observed upon proton irradiation, by submitting a Cr/B4C/Sc multilayer stack to 2 MeV protons and observing the intensity of the Sc and Cr Kα characteristic emissions as a function of the detection angle. When this angle is close to the Bragg angle corresponding to the emission wavelength and period of the multilayer, an oscillation of the measured intensity is detected. The results are in good agreement with a model based on the reciprocity theorem. The combination of the Kossel measurements and their simulation, will be a useful tool to obtain a good description of the multilayer stack and thus to study nanometer-thick layers and their interfaces.
Published: 2016
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8. Cr/B4C multilayer mirrors: Study of interfaces and X-ray reflectance

Author: Evgueni Meltchakov, Franck Delmotte, Regina Soufli, Muriel Thomasset, A. Jérome, François Polack, Catherine Burcklen, D. Dennetiere, Eric M. Gullikson, B. Capitanio, S. de Rossi, Laboratoire Charles Fabry / Optique XUV, Laboratoire Charles Fabry (LCF), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS), Lawrence Livermore National Laboratory (LLNL), Synchrotron SOLEIL (SSOLEIL), Centre National de la Recherche Scientifique (CNRS), Center for X-Ray Optics [LBNL Berkeley] (CXRO), and Lawrence Berkeley National Laboratory [Berkeley] (LBNL)
Subjects: [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Materials science, business.industry, X-ray, General Physics and Astronomy, 02 engineering and technology, Sputter deposition, 021001 nanoscience & nanotechnology, 01 natural sciences, Mathematical Sciences, 010309 optics, Optics, Engineering, Absorption edge, Interference (communication), Transmission electron microscopy, 0103 physical sciences, Physical Sciences, [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic, 0210 nano-technology, business, Reflectometry, Layer (electronics), Refractive index, Applied Physics
Abstract: International audience; We present an experimental study of the effect of layer interfaces on the x-ray reflectance in Cr/B4C multilayer interference coatings with layer thicknesses ranging from 0.7 nm to 5.4 nm. The multilayers were deposited by magnetron sputtering and by ion beam sputtering. Grazing incidence x-ray reflectometry, soft x-ray reflectometry, and transmission electron microscopy reveal asymmetric multilayer structures with a larger B4C-on-Cr interface, which we modeled with a 1–1.5 nm thick interfacial layer. Reflectance measurements in the vicinity of the Cr L2,3 absorption edge demonstrate fine structure that is not predicted by simulations using the currently tabulated refractive index (optical constants) values for Cr.
Published: 2016
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9. Soft x-ray optical constants of sputtered chromium thin films with improved accuracy in the L and M absorption edge regions

Author: A. Jérome, Farhad Salmassi, Catherine Burcklen, Julia Meyer-Ilse, Ian Vickridge, Jennifer Rebellato, Franck Delmotte, Regina Soufli, Emrick Briand, and Eric M. Gullikson
Subjects: Materials science, Analytical chemistry, General Physics and Astronomy, 02 engineering and technology, Sputter deposition, 021001 nanoscience & nanotechnology, Rutherford backscattering spectrometry, 01 natural sciences, XANES, 010309 optics, Absorption edge, 0103 physical sciences, Transmittance, Thin film, 0210 nano-technology, Absorption (electromagnetic radiation), Refractive index
Abstract: In this study, we determine with improved accuracy the complex index of refraction n = 1 − δ + iβ of sputtered chromium thin films for photon energies ranging from 25 eV to 813 eV. These data include the first absolute measurements of the absorption fine structure near the Cr-L edge. First, we verified by combining Rutherford Backscattering Spectrometry and grazing-incidence x-ray reflectometry that the sputtered thin films were pure Cr with a density consistent with tabulated values. Then, we demonstrated that the Cr surface oxide layer remains stable when the samples are exposed to air for up to 4 years. The Cr absorption coefficient β was determined from the transmittance of freestanding Cr thin films with various thicknesses, measured at the ALS synchrotron radiation source. A model is proposed to correct the transmittance data from the spectral contamination of the source. Finally, we used the new β values, combined with theoretical and tabulated data from the literature, in order to calculate the δ values by the Kramers-Kronig relation. The improvement in the accuracy of β values is demonstrated by the f-sum rule. An additional validation of the new Cr optical constants (δ, β) is performed by comparing the simulated and experimental reflectance of a Cr/B4C multilayer mirror near the Cr-L2,3 edge.
Published: 2018
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10. Development of Al-based multilayer optics for EUV

Author: Marie-Françoise Ravet-Krill, Marc Roulliay, Evgueni Meltchakov, Françoise Varniere, Françoise Bridou, Y. Menesguen, S. de Rossi, Franck Delmotte, A. Jérome, Christophe Hecquet, Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS), Laboratoire d'interaction du rayonnement X avec la matière (LIXAM), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS), and ANR: ATTOMIX,ATTOMIX
Subjects: 42.70.-a - 61.05.Cm - 68.35.Ct - 78.67.Pt - 81.07.-b, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Materials science, business.industry, Superlattice, Extreme ultraviolet lithography, Synchrotron radiation, 02 engineering and technology, General Chemistry, Surface finish, 021001 nanoscience & nanotechnology, 01 natural sciences, 7. Clean energy, 010309 optics, chemistry.chemical_compound, Wavelength, Optics, chemistry, Stack (abstract data type), 0103 physical sciences, Silicon carbide, High harmonic generation, General Materials Science, 0210 nano-technology, business
Abstract: International audience; We report on the development of multilayer optics for the extreme ultra-violet (EUV) range. The optical performance of Al-based multilayer mirrors is discussed with regard to promising reflectivity and selectivity characteristics and the problems of the interfacial roughness for this type of multilayers. We demonstrate a possibility to reduce the average roughness by introducing additional metal layer (W or Mo) rather than depositing a buffer layer at each interface. We have prepared and tested Al/SiC, Al/W/SiC and Al/Mo/SiC multilayers of various periods for the spectral range from 15 to 40 nm, which is the range of increasing interest for high-order harmonic generation, synchrotron radiation and astrophysics. The structure of the three-component systems has been optimized in order to obtain the best reflectivity for each wavelength within the spectral range. We have shown that introduction of refractory metal in Al-based periodic stack can improve the optical performance of multilayer reflecting coatings designed for the EUV applications.
Published: 2009
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11. Phase measurement of soft x-ray multilayer mirrors

Author: Angelo Giglia, Stefano Nannarone, Evgueni Meltchakov, Charles Bourassin-Bouchet, Franck Delmotte, Sébastien de Rossi, Laboratoire Charles Fabry / Optique XUV, Laboratoire Charles Fabry (LCF), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS), Synchrotron SOLEIL (SSOLEIL), Centre National de la Recherche Scientifique (CNRS), CNR Istituto Officina dei Materiali (IOM), Consiglio Nazionale delle Ricerche [Roma] (CNR), and Equipex ATTOLAB, Agence Nationale de la Recherche (ANR3113EQPX30005).
Subjects: Photocurrent, Range (particle radiation), [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Materials science, business.industry, Mean free path, Phase (waves), chemistry.chemical_element, X-ray optics, 02 engineering and technology, Electron, 021001 nanoscience & nanotechnology, 01 natural sciences, Atomic and Molecular Physics, and Optics, 010309 optics, Optics, chemistry, Stack (abstract data type), soft x-ray, 0103 physical sciences, [PHYS.PHYS.PHYS-POP-PH]Physics [physics]/Physics [physics]/Popular Physics [physics.pop-ph], [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic, Scandium, 0210 nano-technology, business
Abstract: International audience; We propose a new model enabling the extraction of the phase of a multilayer mirror from photocurrent measure- ments in the soft x rays. In this range, the effects of the mean free path of the electrons inside the stack can no longer be neglected, which prevents the phase reconstruction by conventional photocurrent measurements. The new model takes into account this phenomenon and thus extends up to the x rays the applicability range of the technique. This ap- proach has been validated through a numerical and exper- imental study of chromium/scandium multilayers used near 360 eV. To our knowledge, this work constitutes the first measurement of the phase of a multilayer mirror in the soft x-ray range.
Published: 2015
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12. La/B4C small period multilayer interferential mirror for the analysis of boron

Author: Françoise Bridou, Arnaud Jérôme, Philippe Jonnard, Jean-Michel André, C. Michaelsen, Franck Delmotte, Marie-Françoise Ravet, Elena O. Filatova, J. Wiesmann, Laboratoire de Chimie Physique - Matière et Rayonnement (LCPMR), Université Pierre et Marie Curie - Paris 6 (UPMC)-Centre National de la Recherche Scientifique (CNRS), Incoatec GmbH (INCOATEC), Incoatec, Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS), Institute of Physics, St Petersburg State University (SPbU), Université Pierre et Marie Curie - Paris 6 (UPMC)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11), Laboratoire de Chimie Physique - Matière et Rayonnement ( LCPMR ), Université Pierre et Marie Curie - Paris 6 ( UPMC ) -Centre National de la Recherche Scientifique ( CNRS ), Incoatec GmbH ( INCOATEC ), Laboratoire Charles Fabry de l'Institut d'Optique ( LCFIO ), Université Paris-Sud - Paris 11 ( UP11 ) -Institut d'Optique Graduate School ( IOGS ) -Centre National de la Recherche Scientifique ( CNRS ) -Université Paris-Sud - Paris 11 ( UP11 ) -Institut d'Optique Graduate School ( IOGS ) -Centre National de la Recherche Scientifique ( CNRS ), and St Petersburg State University ( SPbU )
Subjects: [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], [ PHYS.PHYS.PHYS-OPTICS ] Physics [physics]/Physics [physics]/Optics [physics.optics], Chemistry, business.industry, Analytical chemistry, Synchrotron radiation, Bragg's law, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, BORO, 010309 optics, Crystal, Optics, Sputtering, [PHYS.COND.CM-GEN]Physics [physics]/Condensed Matter [cond-mat]/Other [cond-mat.other], 0103 physical sciences, 0210 nano-technology, Reflectometry, business, Boron, Spectroscopy, Diode
Abstract: This work was partly carried out at BESSY II in the framework of the project BESSY Number HPP33/150902 and supported by the European Commission under the ‘Human Potential Programme, Transnational Access to Major Research Infrastructures’, Contract No HPRI-1999-00028.; International audience; A La/B4C multilayer interferential mirror with small period d (4.8 nm) was produced by diode sputtering for the detection of the boron K emission by wavelength-dispersive x-ray spectrometry at a large Bragg angle (close to 45°). The structure of the mirror has been characterized by grazing incidence x-ray reflectometry, and its performance at the energy of the boron K emission (183 eV) was evaluated by means of polarized synchrotron radiation. A spectrometric measurement shows that the La/B4C mirror has improved the detection limit of boron using by a factor of 2 with respect to similar Mo/B4C mirrors, and by a factor of 4 with respect to a lead stearate crystal.
Published: 2005
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13. Multilayer Mirrors for Coherent Extreme-Ultraviolet and Soft X-ray Sources

Author: Charles Bourassin-Bouchet, Franck Delmotte, Sébastien de Rossi, Laboratoire Charles Fabry / Optique XUV, Laboratoire Charles Fabry (LCF), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS), and F. Canova, L. Poletto
Subjects: [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Soft x ray, Materials science, business.industry, Attosecond, Free-electron laser, Physics::Optics, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Characterization (materials science), 010309 optics, Optics, Extreme ultraviolet, 0103 physical sciences, Group delay dispersion, Femtosecond, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], Physics::Atomic and Molecular Clusters, 0210 nano-technology, Focus (optics), business, ComputingMilieux_MISCELLANEOUS
Abstract: After a brief description of the theoretical principles of multilayer mirrors, we present the state of the art of experimental results obtained in the XUV range. We then focus on the specificities of multilayer mirrors for pico- and femtosecond sources, in terms of reflectivity, selectivity and stability. Finally, we report the recent advances in the development of multilayer mirrors for attosecond sources, from the design of the mirror to the characterization of such a component.
Published: 2015
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14. Study of Cr/Sc-based multilayer reflecting mirrors using soft x-ray reflectivity and standing wave-enhanced x-ray fluorescence

Author: Françoise Bridou, Meiyi Wu, Catherine Burcklen, Philippe Jonnard, Franck Delmotte, Stefano Nannarone, Jean-Michel André, Karine Le Guen, Sébastien de Rossi, Angelo Giglia, Konstantin Koshmak, Evgueni Meltchakov, Laboratoire de Chimie Physique - Matière et Rayonnement (LCPMR), Université Pierre et Marie Curie - Paris 6 (UPMC)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire Charles Fabry / Optique XUV, Laboratoire Charles Fabry (LCF), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS), CNR Istituto Officina dei Materiali (IOM), Consiglio Nazionale delle Ricerche [Roma] (CNR), Laboratoire de Chimie Physique - Matière et Rayonnement ( LCPMR ), Université Pierre et Marie Curie - Paris 6 ( UPMC ) -Centre National de la Recherche Scientifique ( CNRS ), Laboratoire Charles Fabry / XUV, Laboratoire Charles Fabry ( LCF ), Institut d'Optique Graduate School ( IOGS ) -Centre National de la Recherche Scientifique ( CNRS ) -Université Paris-Sud - Paris 11 ( UP11 ) -Institut d'Optique Graduate School ( IOGS ) -Centre National de la Recherche Scientifique ( CNRS ) -Université Paris-Sud - Paris 11 ( UP11 ), CNR - Istituto Officina dei Materiali ( IOM ), Consiglio Nazionale delle Ricerche [Roma] ( CNR ), Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS), and National Research Council of Italy | Consiglio Nazionale delle Ricerche (CNR)
Subjects: Materials science, multilayers, [ PHYS.COND.CM-MS ] Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], X-ray fluorescence, 02 engineering and technology, 01 natural sciences, 010309 optics, Standing wave, Optics, Stack (abstract data type), x-ray standing waves, Cr/Sc, 0103 physical sciences, Deposition (law), [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Water window, [ PHYS.PHYS.PHYS-OPTICS ] Physics [physics]/Physics [physics]/Optics [physics.optics], x-ray fluorescence, business.industry, General Engineering, Bragg diffraction, Sputter deposition, soft x-ray reflectivity, 021001 nanoscience & nanotechnology, Atomic and Molecular Physics, and Optics, Characterization (materials science), [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], 0210 nano-technology, business, Luminescence
Abstract: International audience; We study Cr/Sc-based multilayer mirrors designed to work in the water window range using hard and soft x-ray reflectivity as well as x-ray fluorescence enhanced by standing waves. Samples differ by the elemental composition of the stack, the thickness of each layer, and the order of deposition. This paper mainly consists of two parts. In the first part, the optical performances of different Cr/Sc-based multilayers are reported, and in the second part, we extend further the characterization of the structural parameters of the multilayers, which can be extracted by comparing the experimental data with simulations. The methodology is detailed in the case of Cr/B4C/Sc sample for which a three-layer model is used. Structural parameters determined by fitting reflectivity curve are then introduced as fixed parameters to plot the x-ray standing wave curve, to compare with the experiment, and confirm the determined structure of the stack.
Published: 2017
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15. High-efficiency B_4C/Mo_2C alternate multilayer grating for monochromators in the photon energy range from 07 to 34 keV

Author: Bruno Lagarde, Michael Krumrey, Fadi Choueikani, Muriel Thomasset, Françoise Bridou, Evgueni Meltchakov, Franck Delmotte, François Polack, Laboratoire Charles Fabry / Optique XUV, Laboratoire Charles Fabry (LCF), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS), Synchrotron SOLEIL (SSOLEIL), Centre National de la Recherche Scientifique (CNRS), and Physikalisch-Technische Bundesanstalt [Berlin] (PTB)
Subjects: [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Materials science, business.industry, Bragg's law, Synchrotron radiation, 02 engineering and technology, Grating, Photon energy, 021001 nanoscience & nanotechnology, Diffraction efficiency, 01 natural sciences, Atomic and Molecular Physics, and Optics, law.invention, 010309 optics, Optics, Beamline, law, 0103 physical sciences, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det], 0210 nano-technology, business, Diffraction grating, ComputingMilieux_MISCELLANEOUS, Monochromator
Abstract: An alternate multilayer (AML) grating has been prepared by coating an ion etched lamellar grating with a B4C/Mo2C multilayer (ML) having a layer thickness close to the groove depth. Such a structure behaves as a 2D synthetic crystal and can reach very high efficiencies when the Bragg condition is satisfied. This AML coated grating has been characterized at the SOLEIL Metrology and Tests Beamline between 0.7 and 1.7 keV and at the four-crystal monochromator beamline of Physikalisch-Technische Bundesanstalt (PTB) at BESSY II between 1.75 and 3.4 keV. A peak diffraction efficiency of nearly 27% was measured at 2.2 keV. The measured efficiencies are well reproduced by numerical simulations made with the electromagnetic propagation code CARPEM. Such AML gratings, paired with a matched ML mirror, constitute efficient monochromators for intermediate energy photons. They will extend the accessible energy for many applications as x-ray absorption spectroscopy or x-ray magnetic circular dichroism experiments.
Published: 2014
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16. Theoretical and experimental studies of broadband phase-controlled attosecond mirrors

Author: Elisabeth English, Thierry Ruchon, Franck Delmotte, Charles Bourassin-Bouchet, Diego Guenot, O. Gobert, Pascal Salières, Z. Diveki, Evgueni Meltchakov, Bertrand Carré, S. de Rossi, Service des Photons, Atomes et Molécules (SPAM), Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Laboratoire Charles Fabry / Optique XUV, Laboratoire Charles Fabry (LCF), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS), and Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Physics, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], business.industry, Attosecond, Phase (waves), Physics::Optics, 01 natural sciences, Atomic and Molecular Physics, and Optics, 010309 optics, Optics, Pulse compression, 0103 physical sciences, Dispersion (optics), Phase response, Simulated annealing, Physics::Atomic and Molecular Clusters, High harmonic generation, Optoelectronics, Physics::Atomic Physics, 010306 general physics, business, Beam (structure)
Abstract: International audience; We present procedures to develop and characterise chirped multilayer mirrors for attosecond pulses. The design procedure involves a simulated annealing optimisation algorithm to obtain a multilayer structure with the desired performances. The characterisation step requires the use of well-calibrated attosecond and synchrotron beam lines, allowing one to measure the amplitude and phase response of the mirror. We illustrate these approaches with a set of mirrors designed to have zero or negative dispersion. The remarkable agreement between theoretical and experimental performances validates this overall process, and demonstrates the capability of such mirrors to control the temporal profile of attosecond pulses. These tools and techniques for developing attosecond chirped mirrors will facilitate the generalisation of such components on attosecond experiments.
Published: 2014

17. Development of multilayer coatings for solar orbiter EUV imaging telescopes (Orale)

Author: Udo Strauch, Raymond Mercier, C. Dumesnil, Marc Roulliay, Arnaud Jérôme, Bruno Borgo, François Varnière, Françoise Bridou, Sébastien de Rossi, Evgueni Meltchakov, Frédéric Auchère, Xueyan Zhang, Franck Delmotte, Serge François, Laboratoire Charles Fabry / Optique XUV, Laboratoire Charles Fabry (LCF), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS), Institut d'astrophysique spatiale (IAS), Centre National de la Recherche Scientifique (CNRS)-Institut national des sciences de l'Univers (INSU - CNRS)-Université Paris-Sud - Paris 11 (UP11), Institut des Sciences Moléculaires d'Orsay (ISMO), Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11), Helmholtz-Zentrum Dresden-Rossendorf (HZDR), Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS), Université Paris-Sud - Paris 11 (UP11)-Institut national des sciences de l'Univers (INSU - CNRS)-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Materials science, [PHYS.ASTR.IM]Physics [physics]/Astrophysics [astro-ph]/Instrumentation and Methods for Astrophysic [astro-ph.IM], Extreme ultraviolet lithography, 02 engineering and technology, engineering.material, 7. Clean energy, 01 natural sciences, law.invention, 010309 optics, Orbiter, chemistry.chemical_compound, Optics, Coating, law, 0103 physical sciences, Silicon carbide, [PHYS]Physics [physics], [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], business.industry, Sputter deposition, 021001 nanoscience & nanotechnology, [PHYS.ASTR.SR]Physics [physics]/Astrophysics [astro-ph]/Solar and Stellar Astrophysics [astro-ph.SR], Wavelength, Optical coating, chemistry, Extreme ultraviolet, engineering, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], 0210 nano-technology, business, [PHYS.ASTR]Physics [physics]/Astrophysics [astro-ph]
Abstract: International audience; Since more than 20 years, Laboratoire Charles Fabry and Institut d’Astrophysique Spatiale are involved in development of the EUV multilayer coating for solar imaging. Previous instruments, such as the SOHO EIT and STEREO EUVI telescopes, employed the Mo/Si multilayer coatings, which offered at that time the best efficiency and stability. We present here recent results of the development of highly efficient EUV multilayers coatings at 17.4 nm and 30.4 nm for the Solar Orbiter mission. New multilayer structures, based on a combination of three materials including aluminum, have been optimized both theoretically and experimentally. We have succeeded to reduce interfacial roughness of Albased multilayers down to 0.5 nm via optimization of the multilayer design and the deposition process. The EUV peak reflectance of Al/Mo/SiC and Al/Mo/B4C multilayer coatings reaches 56% at 17.4 nm, the highest value reported up to now for this wavelength. We have also optimized specific bi-periodic structures that possess two reflection bands in the EUV range with high spectral selectivity. The EUV reflectivity of these Al-based dual-band coatings are compared with the Si/Mo/B4C baseline coating for Solar Orbiter. Since the stability of reflecting multilayer coating is an important issue for space missions, we have also studied the temporal stability as well as the resistivity of the coatings to thermal cycling and to proton irradiation. Experimental results confirm that Al/Mo/SiC and Al/Mo/B4C multilayer coatings are good candidates for the Solar Orbiter EUV imaging telescopes.
Published: 2013
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18. Preparation for B4C/Mo2C multilayer deposition of alternate multilayer gratings with high efficiency in the 0.5-2.5 keV energy range

Author: Fadi Choueikani, Françoise Bridou, Franck Delmotte, Pascal Mercère, Philippe Ohresser, Edwige Otero, Bruno Lagarde, François Polack, Laboratoire Charles Fabry / Optique XUV, Laboratoire Charles Fabry (LCF), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS), Synchrotron SOLEIL (SSOLEIL), Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Diffraction, History, Range (particle radiation), [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Materials science, Silicon, business.industry, chemistry.chemical_element, Substrate (electronics), Grating, 01 natural sciences, 010305 fluids & plasmas, Computer Science Applications, Education, 010309 optics, Optics, chemistry, Beamline, 0103 physical sciences, [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat], Reflectometry, business, Deposition (law)
Abstract: International audience; This paper presents a study of B4C/Mo2C multilayers mirrors with the aim of using it in the achievement of Alternate MultiLayer (AML) grating. Such component allows a high efficiency in the 500-2500 eV energy range for the DEIMOS beamline. Multilayers were deposited on silicon substrate. They are characterized by reflectometry under grazing incidence. Numerical adjustments were performed with a model of two layers in the period without any interfacial. A prototype of AML grating was fabricated and characterized. The efficiency of the first order of diffraction was worth 15% at 1700 eV.
Published: 2013
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19. How to focus an attosecond pulse

Author: M. M. Mang, Franck Delmotte, S. de Rossi, Pierre Chavel, Charles Bourassin-Bouchet, Clarendon Laboratory [Oxford], University of Oxford [Oxford], Laboratoire Charles Fabry / Optique XUV, Laboratoire Charles Fabry (LCF), and Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)
Subjects: Light, Attosecond, Physics::Optics, Radiation, 01 natural sciences, 010309 optics, Optics, Physics::Plasma Physics, 0103 physical sciences, Physics::Atomic and Molecular Clusters, High harmonic generation, Scattering, Radiation, Computer Simulation, Physics::Atomic Physics, 010306 general physics, Attosecond pulse, Lenses, Physics, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Geometrical optics, business.industry, Pulse duration, Equipment Design, Attophysics, Models, Theoretical, Atomic and Molecular Physics, and Optics, Equipment Failure Analysis, business, Focus (optics)
Abstract: International audience; Attosecond experiments involving focusing of attosecond light pulses can suffer from a spread of the attosecond radiation both in space and time due to optical aberrations. We present a detailed numerical study of the distortions induced in the most common focusing geometries that make use of parabolic, spherical, toroidal and ellipsoidal mirrors. We deduce the consequences on the pulse duration and possible issues that could arise in applications of attosecond pulses. This should serve as a guideline for setting up attosecond focusing optics.
Published: 2013
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20. X-ray properties and interface study of B4C/Mo and B4C/Mo2C periodic multilayers

Author: P. Mercere, Fadi Choueikani, B. Lagarde, Françoise Bridou, François Polack, Franck Delmotte, Evgueni Meltchakov, Laboratoire Charles Fabry / Optique XUV, Laboratoire Charles Fabry (LCF), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS), Synchrotron SOLEIL (SSOLEIL), and Centre National de la Recherche Scientifique (CNRS)
Subjects: [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Materials science, Symmetric structure, Condensed matter physics, Period (periodic table), X-ray, 02 engineering and technology, General Chemistry, Sputter deposition, 021001 nanoscience & nanotechnology, 01 natural sciences, Characterization (materials science), 010309 optics, Crystallography, 0103 physical sciences, General Materials Science, 0210 nano-technology, Reflectometry, High-resolution transmission electron microscopy, Layer (electronics)
Abstract: International audience; We present a comparative study of B4C/Mo and B4C/Mo2C periodic multilayer structures deposited by magnetron sputtering. The characterization was performed by grazing incidence X-ray reflectometry at two different energies and high resolution transmission electron microscopy. The experimental results indicate the existence of an interdiffusion layer at the B4C-on-Mo interface in the B4C/Mo system. Thus, the B4C/Mo multilayers were modeled by an asymmetric structure with three layers in each period. The thickness of B4C-on-Mo interfacial layer was estimated about 1.1 nm. The B4C/Mo2C multilayers present less interdiffusion and are well modeled by a symmetric structure without interfacial layers. This study shows that B4C/Mo2C structure is an interesting alternative to B4C/Mo multilayer for X-ray optic applications.
Published: 2013
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21. Design and fabrication of X-ray non-periodic multilayer mirrors: Apodization and shaping of their spectral response

Author: Franck Delmotte, B. Villette, Ph. Troussel, F. Bridou, Laboratoire Charles Fabry / Scop, Laboratoire Charles Fabry (LCF), Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS), DAM Île-de-France (DAM/DIF), Direction des Applications Militaires (DAM), and Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)
Subjects: 010302 applied physics, Physics, Nuclear and High Energy Physics, Total internal reflection, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Fabrication, Photon, business.industry, Synchrotron radiation, Sputter deposition, 01 natural sciences, 010309 optics, Optics, Band-pass filter, Apodization, 0103 physical sciences, Plasma diagnostics, business, Instrumentation
Abstract: International audience; We have developed non-periodic Cr/Sc multilayer mirrors specifically designed to reflect energy photons between 2 and 4 keV with a pre-defined reflectivity profile. Furthermore, these mirrors have to work as filters in the 1-2 keV and 4-12 keV energy bandpass with a reflectivity as low as possible in these bandwidths. The mirrors were designed and optimized with the help of a commercial calculation code. Numerous combinations of layers have been investigated with two or three different materials in the multilayer. The interfacial effect, leading to thickness modifications, has been investigated. Layer thicknesses were accurately controlled, taking into account compaction effect at interfaces. The best results lead to non-periodic mirrors dedicated to work at 1.5° grazing incidence with a reflectivity above 15% in almost the entire energy range 2-4 keV and lower than 1% outside, except in the total reflection zone. The final choice of material was made from the experimental knowledge of corresponding layer deposited behavior. The multilayers have been deposited by magnetron sputtering. Grazing-incidence X-ray reflectance at 8.05 keV (0.154 nm) and at the Physikalisch-Technische Bundesanstalt laboratory (PTB) at the synchrotron radiation facility BESSY II in Berlin for X-ray reflectance over the whole range were used both in order to characterize the multilayers (thicknesses, complex indices, and roughnesses). The final results show good agreement with the requested reflectivity profile.
Published: 2012
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22. Shaping of single-cycle sub-50-attosecond pulses with multilayer mirrors

Author: Charles Bourassin-Bouchet, Evgueni Meltchakov, Angelo Giglia, J Wang, Nicola Mahne, Stefano Nannarone, Franck Delmotte, S. de Rossi, Laboratoire Charles Fabry / Scop, Laboratoire Charles Fabry (LCF), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS), Laboratorio Nazionale TASC (TASC), and Consiglio Nazionale delle Ricerche (CNR)
Subjects: Femtosecond pulse shaping, Physics, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], business.industry, Attosecond, General Physics and Astronomy, 01 natural sciences, Synchrotron, law.invention, 010309 optics, Amplitude, Optics, Pulse compression, law, 0103 physical sciences, Optoelectronics, Time domain, 010306 general physics, business, Bandwidth-limited pulse, Electronic circuit
Abstract: International audience; We report on the study of multilayer mirrors designed to compress extreme-ultraviolet pulses below 50 as. The mirrors were optimized in the time- domain to get the wanted pulse shape and duration when combined with a broadband hybrid filter. Moreover they appeared to be very robust to environmental parameters, ensuring a pulse compression in various conditions. We manufactured the mirrors and characterized them on a synchrotron facility both in amplitude and phase. The measurement of the latter was performed using the photocurrent technique, which is the only method allowing one to access to the mirrors absolute spectral phase. This led to a measurement of the offset induced by one of the mirrors on the carrier-envelope phase of attosecond pulses.
Published: 2012
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23. Corrélations vectorielles dans la photoionisation dissociative de H2 par une harmonique XUV femtoseconde sélectionnée spectralement par des miroirs multicouches

Author: Thierry Ruchon, Marc Roulliay, F. Lepetit, J.-F. Hergott, A Huetz, K. Veyrinas, Y. J. Picard, Pierre Breger, M. Billon, Bertrand Carré, Franck Delmotte, D. Dowek, P. Billaud, S. Marggi Poullain, Marie Géléoc, Institut des Sciences Moléculaires d'Orsay (ISMO), Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11), Service des Photons, Atomes et Molécules (SPAM), Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Laboratoire Charles Fabry / Scop, Laboratoire Charles Fabry (LCF), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS), Laboratoire Charles Fabry / Optique XUV, Laboratoire Francis PERRIN (LFP - URA 2453), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)
Subjects: [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], 0103 physical sciences, 010306 general physics, 01 natural sciences, 010305 fluids & plasmas
Abstract: National audience; Nous avons démontré la faisabilité de mesures de corrélations vectorielles dans la photoionisation dissociative de H2 auprès d'une source XUV femtoseconde d'harmonique d'ordre élevé cadencée à 1 kHz [1]. Dans ce contexte, nous présentons les miroirs multicouches conçus, réalisés et caractérisés par la Centrale d'Elaboration et de Métrologie d'Optiques X pour sélectionner cette harmonique 21 à ∼32 eV (∼40 nm). Nous avons mesuré une série d'observables, de la distribution en coïncidence des énergies cinétiques de l'ion fragment et de l'électron aux distributions angulaires du photoélectron émis dans le référentiel moléculaire (MFPADs), ainsi que leur évolution avec l'énergie cinétique de l'ion fragment. Ces résultats ouvrent la voie à des études résolues en temps, basées sur la mesure des MFPADs, de la dynamique femtoseconde des états doublements excités Q1 et Q2 de H2.
Published: 2012
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24. Molecular frame photoemission in dissociative ionization of H-2 and D-2 induced by high harmonic generation femtosecond XUV pulses

Author: Y. J. Picard, Danielle Dowek, Jean-François Hergott, Thierry Ruchon, F. Lepetit, Pierre Billaud, Marc Roulliay, Pierre Breger, S. Marggi Poullain, Marie Géléoc, K. Veyrinas, A Huetz, Franck Delmotte, Bertrand Carré, Institut des Sciences Moléculaires d'Orsay (ISMO), Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11), Service des Photons, Atomes et Molécules (SPAM), Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Laboratoire Charles Fabry / Scop, Laboratoire Charles Fabry (LCF), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS), Laboratoire Francis PERRIN (LFP - URA 2453), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Université Paris-Sud - Paris 11 (UP11), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS), Laboratoire Charles Fabry / Optique XUV, and Institut d'Optique Graduate School (IOGS)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)
Subjects: [PHYS]Physics [physics], Physics, Photon, 02 engineering and technology, Photoionization, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 7. Clean energy, 01 natural sciences, Atomic and Molecular Physics, and Optics, Autoionization, Ionization, Excited state, Extreme ultraviolet, 0103 physical sciences, Femtosecond, Physics::Atomic and Molecular Clusters, High harmonic generation, Physics::Atomic Physics, Atomic physics, 010306 general physics, 0210 nano-technology
Abstract: International audience; We report the first results of molecular frame photoelectron emission for dissociative photoionization (DPI) of H2 and D2 molecules induced by a spectrally filtered single high harmonic of a few femtosecond duration, using coincident electron-ion velocity vector correlation techniques. For the studied photon energies around 32 eV, where the resonant excitation of the Q1 and Q2 doubly excited states occurs, autoionization and nuclear dynamics are coupled on a few femtosecond timescale, giving rise to quantum interferences. Molecular frame photoelectron angular distributions (MFPADs), traced as a function of the kinetic energy release of the atomic fragments, provide the most sensitive observables for such complex dynamics. These results compare well with recent spectrally resolved experiments using synchrotron radiation which are also reported. As a novel XUV light source running at multi-kHz repetition rate and synchronized with laser pulses, high-order harmonic generation (HHG) opens new possibilities for extending these investigations to time-resolved studies at the femtosecond scale.
Published: 2012
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25. Characterization of EUV periodic multilayers

Author: Evgueni Meltchakov, Jean-Michel André, Philippe Jonnard, Franck Delmotte, K. Le Guen, Anouk Galtayries, Zhanshan Wang, M.-H. Hu, Christophe Hecquet, Jingtao Zhu, Christian Meny, Laboratoire de Chimie Physique - Matière et Rayonnement (LCPMR), Université Pierre et Marie Curie - Paris 6 (UPMC)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Institute of Precision Optical Engineering [Shangai] (IPOE), Tongji University, Laboratoire de Physico-Chimie des Surfaces (LPCS), Ecole Nationale Supérieure de Chimie de Paris - Chimie ParisTech-PSL (ENSCP), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Institut de Physique et Chimie des Matériaux de Strasbourg (IPCMS), Université de Strasbourg (UNISTRA)-Centre National de la Recherche Scientifique (CNRS)-Matériaux et nanosciences d'Alsace (FMNGE), Institut de Chimie du CNRS (INC)-Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Institut National de la Santé et de la Recherche Médicale (INSERM)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Institut National de la Santé et de la Recherche Médicale (INSERM)-Centre National de la Recherche Scientifique (CNRS)-Réseau nanophotonique et optique, Centre National de la Recherche Scientifique (CNRS)-Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Centre National de la Recherche Scientifique (CNRS)-Université de Strasbourg (UNISTRA), Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11), Université de Strasbourg (UNISTRA)-Centre National de la Recherche Scientifique (CNRS)-Matériaux et Nanosciences Grand-Est (MNGE), Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Institut National de la Santé et de la Recherche Médicale (INSERM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Institut National de la Santé et de la Recherche Médicale (INSERM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Réseau nanophotonique et optique, Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Centre National de la Recherche Scientifique (CNRS)-Université de Strasbourg (UNISTRA)-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)
Subjects: 010302 applied physics, extreme UV, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Materials science, multilayers, Analytical chemistry, 02 engineering and technology, [CHIM.MATE]Chemical Sciences/Material chemistry, Sputter deposition, 021001 nanoscience & nanotechnology, 01 natural sciences, Spectral line, Ion, NMR spectra database, Chemical state, x-ray, Extreme ultraviolet, [PHYS.COND.CM-GEN]Physics [physics]/Condensed Matter [cond-mat]/Other [cond-mat.other], 0103 physical sciences, interdiffusion, Emission spectrum, 0210 nano-technology, Spectroscopy, roughness
Abstract: 13 pages; International audience; Nanometric Co/Mg, Co/Mg/B4C, Al/SiC and Al/Mo/SiC periodic multilayers deposited by magnetron sputtering are studied in order to correlate their optical performances in the extreme ultraviolet (EUV) range to their structural quality. To that purpose, our recently developed methodology based on high resolution x-ray emission spectroscopy (XES) and x-ray and EUV reflectometry is now extended to nuclear magnetic resonance (NMR) spectroscopy and time-of-flight secondary ions mass spectrometry (ToF-SIMS). The analysis of the Co Lalpha,beta and Mg Kbeta emission spectra shows that the Co and Mg atoms within the multilayers are in a chemical state equivalent to that of the atoms in the pure Co and Mg references respectively. But NMR spectra give evidence for a reaction between Co atoms and B and/or C atoms from B4C. The Al and Si Kbeta emission spectra do not reveal the formation of an interfacial compound in Al/SiC and Al/Mo/SiC. Only the roughness limits the optical quality of Al/SiC. The comparative analysis of the ToF-SIMS spectra of Al/SiC and Al/Mo/SiC indicates that the structural quality is enhanced when Mo is introduced within the stack.
Published: 2011
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26. Table-top resonant magnetic scattering with extreme ultraviolet light from high-order harmonic generation

Author: Christine Boeglin, Stéphane Sebban, Jan Lüning, Jacek Arabski, Eric Beaurepaire, Evgueni Meltchakov, M. Lozano, Franck Delmotte, Boris Vodungbo, Julien Gautier, Renaud Delaunay, A. Barszczak Sardinha, Guillaume Lambert, Philippe Zeitoun, Victor Lopez-Flores, Laboratoire d'optique appliquée (LOA), École Nationale Supérieure de Techniques Avancées (ENSTA Paris)-École polytechnique (X)-Centre National de la Recherche Scientifique (CNRS), Centre de Recherche des Cordeliers (CRC), Université Paris Diderot - Paris 7 (UPD7)-École pratique des hautes études (EPHE), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Université Paris Descartes - Paris 5 (UPD5)-Institut National de la Santé et de la Recherche Médicale (INSERM), Laboratoire de Sociologie et d'Anthropologie - UFC (EA 3189) (LASA), Université de Franche-Comté (UFC), Université Bourgogne Franche-Comté [COMUE] (UBFC)-Université Bourgogne Franche-Comté [COMUE] (UBFC), Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS), Institut de Physique et Chimie des Matériaux de Strasbourg (IPCMS), Université de Strasbourg (UNISTRA)-Centre National de la Recherche Scientifique (CNRS)-Matériaux et nanosciences d'Alsace, Centre National de la Recherche Scientifique (CNRS)-Institut National de la Santé et de la Recherche Médicale (INSERM)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Université de Strasbourg (UNISTRA)-Centre National de la Recherche Scientifique (CNRS)-Institut National de la Santé et de la Recherche Médicale (INSERM)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Université de Strasbourg (UNISTRA)-Réseau nanophotonique et optique, Centre National de la Recherche Scientifique (CNRS)-Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Université de Strasbourg (UNISTRA), Laboratoire d'optique et biosciences (LOB), École polytechnique (X)-Institut National de la Santé et de la Recherche Médicale (INSERM)-Centre National de la Recherche Scientifique (CNRS), Laboratoire de Chimie Physique - Matière et Rayonnement (LCPMR), Université Pierre et Marie Curie - Paris 6 (UPMC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire d'optique appliquée ( LOA ), École Nationale Supérieure de Techniques Avancées ( Univ. Paris-Saclay, ENSTA ParisTech ) -École polytechnique ( X ) -Centre National de la Recherche Scientifique ( CNRS ), Centre de Recherche des Cordeliers ( CRC ), Université Paris Diderot - Paris 7 ( UPD7 ) -École pratique des hautes études ( EPHE ) -Université Pierre et Marie Curie - Paris 6 ( UPMC ) -Université Paris Descartes - Paris 5 ( UPD5 ) -Institut National de la Santé et de la Recherche Médicale ( INSERM ), Laboratoire de Sociologie et d'Anthropologie - UFC (EA 3189) ( LASA ), Université Bourgogne Franche-Comté [COMUE] ( UBFC ) -Université de Franche-Comté ( UFC ), Laboratoire Charles Fabry de l'Institut d'Optique ( LCFIO ), Université Paris-Sud - Paris 11 ( UP11 ) -Institut d'Optique Graduate School ( IOGS ) -Centre National de la Recherche Scientifique ( CNRS ) -Université Paris-Sud - Paris 11 ( UP11 ) -Institut d'Optique Graduate School ( IOGS ) -Centre National de la Recherche Scientifique ( CNRS ), Institut de Physique et Chimie des Matériaux de Strasbourg ( IPCMS ), Université de Strasbourg ( UNISTRA ) -Centre National de la Recherche Scientifique ( CNRS ) -Matériaux et nanosciences d'Alsace, Université de Strasbourg ( UNISTRA ) -Université de Haute-Alsace (UHA) Mulhouse - Colmar ( Université de Haute-Alsace (UHA) ) -Institut National de la Santé et de la Recherche Médicale ( INSERM ) -Centre National de la Recherche Scientifique ( CNRS ) -Université de Strasbourg ( UNISTRA ) -Université de Haute-Alsace (UHA) Mulhouse - Colmar ( Université de Haute-Alsace (UHA) ) -Institut National de la Santé et de la Recherche Médicale ( INSERM ) -Centre National de la Recherche Scientifique ( CNRS ) -Réseau nanophotonique et optique, Université de Strasbourg ( UNISTRA ) -Université de Haute-Alsace (UHA) Mulhouse - Colmar ( Université de Haute-Alsace (UHA) ) -Centre National de la Recherche Scientifique ( CNRS ) -Université de Strasbourg ( UNISTRA ), Laboratoire d'optique et biosciences ( LOB ), École polytechnique ( X ) -Institut National de la Santé et de la Recherche Médicale ( INSERM ) -Centre National de la Recherche Scientifique ( CNRS ), Laboratoire de Chimie Physique - Matière et Rayonnement ( LCPMR ), Centre National de la Recherche Scientifique ( CNRS ) -Université Pierre et Marie Curie - Paris 6 ( UPMC ), Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11), Université Louis Pasteur - Strasbourg I-Centre National de la Recherche Scientifique (CNRS), Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Université Pierre et Marie Curie - Paris 6 (UPMC), Centre National de la Recherche Scientifique (CNRS)-École polytechnique (X)-École Nationale Supérieure de Techniques Avancées (ENSTA Paris), Université Paris Diderot - Paris 7 (UPD7)-École pratique des hautes études (EPHE)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Université Paris Descartes - Paris 5 (UPD5)-Institut National de la Santé et de la Recherche Médicale (INSERM), Université Bourgogne Franche-Comté [COMUE] (UBFC)-Université de Franche-Comté (UFC), Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Institut National de la Santé et de la Recherche Médicale (INSERM)-Centre National de la Recherche Scientifique (CNRS)-Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Institut National de la Santé et de la Recherche Médicale (INSERM)-Centre National de la Recherche Scientifique (CNRS)-Réseau nanophotonique et optique, Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Centre National de la Recherche Scientifique (CNRS)-Université de Strasbourg (UNISTRA), Institut National de la Santé et de la Recherche Médicale ( INSERM ) -Université Paris Descartes - Paris 5 ( UPD5 ) -Université Pierre et Marie Curie - Paris 6 ( UPMC ) -École pratique des hautes études ( EPHE ) -Université Paris Diderot - Paris 7 ( UPD7 ), Laboratoire de Sociologie et d'Anthropologie - UFC ( LASA ), Université Bourgogne Franche-Comté ( UBFC ) -Université de Franche-Comté ( UFC ), Université Pierre et Marie Curie - Paris 6 ( UPMC ) -Centre National de la Recherche Scientifique ( CNRS ), Grupo de Lasers e Plasmas, Instituto Superior Tcnico, Université de Strasbourg (UNISTRA)-Centre National de la Recherche Scientifique (CNRS)-Matériaux et Nanosciences Grand-Est (MNGE), Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Institut National de la Santé et de la Recherche Médicale (INSERM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Institut National de la Santé et de la Recherche Médicale (INSERM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Réseau nanophotonique et optique, Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Centre National de la Recherche Scientifique (CNRS)-Université de Strasbourg (UNISTRA)-Centre National de la Recherche Scientifique (CNRS), and Université Pierre et Marie Curie - Paris 6 (UPMC)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Magnetic domain, [PHYS.PHYS.PHYS-ACC-PH]Physics [physics]/Physics [physics]/Accelerator Physics [physics.acc-ph], Aucun, General Physics and Astronomy, 02 engineering and technology, 01 natural sciences, law.invention, Optics, law, [PHYS.PHYS.PHYS-PLASM-PH]Physics [physics]/Physics [physics]/Plasma Physics [physics.plasm-ph], 0103 physical sciences, High harmonic generation, [ PHYS.PHYS.PHYS-ACC-PH ] Physics [physics]/Physics [physics]/Accelerator Physics [physics.acc-ph], 010306 general physics, Physics, [PHYS]Physics [physics], Magnetization dynamics, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], [ PHYS ] Physics [physics], [ PHYS.PHYS.PHYS-OPTICS ] Physics [physics]/Physics [physics]/Optics [physics.optics], business.industry, Scattering, [ PHYS.PHYS.PHYS-PLASM-PH ] Physics [physics]/Physics [physics]/Plasma Physics [physics.plasm-ph], 021001 nanoscience & nanotechnology, Laser, [PHYS.COND.CM-GEN]Physics [physics]/Condensed Matter [cond-mat]/Other [cond-mat.other], Extreme ultraviolet, Femtosecond, Optoelectronics, 0210 nano-technology, business, Ultrashort pulse
Abstract: We demonstrate for the first time the applicability of high-order harmonic generation for probing magnetization properties with nanometer spatial resolution. High harmonics were generated by focusing an infrared femtosecond laser into a neon-filled gas cell. Using a high throughput monochromator, EUV pulses with a photon energy resonant to the magnetically dichroic Co M(2,3) absorption resonance were obtained. These were focused onto a CoPd alloy film and the magnetic scattering pattern was recorded in a transmission geometry. The scattering pattern induced by the magnetic domain structure consists of two well-defined bright spots revealing the presence of stripe domains of about 63nm in width. With the inherent femtosecond time resolution given by high harmonics, this demonstration paves the way to investigate ultrafast magnetization dynamics with femtosecond time and nanometer spatial resolutions, in jitter-free experiment based on table-top EUV light sources. Copyright (C) EPLA, 2011
Published: 2011
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27. Control of the attosecond synchronization of XUV radiation with phase-optimized mirrors

Author: Bertrand Carré, Pascal Salières, Diego Guenot, Thierry Ruchon, S. de Rossi, O. Gobert, Evgueni Meltchakov, Franck Delmotte, Elisabeth English, Charles Bourassin-Bouchet, Z. Diveki, Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS), Service des Photons, Atomes et Molécules (SPAM), and Commissariat à l'énergie atomique et aux énergies alternatives (CEA)
Subjects: Physics, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], business.industry, Attosecond, Bandwidth (signal processing), Synchrotron radiation, Radiation, 01 natural sciences, Pulse shaping, Atomic and Molecular Physics, and Optics, 010309 optics, Optics, Amplitude, Extreme ultraviolet, 0103 physical sciences, Chirp, Optoelectronics, 010306 general physics, business
Abstract: International audience; We report on the advanced amplitude and phase control of attosecond radiation allowed by specifically-designed multilayer XUV mirrors. We first demonstrate that such mirrors can compensate for the intrinsic chirp of the attosecond emission over a large bandwidth of more than 20 eV. We then show that their combination with metallic foils introduces a third-order dispersion that is adjustable through the mirror's incidence angle. This results in a controllable beating allowing the radiation to be shaped from a single to a series of sub-100 as pulses.
Published: 2011

28. Polarization control of high order harmonics in the EUV photon energy range

Author: Anna Barszczak Sardinha, Jan Lüning, Franck Delmotte, Guillaume Lambert, Magali Lozano, Boris Vodungbo, Julien Gautier, Philippe Zeitoun, Constance Valentin, Grégory Iaquaniello, Stéphane Sebban, Laboratoire d'optique appliquée (LOA), École Nationale Supérieure de Techniques Avancées (ENSTA Paris)-École polytechnique (X)-Centre National de la Recherche Scientifique (CNRS), Grupo de Lasers e Plasmas, Instituto Superior Tcnico, Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11), Laboratoire de Chimie Physique - Matière et Rayonnement (LCPMR), Université Pierre et Marie Curie - Paris 6 (UPMC)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Ultraviolet Rays, Elliptical polarization, 01 natural sciences, 7. Clean energy, law.invention, 010309 optics, Optics, law, 0103 physical sciences, 010306 general physics, Circular polarization, Lenses, Physics, Photons, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], business.industry, Linear polarization, Magnetic circular dichroism, Lasers, Equipment Design, Laser, Polarization (waves), Atomic and Molecular Physics, and Optics, Equipment Failure Analysis, Refractometry, Harmonics, Optoelectronics, business, Ultrashort pulse
Abstract: International audience; We report the generation of circularly polarized high order harmonics in the extreme ultraviolet range (18-27 nm) from a linearly polarized infrared laser (40 fs, 0.25 TW) focused into a neon filled gas cell. To circularly polarize the initially linearly polarized harmonics we have implemented a four-reflector phase-shifter. Fully circularly polarized radiation has been obtained with an efficiency of a few percents, thus being significantly more efficient than currently demonstrated direct generation of elliptically polarized harmonics. This demonstration opens up new experimental capabilities based on high order harmonics, for example, in biology and materials science. The inherent femtosecond time resolution of high order harmonic generating table top laser sources renders these an ideal tool for the investigation of ultrafast magnetization dynamics now that the magnetic circular dichroism at the absorption M-edges of transition metals can be exploited
Published: 2011
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29. Ultrafast Electronic And Nuclear Dynamics In Dissociative Photoionization Of Molecular Hydrogen and Deuterium

Author: J.-F. Hergott, P. Billaud, Franck Delmotte, Pierre Breger, Bertrand Carré, Thierry Ruchon, K. Veyrinas, Marie Géléoc, M. Böttcher, A Huetz, Danielle Dowek, Y. J. Picard, Marc Roulliay, Institut des Sciences Moléculaires d'Orsay (ISMO), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS), Service des Photons, Atomes et Molécules (SPAM), Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), and Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)
Subjects: History, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Chemistry, Bremsstrahlung, Photoionization mode, Resonance, Walsh diagram, Photoionization, 7. Clean energy, 01 natural sciences, Molecular physics, 010305 fluids & plasmas, Computer Science Applications, Education, Deuterium, Excited state, 0103 physical sciences, Femtosecond, Physics::Atomic and Molecular Clusters, Atomic physics, 010306 general physics, ComputingMilieux_MISCELLANEOUS
Abstract: Single-photon dissociative photoionization of H2/D2 in the Q1, Q2 doubly excited states resonance regions, where ultrafast electronic and nuclear dynamics are coupled, is studied using the vector-correlation method with single selected femtosecond high-order harmonic and synchrotron radiation in the VUV. Results are compared at the level of electron-ion kinetic energy correlation diagrams, asymmetry parameters, and the molecular frame photoelectron angular distributions.
Published: 2011

30. Structural properties of Al/Mo/SiC multilayers with high reflectivity for extreme ultraviolet light

Author: Franck Delmotte, Evgueni Meltchakov, Philippe Jonnard, M.-H. Hu, Jean-Michel André, Karine Le Guen, Anouk Galtayries, Laboratoire de Chimie Physique - Matière et Rayonnement (LCPMR), Université Pierre et Marie Curie - Paris 6 (UPMC)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS), Laboratoire de Physico-Chimie des Surfaces (LPCS), Ecole Nationale Supérieure de Chimie de Paris - Chimie ParisTech-PSL (ENSCP), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), ANR-07-BLAN-0150,ATTOMIX,Design and characterization of XUV multilayer mirrors for attosecond pulses(2007), Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11), Delmotte, Franck, and Blanc - Design and characterization of XUV multilayer mirrors for attosecond pulses - - ATTOMIX2007 - ANR-07-BLAN-0150 - BLANC - VALID
Subjects: [PHYS.PHYS.PHYS-OPTICS] Physics [physics]/Physics [physics]/Optics [physics.optics], Materials science, Ultraviolet Rays, Carbon Compounds, Inorganic, Extreme ultraviolet lithography, chemistry.chemical_element, Synchrotron radiation, 02 engineering and technology, 01 natural sciences, Photometry, 010309 optics, Optics, X-ray photoelectron spectroscopy, Aluminium, Materials Testing, 0103 physical sciences, Thin film, Lenses, Molybdenum, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], business.industry, Silicon Compounds, Membranes, Artificial, Equipment Design, 021001 nanoscience & nanotechnology, Atomic and Molecular Physics, and Optics, Equipment Failure Analysis, Secondary ion mass spectrometry, Refractometry, chemistry, Extreme ultraviolet, 0210 nano-technology, business, Aluminum
Abstract: International audience; We present the results of an optical and chemical, depth and surface study of Al/Mo/SiC periodic multilayers, designed as high reflectivity coatings for the extreme ultra-violet (EUV) range. In comparison to the previously studied Al/SiC system, the introduction of Mo as a third material in the multilayer structure allows us to decrease In comparison to the previously studied Al/SiC system with a reflectance of 37% at near normal incidence around 17 nm, the introduction of Mo as a third material in the multilayer structure allows us to decrease the interfacial roughness and achieve an EUV reflectivity of 53.4%, measured with synchrotron radiation. This is the first report of a reflectivity higher than 50% around 17 nm. Time-of-flight secondary ion mass spectrometry (ToFSIMS) and x-ray photoelectron spectroscopy (XPS) measurements are performed on the Al/Mo/SiC system in order to analyze the individual layers within the stack. ToF-SIMS and XPS results give evidence that the first SiC layer is partially oxidized, but the O atoms do not reach the first Mo and Al layers. We use these results to properly describe the multilayer stack and discuss the possible reasons for the difference between the measured and simulated EUV reflectivity values.
Published: 2010

31. Spatiotemporal distortions of attosecond pulses

Author: Charles Bourassin-Bouchet, Pierre Chavel, Sébastien de Rossi, Franck Delmotte, Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), and Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Attosecond, 01 natural sciences, Ultrafast optics, 010309 optics, Optics, OCIS: 320.0320, 340.7480, 080.1010, 0103 physical sciences, X-rays, Soft x-rays, 010306 general physics, Computer Science::Databases, Physics, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Geometrical optics, business.industry, Pulse duration, Pulse shaping, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Numerical aperture, Extreme ultraviolet, Aberrations, Computer Vision and Pattern Recognition, Focus (optics), business, Ultrashort pulse, Bandwidth-limited pulse
Abstract: 9 pages; International audience; In this article, we report that usual multilayer mirror configurations to focus attosecond pulses generate geometric aberrations and can significantly stretch pulses. The numerical simulations show that the effects can be strong enough to delay some parts of the pulses of an attosecond pulse train and make them interfere with the next pulses of the train. The influence of the numerical aperture on the pulse duration is also studied, showing that such effects can occur even with very low numerical apertures.
Published: 2010
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32. Aperiodic multilayer mirrors for efficient broadband reflection in the extreme ultraviolet

Author: Evgueni Meltchakov, Franck Delmotte, Y. Menesguen, S. de Rossi, Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS), ANR: ATTOMIX,ATTOMIX, ANR-07-BLAN-0150,ATTOMIX,Design and characterization of XUV multilayer mirrors for attosecond pulses(2007), Laboratoire National Henri Becquerel (LNHB), Département Métrologie Instrumentation & Information (DM2I), Laboratoire d'Intégration des Systèmes et des Technologies (LIST), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Laboratoire d'Intégration des Systèmes et des Technologies (LIST), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay, Management, entrepreneuriat, innovation, Centre d'études et de recherches appliquées à la gestion (CERAG), Centre National de la Recherche Scientifique (CNRS)-Université Pierre Mendès France - Grenoble 2 (UPMF)-Centre National de la Recherche Scientifique (CNRS)-Université Pierre Mendès France - Grenoble 2 (UPMF), Laboratoire Charles Fabry / Optique XUV, and Laboratoire Charles Fabry (LCF)
Subjects: Materials science, Synchrotron radiation, 02 engineering and technology, 42.15.Eq · 42.79.Bh · 78.67.Pt, 7. Clean energy, 01 natural sciences, PACS 42.15.Eq · 42.79.Bh · 78.67.Pt, 010309 optics, Optics, 0103 physical sciences, High harmonic generation, General Materials Science, Thin film, Reflectometry, [PHYS]Physics [physics], [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], business.industry, Synchrotron Radiation Source, General Chemistry, 021001 nanoscience & nanotechnology, Full width at half maximum, Extreme ultraviolet, Reflection (physics), Optoelectronics, 0210 nano-technology, business
Abstract: Recent extreme ultraviolet sources using high-harmonic generation in a rare gas make new optics developments necessary. We report on the study and development of multilayer structures with efficient reflectivity in the 35–75 eV energy range. We have optimized, deposited and characterized two aperiodic broadband mirrors consisting of a Mo, Si and B4C thin-film stack. We used the needle procedure in order to optimize mirror reflectivity. The magnetron sputter deposited multilayers have been calibrated and characterized using Cu K α grazing incidence X-ray reflectometry. Reflectivity measured at near-normal incidence on a synchrotron radiation source reaches 12% with a full width at half maximum of nearly 40 eV. Experimental results are compared with theoretical simulation using available optical constants for Mo, Si and B4C in this spectral range.
Published: 2010
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33. Design and fabrication of supermirrors for (2-10 keV) high resolution X-ray plasmas diagnostic imaging

Author: Hélène Maury, Françoise Bridou, P. Troussel, Franck Delmotte, Evgueni Meltchakov, DAM Île-de-France (DAM/DIF), Direction des Applications Militaires (DAM), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS), and Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)
Subjects: 010302 applied physics, Physics, Nuclear and High Energy Physics, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Photon, Fabrication, business.industry, X-ray, Synchrotron radiation, Surface finish, Plasma, Sputter deposition, 01 natural sciences, 010309 optics, Optics, 0103 physical sciences, business, Instrumentation, Refractive index, ComputingMilieux_MISCELLANEOUS
Abstract: We have developed non-periodic W/SiC multilayer mirrors (“supermirrors”) specifically designed to reflect photons between 2 and 10 keV. The mirrors were designed and optimized with a homemade calculation code. The supermirrors are designed to work at a nominal 0.7° grazing incidence with reflectivity above 35% in almost the entire energy range. The multilayers have been deposited by magnetron sputtering. Grazing incidence X-ray reflectance at 8 keV (0.154 nm) was made using a laboratory source. Reflectance measurement over the whole range was made at Physikalisch-Technische Bundesanstalt laboratory (PTB), the synchrotron radiation facility BESSY II, in Berlin. In addition to X-ray reflectance, multilayer thickness, refractive indices and roughness were characterized. The experimental results show good agreement with theoretical computations.
Published: 2010

34. Internal frequency conversion extreme ultraviolet interferometer using mutual coherence properties of two high-order-harmonic sources

Author: Bertrand Carré, Denis Joyeux, M. Bougeard, Raymond Mercier, Franck Delmotte, Ph. Martin, P. Monot, H. Stabile, Julien Gautier, S. Dobosz, A. Tortora, F. Réau, Hamed Merdji, D. Phalippou, Service des Photons, Atomes et Molécules (SPAM), Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), and Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)
Subjects: PACS 52.70.Kz, 52.50.Jm, 42.65.Ky, 07.60.Ly, 51.70.+f, 7. Clean energy, 01 natural sciences, law.invention, 010309 optics, Optics, law, 0103 physical sciences, Astronomical interferometer, 010306 general physics, plasma production by laser, Instrumentation, Physics, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Mutual coherence, plasma diagnostics, business.industry, aluminium, optical frequency conversion, ultraviolet sources, Laser, Interferometry, Temporal resolution, Harmonics, Extreme ultraviolet, light interferometry, Plasma diagnostics, business
Abstract: International audience; We report on an innovative two-dimensional imaging extreme ultraviolet (XUV) interferometer operating at 32 nm based on the mutual coherence of two laser high order harmonics (HOH) sources, separately generated in gas. We give the first evidence that the two mutually coherent HOH sources can be produced in two independent spatially separated gas jets, allowing for probing centimeter-sized objects. A magnification factor of 10 leads to a micron resolution associated with a subpicosecond temporal resolution. Single shot interferograms with a fringe visibility better than 30% are routinely produced. As a test of the XUV interferometer, we measure a maximum electronic density of 3×10^20 cm^−3 1.1 ns after the creation of a plasma on aluminum target.
Published: 2009
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35. Optical, chemical, and depth characterization of Al/SiC periodic multilayers

Author: M.-H. Hu, Anouk Galtayries, Evgueni Meltchakov, Jean-Michel André, Philippe Jonnard, K. Le Guen, Christophe Hecquet, Franck Delmotte, Laboratoire de Chimie Physique - Matière et Rayonnement (LCPMR), Université Pierre et Marie Curie - Paris 6 (UPMC)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11), Laboratoire de Physico-Chimie des Surfaces (LPCS), Ecole Nationale Supérieure de Chimie de Paris - Chimie ParisTech-PSL (ENSCP), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire de Chimie Physique - Matière et Rayonnement ( LCPMR ), Université Pierre et Marie Curie - Paris 6 ( UPMC ) -Centre National de la Recherche Scientifique ( CNRS ), Laboratoire Charles Fabry de l'Institut d'Optique ( LCFIO ), Université Paris-Sud - Paris 11 ( UP11 ) -Institut d'Optique Graduate School ( IOGS ) -Centre National de la Recherche Scientifique ( CNRS ) -Université Paris-Sud - Paris 11 ( UP11 ) -Institut d'Optique Graduate School ( IOGS ) -Centre National de la Recherche Scientifique ( CNRS ), Laboratoire de Physico-Chimie des Surfaces ( LPCS ), Ecole Nationale Supérieure de Chimie de Paris- Chimie ParisTech-PSL ( ENSCP ) -Centre National de la Recherche Scientifique ( CNRS ), and Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)
Subjects: [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], [ PHYS.PHYS.PHYS-OPTICS ] Physics [physics]/Physics [physics]/Optics [physics.optics], Chemistry, Refractory metals, Analytical chemistry, 02 engineering and technology, Surface finish, 021001 nanoscience & nanotechnology, 01 natural sciences, 010309 optics, X-ray reflectivity, Secondary ion mass spectrometry, Chemical species, Chemical state, Time of flight, 0103 physical sciences, Emission spectrum, 0210 nano-technology, ComputingMilieux_MISCELLANEOUS
Abstract: We present the characterization of Al/SiC periodic multilayers designed for op tical applications. In some samples, a thin layer of W or Mo is added at the SiC-on-Al interfaces. We use x-ray reflectivity (XRR) in order to determine the parameters of the stacks, i.e. thickness and roughness of all the layers. We have performed x-ray emission spectroscopy (XES) to identify the chemical state of th e Al and Si atoms present within the stru cture from an analysis of the shape of the Al KE and Si KE emission bands. Finally, time of flight secondary ion mass spectrometry (ToF-SIMS) is used to obtain the depth profile of the different elements present within the studied stacks. A fit of the XRR curves shows that the Al/SiC multilayer present large interfacial roughness (up to 2.8 nm), which is decreased considerably (down to 1 nm or less) when the refractory metal layers are introduced in the periodic structure. The combination of XES and ToF-SIMS allows us to conclude that in these systems the roughness is a purely geometrical parameter and not related to chemical interfacial reactions. Keywords: periodic multilayer, x-ray emission, x-ray reflectivity, time of flight secondary ion mass spectrometry * philippe.jonnard@upmc.fr , phone 33 1 44 27 63 03, fax 33 1 44 27 62 26, www.lcpmr.upmc.fr/
Published: 2009
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36. Design and performance of two-channel EUV multilayer mirrors with enhanced spectral selectivity

Author: Evgueni Meltchakov, Franck Delmotte, Angelo Giglia, Françoise Bridou, Stephano Nanaronne, Christophe Hecquet, Frédéric Auchère, Marie-Françoise Ravet-Krill, Sébastien de Rossi, Arnaud Jérôme, Nicola Mahne, Françoise Varniere, Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11), Institut d'astrophysique spatiale (IAS), Centre National de la Recherche Scientifique (CNRS)-Institut national des sciences de l'Univers (INSU - CNRS)-Université Paris-Sud - Paris 11 (UP11), Laboratorio Nazionale TASC (TASC), Consiglio Nazionale delle Ricerche (CNR), and Université Paris-Sud - Paris 11 (UP11)-Institut national des sciences de l'Univers (INSU - CNRS)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Physics, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], business.industry, Attenuation, Extreme ultraviolet lithography, Synchrotron Radiation Source, Synchrotron radiation, Bragg peak, 02 engineering and technology, General Chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, law.invention, 010309 optics, Telescope, Wavelength, Optics, law, Extreme ultraviolet, 0103 physical sciences, Optoelectronics, Astrophysics::Solar and Stellar Astrophysics, General Materials Science, 0210 nano-technology, business
Abstract: International audience; In this paper, we present a study on two-channel multilayer mirrors which can operate at two wavelengths in Extreme Ultraviolet (EUV) spectral range. We propose a new method to design two-channel EUV multilayer mirrors with enhanced spectral selectivity. The mirror structure is a stack of two periodic multilayers separated by a buffer layer. We have defined the main parameters which allow adjustment of the distance between different order Bragg's peak and of wavelength positions of reflectivity minima. Two mirrors have been designed and deposited for solar EUV telescope applications by using this method. The first mirror reflects Fe IX–X line (17.1 nm) and Fe XVI (33.5 nm) lines with attenuation of the He II line (30.4 nm). The second mirror reflects Fe IX–X and He II lines with attenuation of Fe XV (28.4 nm) and Fe XVI lines. Measurements with synchrotron radiation source confirm that, in both cases, for these mirrors, we are able to adjust reflectivity maxima (Bragg peak position) and minima. Such multilayers offer new possibilities for compact design of multi-wavelength EUV telescopes and/or for high spectral selectivity.
Published: 2009
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37. Stellar And Galactic Environment survey (SAGE)

Author: D. de Martino, M. P. Kowalski, Andrew Collier Cameron, G. Del Zanna, J. H. M. M. Schmitt, Carole Jordan, A. Cassatella, Matthew R. Burleigh, Isabella Pagano, Sarah A. Matthews, R. G. Cruddace, Franck Delmotte, N. J. Bannister, K. S. Wood, Norbert Kappelmann, C.S. Jeffery, Frédéric Auchère, K. J. H. Phillips, M.F. Bode, Klaus Werner, J. G. Doyle, Rosine Lallement, Boris T. Gaensicke, B. Y. Welsh, Marie-Françoise Ravet-Krill, Brad K. Gibson, G. E. Bromage, Martin A. Barstow, Jonathan S. Lapington, Marina Orio, Emanuele Pace, Department of Physics and Astronomy [Leicester], University of Leicester, Naval Research Laboratory (NRL), Institut d'Astrophysique de Paris (IAP), Université Pierre et Marie Curie - Paris 6 (UPMC)-Institut national des sciences de l'Univers (INSU - CNRS)-Centre National de la Recherche Scientifique (CNRS), Astrophysics Research Institute [Liverpool] (ARI), Liverpool John Moores University (LJMU), Centre for Astrophysics, University of Central Lancashire, University of Central Lancashire [Preston] (UCLAN), Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS), Institut für Astronomie und Astrophysik [Tübingen] (IAAT), Eberhard Karls Universität Tübingen = Eberhard Karls University of Tuebingen, HELIOS - LATMOS, Laboratoire Atmosphères, Milieux, Observations Spatiales (LATMOS), Université de Versailles Saint-Quentin-en-Yvelines (UVSQ)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Institut national des sciences de l'Univers (INSU - CNRS)-Centre National de la Recherche Scientifique (CNRS)-Université de Versailles Saint-Quentin-en-Yvelines (UVSQ)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Institut national des sciences de l'Univers (INSU - CNRS)-Centre National de la Recherche Scientifique (CNRS), Space Sciences Laboratory [Berkeley] (SSL), University of California [Berkeley] (UC Berkeley), University of California (UC)-University of California (UC), Centre National de la Recherche Scientifique (CNRS)-Institut national des sciences de l'Univers (INSU - CNRS)-Université Pierre et Marie Curie - Paris 6 (UPMC), Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11), University of California [Berkeley], University of California-University of California, Institut d'astrophysique spatiale (IAS), Université Paris-Sud - Paris 11 (UP11)-Institut national des sciences de l'Univers (INSU - CNRS)-Centre National de la Recherche Scientifique (CNRS)-Centre National d’Études Spatiales [Paris] (CNES), and Université Paris-Sud - Paris 11 (UP11)-Institut national des sciences de l'Univers (INSU - CNRS)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Computer science, Extreme ultraviolet lithography, High resolution, Astrophysics, Astrophysics::Cosmology and Extragalactic Astrophysics, 7. Clean energy, 01 natural sciences, 010309 optics, Planet, 0103 physical sciences, Astrophysics::Solar and Stellar Astrophysics, AGN, 010303 astronomy & astrophysics, Instrumentation, Gratings, ComputingMilieux_MISCELLANEOUS, Astrophysics::Galaxy Astrophysics, Spectroscopy, Ultraviolet, Physics, Cataclysmic variables, Payload, [SDU.ASTR.SR]Sciences of the Universe [physics]/Astrophysics [astro-ph]/Solar and Stellar Astrophysics [astro-ph.SR], Astrophysics::Instrumentation and Methods for Astrophysics, White dwarf, Astronomy, White dwarfs, Astronomy and Astrophysics, [PHYS.ASTR.SR]Physics [physics]/Astrophysics [astro-ph]/Solar and Stellar Astrophysics [astro-ph.SR], MCP detectors, Stars, Interstellar medium, Extreme ultraviolet, 13. Climate action, Space and Planetary Science, Physics::Space Physics, Satellite, Astrophysics::Earth and Planetary Astrophysics
Abstract: This paper describes a proposed high resolution soft X-ray and Extreme Ultraviolet (EUV) spectroscopy mission to carry out a survey of Stellar and Galactic Environments (SAGE). The payload is based on novel diffraction grating technology which has already been proven in a sub-orbital space mission and which is ready to fly on a satellite platform with minimal development. Much of the technical detail of the instrumentation has been reported elsewhere and we concentrate our discussion here on the scientific goals of a SAGE base-line mission, demonstrating the scientific importance of high resolution spectroscopy in the Extreme Ultraviolet for the study of stars and the local interstellar medium.
Published: 2009
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38. EUV near normal incidence collector development at SAGEM

Author: R. Mercier Ythier, Andre Rinchet, Benoit Sassolas, Jean-Marie Mackowski, Marie-Françoise Ravet-Krill, Christophe Michel, Roland Geyl, Laurent Pinard, Elodie Roméo, Xavier Bozec, R. Flaminio, Christophe Hecquet, N. Morgado, Franck Delmotte, J.-L. Montorio, SAGEM Défense Sécurité [Massy], Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11), Laboratoire des matériaux avancés (LMA), Université Claude Bernard Lyon 1 (UCBL), and Université de Lyon-Université de Lyon-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS)
Subjects: [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Materials science, Computer cooling, business.industry, Extreme ultraviolet lithography, Polishing, 02 engineering and technology, Surface finish, 021001 nanoscience & nanotechnology, 7. Clean energy, 01 natural sciences, Design for manufacturability, 010309 optics, chemistry.chemical_compound, Optics, chemistry, Extreme ultraviolet, 0103 physical sciences, Water cooling, Silicon carbide, 0210 nano-technology, business, ComputingMilieux_MISCELLANEOUS
Abstract: Through its participation to European programs, SAGEM has worked on the design and manufacturing of normal incidence collectors for EUV sources. By opposition to grazing incidence, normal incidence collectors are expected to collect more light with a simpler and cheaper design. Designs are presented for the two current types of existing sources: Discharge Produced Plasma (DPP) and Laser Produced Plasma (LPP). Collection efficiency is calculated in both cases. It is shown that these collectors can achieve about 10 % efficiency for DPP sources and 40 % for LPP sources. SAGEM works on the collectors manufacturability are also presented, including polishing, coating and cooling. The feasibility of polishing has been demonstrated with a roughness better than 2 angstroms obtained on several materials (glass, silicon, Silicon Carbide, metals...). SAGEM is currently working with the Institut d'Optique and the Laboratoire des Materiaux Avances on the design and the process of EUV coatings for large mirrors. Lastly, SAGEM has studied the design and feasibility of an efficient thermal control, based on a liquid cooling through slim channels machined close to the optical surface.
Published: 2008
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39. Sun Earth Connection Coronal and Heliospheric Investigation (SECCHI)

Author: O. C. St. Cyr, Jeffrey S. Newmark, S. Cooper, T. Carter, C. J. Eyles, W. Deutsch, Simon Plunkett, James R. Lemen, E. Mentzell, Franck Delmotte, J. W. Cook, Christopher J. Davis, Richard A. Harrison, Dennis G. Socker, Joseph M. Davila, Kimberly I. Mehalick, Volker Bothmer, A. Moore, Jean-Pierre Wuelser, Russell A. Howard, V. Stephens, Marie-Françoise Ravet, R. Baugh, Jean-Philippe Halain, H. Mapson-Menard, N. Rich, Nicholas R. Waltham, C. J. Wolfson, A. Hurley, Dexter W. Duncan, Jean-Pierre Delaboudiniere, F. Auchère, Clarence M. Korendyke, William T. Thompson, Jean-Marc Defise, Emmanuel Mazy, G. Maahs, Pierre Rochus, Raymond Mercier, G. M. Simnett, J. Lang, D. R. McMullin, John D. Moses, T. D. Tarbell, Angelos Vourlidas, Dennis Wang, E. O. Hulburt Center for Space Research, Naval Research Laboratory (NRL), NASA Goddard Space Flight Center (GSFC), Lockheed Martin Solar and Astrophysics laboratory (LMSAL), Lockheed Martin Advanced Technology Center (ATC), Space Science and Technology Department [Didcot] (RAL Space), STFC Rutherford Appleton Laboratory (RAL), Science and Technology Facilities Council (STFC)-Science and Technology Facilities Council (STFC), Astrophysics and Space Research group [Birmingham], University of Birmingham [Birmingham], Centre Spatial de Liège (CSL), Université de Liège, Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11), Institut d'astrophysique spatiale (IAS), Centre National de la Recherche Scientifique (CNRS)-Institut national des sciences de l'Univers (INSU - CNRS)-Université Paris-Sud - Paris 11 (UP11), Max-Planck-Institut für Sonnensystemforschung (MPS), Max-Planck-Gesellschaft, Interferometrics, Inc, HYTEC Inc., PRAXIS Inc., PRAXIS Inc, and Université Paris-Sud - Paris 11 (UP11)-Institut national des sciences de l'Univers (INSU - CNRS)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Solar System, 010504 meteorology & atmospheric sciences, 7. Clean energy, 01 natural sciences, law.invention, Telescope, Observatory, law, 0103 physical sciences, Coronal mass ejection, 14. Life underwater, 010303 astronomy & astrophysics, ComputingMilieux_MISCELLANEOUS, 0105 earth and related environmental sciences, Remote sensing, Physics, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Spacecraft, business.industry, Astronomy, Astronomy and Astrophysics, Coronal loop, Space and Planetary Science, Large Angle and Spectrometric Coronagraph, business, Heliosphere
Abstract: The Sun Earth Connection Coronal and Heliospheric Investigation (SECCHI) is a five telescope package, which has been developed for the Solar Terrestrial Relation Observatory (STEREO) mission by the Naval Research Laboratory (USA), the Lockheed Solar and Astrophysics Laboratory (USA), the Goddard Space Flight Center (USA), the University of Birmingham (UK), the Rutherford Appleton Laboratory (UK), the Max Planck Institute for Solar System Research (Germany), the Centre Spatiale de Leige (Belgium), the Institut d’Optique (France) and the Institut d’Astrophysique Spatiale (France). SECCHI comprises five telescopes, which together image the solar corona from the solar disk to beyond 1 AU. These telescopes are: an extreme ultraviolet imager (EUVI: 1–1.7 R⊙), two traditional Lyot coronagraphs (COR1: 1.5–4 R⊙ and COR2: 2.5–15 R⊙) and two new designs of heliospheric imagers (HI-1: 15–84 R⊙ and HI-2: 66–318 R⊙). All the instruments use 2048×2048 pixel CCD arrays in a backside-in mode. The EUVI backside surface has been specially processed for EUV sensitivity, while the others have an anti-reflection coating applied. A multi-tasking operating system, running on a PowerPC CPU, receives commands from the spacecraft, controls the instrument operations, acquires the images and compresses them for downlink through the main science channel (at compression factors typically up to 20×) and also through a low bandwidth channel to be used for space weather forecasting (at compression factors up to 200×). An image compression factor of about 10× enable the collection of images at the rate of about one every 2–3 minutes. Identical instruments, except for different sizes of occulters, are included on the STEREO-A and STEREO-B spacecraft.
Published: 2008

40. Characterization and optimization of magnetron sputtered Sc/Si multilayers for extreme ultraviolet optics

Author: Marc Roulliay, Françoise Bridou, Françoise Varniere, Franck Delmotte, Arnaud Jérôme, Ian Vickridge, Julien Gautier, Marie-Françoise Ravet, Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS), Institut des Nanosciences de Paris (INSP), and Université Pierre et Marie Curie - Paris 6 (UPMC)-Centre National de la Recherche Scientifique (CNRS)
Subjects: [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Materials science, Silicon, business.industry, chemistry.chemical_element, 02 engineering and technology, General Chemistry, Boron carbide, Sputter deposition, 021001 nanoscience & nanotechnology, 01 natural sciences, 010309 optics, Wavelength, chemistry.chemical_compound, Optics, chemistry, Extreme ultraviolet, 0103 physical sciences, Cavity magnetron, General Materials Science, Scandium, Thin film, [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat], 0210 nano-technology, business
Abstract: International audience; Scandium/silicon multilayers have been deposited by magnetron sputtering and characterized by several techniques. Experimental peak reflectances of 0.22 and 0.37 have been measured respectively at wavelengths of 40 nm and 46 nm, for 10 degrees incidence angle. The corresponding theoretical values for a perfect Sc/Si structure are respectively 0.38 and 0.57. In order to explain these differences between calculated and measured reflectivity, thin film and multilayer characterizations have been done. Effects of multilayer imperfections on the reflectivity have been estimated independently by means of simulation. Based on these results, a new design of Sc/Si multilayer is proposed with top layer thickness optimization. With this design, the experimental peak reflectance reaches 0.46 at a wavelength of 46 nm.
Published: 2007
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41. Design and characterization of extreme-ultraviolet broadband mirrors for attosecond science

Author: O. Boyko, Thomas Remetter, Franck Delmotte, Philippe Zeitoun, Rodrigo Lopez-Martens, Julien Gautier, Philippe Balcou, Marie Françoise Ravet, Katalin Varjú, Anne L'Huillier, Sophie Kazamias, Anne Sophie Morlens, E. Gustafsson, Laboratoire d'optique appliquée (LOA), École Nationale Supérieure de Techniques Avancées (ENSTA Paris)-École polytechnique (X)-Centre National de la Recherche Scientifique (CNRS), Department of Physics, Lund Institute of Technology, Lund University [Lund]-Lund University [Lund], Laboratoire d'interaction du rayonnement X avec la matière (LIXAM), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS), Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), and Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)
Subjects: Physics, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Photon, business.industry, Attosecond, Atom and Molecular Physics and Optics, Physics::Optics, Laser, 01 natural sciences, Atomic and Molecular Physics, and Optics, Photon counting, law.invention, 010309 optics, Optics, law, Harmonics, Extreme ultraviolet, 0103 physical sciences, Broadband, Optoelectronics, Reflection coefficient, 010306 general physics, business
Abstract: International audience; A novel multilayer mirror was designed and fabricated based on a recently developed three-material technology aimed both at reaching reflectivities of about 20% and at controlling dispersion over a bandwidth covering photon energies between 35 and 50 eV. The spectral phase upon reflection was retrieved by measuring interferences in a two-color ionization process using high-order harmonics produced from a titanium: sapphire laser. We demonstrate the feasibility of designing and characterizing phase-controlled broadband optics in the extreme-ultraviolet domain, which should facilitate the manipulation of attosecond pulses for applications.
Published: 2006
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42. Non-destructive X-ray study of the interphases in Mo/Si and Mo/B4C/Si/B4C multilayers

Author: P. Holliger, Jean-Michel André, Franck Delmotte, Arnaud Jérôme, Françoise Bridou, H. Maury, Philippe Jonnard, Marc Roulliay, Julien Gautier, Marie-Françoise Ravet, Laboratoire de Chimie Physique - Matière et Rayonnement (LCPMR), Université Pierre et Marie Curie - Paris 6 (UPMC)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Laboratoire de Chimie Physique - Matière et Rayonnement ( LCPMR ), Université Pierre et Marie Curie - Paris 6 ( UPMC ) -Centre National de la Recherche Scientifique ( CNRS ), Laboratoire Charles Fabry de l'Institut d'Optique ( LCFIO ), Université Paris-Sud - Paris 11 ( UP11 ) -Institut d'Optique Graduate School ( IOGS ) -Centre National de la Recherche Scientifique ( CNRS ) -Université Paris-Sud - Paris 11 ( UP11 ) -Institut d'Optique Graduate School ( IOGS ) -Centre National de la Recherche Scientifique ( CNRS ), Laboratoire d'Electronique et des Technologies de l'Information ( CEA-LETI ), Université Grenoble Alpes [Saint Martin d'Hères]-Commissariat à l'énergie atomique et aux énergies alternatives ( CEA ), and Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)
Subjects: 010302 applied physics, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], [ PHYS.PHYS.PHYS-OPTICS ] Physics [physics]/Physics [physics]/Optics [physics.optics], Silicon, Metals and Alloys, Analytical chemistry, chemistry.chemical_element, 02 engineering and technology, Surfaces and Interfaces, Sputter deposition, 021001 nanoscience & nanotechnology, 01 natural sciences, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Secondary ion mass spectrometry, X-ray reflectivity, chemistry.chemical_compound, chemistry, 0103 physical sciences, Silicide, Cavity magnetron, Materials Chemistry, Nanometre, Thin film, 0210 nano-technology
Abstract: International audience; We have tested and validated a non-destructive analysis method of multilayer structure, which combine X-ray emission spectroscopy and X-ray reflectometry at 0.154 and 1.33 nm. In this purpose, a series of Mo/Si and Mo/B4C/Si/B4C multilayers, deposited by magnetron sputtering, have been designed. The thickness of the Mo layer is 2 nm and that of the Si layers varies between 1 and 4 nm. The B4C layer thickness introduced at the Mo/Si and Si/Mo interfaces is 0.3 or 1 nm. It is shown that the reflectivity of the multilayers lowers with the decreasing silicon thickness. This is correlated to the diffuse character on the nanometer scale of the Mo/Si and Si/Mo interfaces as shown by secondary ion mass spectrometry, and the formation of silicides (MoSi2and Mo5Si3) at these interfaces as evidenced by X-ray emission spectroscopy. As expected, the introduction of B4C diffusion barriers considerably improves the reflectivity coefficient in the soft X-ray range, due to thinner and more abrupt interfaces.
Published: 2006

43. Second generation X-ray lasers

Author: P. Mercere, Marie-Françoie Ravet, Jean-Philippe Rousseau, Marta Fajardo, D. Aubert, Julien Gautier, Philippe Zeitoun, Gabriel Faivre, Tomas Mocek, A. Hallou, Hamed Merdji, Sophie Kazamias, Philippe Balcou, Franck Delmotte, G. de Lacheze-Murel, Anne-Sophie Morlens, T. Lefrou, Constance Valentin, Frédéric Burgy, S. Le Pape, Stéphane Sebban, Denis Douillet, GoLP/Instituto Superior Tecnico, Instituto Superior Técnico, Universidade Técnica de Lisboa (IST), Laboratoire d'optique appliquée (LOA), École Nationale Supérieure de Techniques Avancées (ENSTA Paris)-École polytechnique (X)-Centre National de la Recherche Scientifique (CNRS), Imagine Optic, AFOP, Laboratoire d'interaction du rayonnement X avec la matière (LIXAM), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS), Département de Physique Théorique et Appliquée (DPTA), DAM Île-de-France (DAM/DIF), Direction des Applications Militaires (DAM), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction des Applications Militaires (DAM), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Laboratoire pour l'utilisation des lasers intenses (LULI), Université Pierre et Marie Curie - Paris 6 (UPMC)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-École polytechnique (X)-Centre National de la Recherche Scientifique (CNRS), Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11), and Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Amplification, Degree of coherence, 01 natural sciences, 010305 fluids & plasmas, law.invention, X-ray laser, Optics, law, 0103 physical sciences, Ultrafast laser spectroscopy, High harmonic generation, Optical field ionization, Laser power scaling, 010306 general physics, Spectroscopy, Physics, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Radiation, business.industry, Far-infrared laser, Laser, Atomic and Molecular Physics, and Optics, Harmonic, Optoelectronics, business
Abstract: International audience; High harmonic amplification is shown in an optical-field ionized X-ray laser. The 4d–4p X-ray line of Kr^8+ at 32.8 nm, which has a close match to the 25th harmonic of the infrared laser, was amplified up to 200 times. The energy-extraction regime was also achieved, which depended on the level of seeding. This second-generation X-ray laser is fully polarized, has low divergence and shows a high degree of coherence. The duration is also expected to be short, fulfilling the requirements for an ultra-intense tabletop X-ray laser. Conditions for higher energy output are also suggested.
Published: 2006
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44. Lasers X de deuxième génération

Author: Gabriel Faivre, Philippe Balcou, D. Aubert, Frédéric Burgy, Anne-Sophie Morlens, Constance Valentin, S. Le Pape, Jérôme Arnaud, G. de Lacheze-Murel, Marta Fajardo, P. Mercere, Franck Delmotte, Philippe Zeitoun, T. Lefrou, Marie-Françoise Ravet, Stéphane Sebban, Tomas Mocek, Sophie Kazamias, Jean-Philippe Rousseau, Denis Douillet, S. Hallou, Laboratoire d'optique appliquée (LOA), École Nationale Supérieure de Techniques Avancées (ENSTA Paris)-École polytechnique (X)-Centre National de la Recherche Scientifique (CNRS), GoLP/Instituto de Plasmas e Fusão Nuclear, Instituto Superior Técnico, Universidade Técnica de Lisboa (IST), DAM Île-de-France (DAM/DIF), Direction des Applications Militaires (DAM), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Laboratoire d'interaction du rayonnement X avec la matière (LIXAM), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS), Laboratoire pour l'utilisation des lasers intenses (LULI), Université Pierre et Marie Curie - Paris 6 (UPMC)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-École polytechnique (X)-Centre National de la Recherche Scientifique (CNRS), Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS), and Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)
Subjects: [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], 0103 physical sciences, General Physics and Astronomy, 01 natural sciences, 010305 fluids & plasmas
Abstract: International audience; Au LOA, nous avons réalisé la première chaîne d'amplification laser fonctionnant dans la gamme spectrale XUV. La chaîne est constituée d'une source, d'un relais d'image et d'un amplificateur. La source de génération d'harmoniques d'ordre élevé avait de bonnes qualités optiques, tandis que l'amplificateur produit intrinsèquement des impulsions de forte énergie. Afin de garder les qualités optiques de la source durant l'amplification, le laser X était pompé par ionisation par effet de champs dans un gaz neutre. La métrologie de ce laser X injecté a permis de mesurer une énergie de sortie de 0.7 µJ et un haut degré de cohérence et de polarisation. La durée de l'impulsion a été estimée à 500 fs. On peut espérer atteindre un éclairement de 1.5x10^16 Wcm^-2 en focalisant le faisceau.
Published: 2005
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45. Study of XUV beam splitter flatness for use on a Michelson interferometer

Author: Marc Rouillay, R. Marmoret, Grégory Faivre, Philippe Zeitoun, Sébastien Hubert, L. Vanbostal, Marie-Françoise Ravet, Anne-Sophie Morlens, Christian Remond, P. Troussel, Franck Delmotte, Pascal Mercère, Laboratoire d'interaction du rayonnement X avec la matière (LIXAM), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS), Laboratoire d'optique appliquée (LOA), École Nationale Supérieure de Techniques Avancées (ENSTA Paris)-École polytechnique (X)-Centre National de la Recherche Scientifique (CNRS), DAM Île-de-France (DAM/DIF), Direction des Applications Militaires (DAM), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11), and Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Flatness (systems theory), Interference (wave propagation), 01 natural sciences, law.invention, 010309 optics, Optics, law, 0103 physical sciences, Fourier-transform spectroscopy, Electrical and Electronic Engineering, Fourier transform infrared spectroscopy, 010306 general physics, XUV beam splitter, Physics, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Spectrometer, business.industry, Astrophysics::Instrumentation and Methods for Astrophysics, Michelson interferometer, Sputter deposition, Condensed Matter Physics, XUV Michelson interferometry, Atomic and Molecular Physics, and Optics, Interferometry, Physics::Accelerator Physics, business, Beam splitter
Abstract: A XUV Michelson interferometer has been developed by LIXAM/CEA/LCFIO and has been tested as a Fourier-transform spectrometer for measurement of X-ray laser line shape. The observed strong deformation of the interference fringes limited the interest of such an interferometer for plasma probing. Because the fringe deformation was coming from a distortion of the beam splitter (5 × 5 mm2open aperture, about 150 nm thick), several parameters of the multilayer deposition used for the beam splitter fabrication have been recently optimized. The flatness has been improved from 80 nm rms obtained by using the ion beam sputtering technique, to 20 nm rms by using the magnetron sputtering technique. Over 3 × 3 mm2, the beam splitter has a flatness better than 4 nm rms.
Published: 2004
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46. Recent developments in X-UV optics and X-UV diagnostics

Author: Philippe Zeitoun, R. F. Smith, P. Troussel, Patrick P. Naulleau, L. Vanbostal, S. Hubert, Marta Fajardo, Sophie Kazamias, Mourad Idir, Constance Valentin, Philippe Balcou, Xavier Levecq, S. Le Pape, Franck Delmotte, Sylvie Jacquemot, Marie-Françoise Ravet, James Dunn, James R. Hunter, Jorge J. Rocca, Anne-Sophie Morlens, Guillaume Dovillaire, Kenneth A. Goldberg, Christian Remond, Ciaran Lewis, Pascal Mercère, Samuel Bucourt, Gabriel Faivre, R. Marmoret, Denis Douillet, Laboratoire d'interaction du rayonnement X avec la matière (LIXAM), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS), Laboratoire d'optique appliquée (LOA), École Nationale Supérieure de Techniques Avancées (ENSTA Paris)-École polytechnique (X)-Centre National de la Recherche Scientifique (CNRS), Imagine Optic, AFOP, Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS), Lawrence Livermore National Laboratory (LLNL), Center for X-ray Optics, Lawrence Berkely National Laboratory, DAM Île-de-France (DAM/DIF), Direction des Applications Militaires (DAM), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), School of Mathematics and Physics, Queen's University [Belfast] (QUB), NSF ERC For Extreme Ultraviolet Science and Technology and Department of Electrical and Computer Engineering, Colorado State University [Fort Collins] (CSU), and Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)
Subjects: Wavefront, Physics, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Physics and Astronomy (miscellaneous), Spectrometer, business.industry, General Engineering, General Physics and Astronomy, Nonlinear optics, Michelson interferometer, Wavefront sensor, Laser pumping, Laser, 01 natural sciences, law.invention, 010309 optics, Optics, law, 0103 physical sciences, PACS 07.85.Nc, 32.70.Jz, 41.50.+h, 42.15.Dp, 42.55.Vc, 52.70.La, Laser beam quality, 010306 general physics, business
Abstract: International audience; Metrology of XUV beams (X-ray lasers, high-harmonic generation and VUV free-electron lasers) is of crucial importance for the development of applications. We have thus developed several new optical systems enabling us to measure the optical properties of XUV beams. By use of a Michelson interferometer working as a Fourier-transform spectrometer, the line shapes of different X-ray lasers have been measured with a very high accuracy (Δλ/λ~10^-6). Achievement of the first XUV wavefront sensor has enabled us to measure the beam quality of laser-pumped as well as discharge-pumped X-ray lasers. A capillary discharge X-ray laser has demonstrated a very good wavefront allowing us to achieve an intensity as high as 3×10^14 W cm^-2 by focusing with a f=5 cm mirror. The sensor accuracy has been measured using a calibrated spherical wave generated by diffraction. The accuracy has been estimated to be as good as λ/120 at 13 nm. Commercial developments are underway. At Laboratoire drsquoOptique Appliquée, we are setting up a new beamline based on high-harmonic generation in order to start the femtosecond, coherent XUV optic .
Published: 2004
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47. Longitudinal coherence measurements of a transient collisional x-ray laser

Author: Christian Remond, R. Marmoret, Sébastien Hubert, Joseph Nilsen, Franck Delmotte, Marta Fajardo, L. Vanbostal, James Dunn, Sylvie Jacquemot, Marie Françoise Ravet, Philippe Zeitoun, James R. Hunter, Raymond F. Smith, Ciaran Lewis, Lawrence Livermore National Laboratory (LLNL), DAM Île-de-France (DAM/DIF), Direction des Applications Militaires (DAM), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Laboratoire d'interaction du rayonnement X avec la matière (LIXAM), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS), School of Mathematics and Physics [Belfast], Queen's University [Belfast] (QUB), Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), and Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)
Subjects: Physics, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], business.industry, Physics::Optics, Michelson interferometer, Laser, 01 natural sciences, Atomic and Molecular Physics, and Optics, law.invention, Coherence length, 010309 optics, X-ray laser, Interferometry, Laser linewidth, Optics, law, 0103 physical sciences, 010306 general physics, business, Lasing threshold, Coherence (physics)
Abstract: We present what is to our knowledge the first longitudinal coherence measurement of a transient inversion collisional x-ray laser. We investigated the picosecond output of a Ni-like Pd x-ray laser at 14.68 nm generated by the COMET laser facility at the Lawrence Livermore National Laboratory. Interference fringes were generated with a Michelson interferometer setup in which a thin multilayer membrane was used as a beam splitter. We determined the longitudinal coherence for the 4d1S0 --4p1P1 lasing transition to be approximately 400 microm (1/e half-width) by changing the length of one interferometer arm and measuring the resultant variation in fringe visibility. The inferred gain-narrowed linewidth of approximately 0.29 pm is a factor of 4 less than previously measured in quasi-steady-state x-ray laser schemes.
Published: 2003
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48. X-ray-ultraviolet beam splitters for the Michelson interferometer

Author: L. Vanbostal, Françoise Bridou, Franck Delmotte, Marie-Françoise Ravet, Gérard Soullie, Sébastien Hubert, Philippe Zeitoun, Françoise Varniere, Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS), Laboratoire de Spectroscopie Atomique et Ionique, Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS), DAM Île-de-France (DAM/DIF), Direction des Applications Militaires (DAM), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), and Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)
Subjects: [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Materials science, business.industry, Materials Science (miscellaneous), X-ray optics, Synchrotron radiation, Michelson interferometer, Laser, 01 natural sciences, Industrial and Manufacturing Engineering, law.invention, 010309 optics, Interferometry, Optics, law, 0103 physical sciences, Astronomical interferometer, Light beam, Optoelectronics, Business and International Management, 010306 general physics, business, Beam splitter
Abstract: International audience; With the aim of realizing a Michelson interferometer working at 13.9 nm, we have developed a symmetrical beam splitter with multilayers deposited on the front and back sides of a silicon nitride membrane. On the basis of the experimental optical properties of the membrane, simulations have been performed to define the multilayer structure that provides the highest reflectivity-transmission product. Optimized Mo-Si multilayers have been successfully deposited on both sides of the membrane by use of the ion-beam sputtering technique, with a thickness-period reproducibility of 0.1 nm. Measurements by means of synchrotron radiation at 13.9 nm and at an angle of 45° provide a reflectivity of 14.2% and a transmission of 15.2% for a 60% s-polarized light, close to the simulated values. Such a beam splitter has been used for x-ray laser Michelson interferometry at 13.9 nm. The first interferogram is discussed.
Published: 2002
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49. High density plasma deposition of device quality silicon nitride. II. Effects of thickness on the electrical properties

Author: M. C. Hugon, Eugene A. Irene, B. Agius, Franck Delmotte, Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11), Department of Chemistry, University of North Carolina [Chapel Hill] (UNC), and University of North Carolina System (UNC)-University of North Carolina System (UNC)
Subjects: 010302 applied physics, Permittivity, Range (particle radiation), [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Materials science, business.industry, General Engineering, 02 engineering and technology, Dielectric, 021001 nanoscience & nanotechnology, 01 natural sciences, Space charge, Electron cyclotron resonance, Poole–Frenkel effect, chemistry.chemical_compound, Condensed Matter::Materials Science, Silicon nitride, chemistry, 0103 physical sciences, Optoelectronics, 0210 nano-technology, business, Microwave
Abstract: Dielectric behavior of SiNx films, fabricated by microwave electron cyclotron resonance discharge, has been studied as a function of film thickness on the basis of the current–voltage and the capacitance–voltage characteristics. In the thickness range (20 nm,d,80 nm), the resistivity and the critical field for SiNx were found not to be sensitive to the film thickness ~d! and which was opposite to strong dependence of the dynamic dielectric constant e d on thickness. To explain the e d behavior as a function of d, a model based on trapped space charge effects is proposed. The dominant mode of electronic conduction, determined from J –E1/2 curves and Arrhenius plots of leakage current, appears to be Poole–Frenkel emission only for thicker films (d.20 nm). Finally, the spatial profile of fixed charges reveals that SiNx /Si interface has a much greater concentration of defects than the bulk film.
Published: 1999
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50. Plasma enhanced chemical vapour deposition of silica thin films in an integrated distributed electron cyclotron resonance reactor

Author: B. Agius, Franck Delmotte, Pavel Bulkin, J.C. Rostaing, M. C. Hugon, Bernard Drevillon, N. Bertrand, Laboratoire de physique des interfaces et des couches minces [Palaiseau] (LPICM), École polytechnique (X)-Centre National de la Recherche Scientifique (CNRS), Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS), Laboratoire de physique des gaz et des plasmas (LPGP), and Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)
Subjects: 010302 applied physics, Chemistry, Metals and Alloys, Analytical chemistry, 02 engineering and technology, Surfaces and Interfaces, Chemical vapor deposition, 021001 nanoscience & nanotechnology, 7. Clean energy, 01 natural sciences, Electron cyclotron resonance, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Amorphous solid, [SPI]Engineering Sciences [physics], 0103 physical sciences, Thermal, Materials Chemistry, Deposition (phase transition), Growth rate, Thin film, 0210 nano-technology, Stoichiometry, ComputingMilieux_MISCELLANEOUS
Abstract: The deposition of amorphous SiO2 at low temperature in an integrated distributed electron cyclotron resonance (IDECR) reactor is studied. Due to planar geometry such deposition process can be scaled-up for processing of large surfaces. Stoichiometric and dense silica films are deposited without bias at room temperature from a SiH4+O2 mixture at high deposition rates (>2 nm/s). Optical properties of the films are analyzed by UV-visible spectroellipsometry. The influence of gas flows, pressure and microwave power is investigated. The gas phase is found to determine the film stoichiometry, the SiH4 flow being the growth rate limiting factor. Optical properties match those of thermal silica. Electrical properties appear promising even for electronic applications.
Published: 1997

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