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La/B4C small period multilayer interferential mirror for the analysis of boron
- Source :
- X-Ray Spectrometry, X-Ray Spectrometry, Wiley, 2005, 34 (3), pp.203-206, X-Ray Spectrometry, Wiley, 2004, 34 (3), pp.203-206. ⟨10.1002/xrs.793⟩, X-Ray Spectrometry, 2004, 34 (3), pp.203-206. ⟨10.1002/xrs.793⟩, HAL
- Publication Year :
- 2005
- Publisher :
- Wiley, 2005.
-
Abstract
- This work was partly carried out at BESSY II in the framework of the project BESSY Number HPP33/150902 and supported by the European Commission under the ‘Human Potential Programme, Transnational Access to Major Research Infrastructures’, Contract No HPRI-1999-00028.; International audience; A La/B4C multilayer interferential mirror with small period d (4.8 nm) was produced by diode sputtering for the detection of the boron K emission by wavelength-dispersive x-ray spectrometry at a large Bragg angle (close to 45°). The structure of the mirror has been characterized by grazing incidence x-ray reflectometry, and its performance at the energy of the boron K emission (183 eV) was evaluated by means of polarized synchrotron radiation. A spectrometric measurement shows that the La/B4C mirror has improved the detection limit of boron using by a factor of 2 with respect to similar Mo/B4C mirrors, and by a factor of 4 with respect to a lead stearate crystal.
- Subjects :
- [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics]
[ PHYS.PHYS.PHYS-OPTICS ] Physics [physics]/Physics [physics]/Optics [physics.optics]
Chemistry
business.industry
Analytical chemistry
Synchrotron radiation
Bragg's law
chemistry.chemical_element
02 engineering and technology
021001 nanoscience & nanotechnology
01 natural sciences
BORO
010309 optics
Crystal
Optics
Sputtering
[PHYS.COND.CM-GEN]Physics [physics]/Condensed Matter [cond-mat]/Other [cond-mat.other]
0103 physical sciences
0210 nano-technology
Reflectometry
business
Boron
Spectroscopy
Diode
Subjects
Details
- ISSN :
- 10974539 and 00498246
- Volume :
- 34
- Database :
- OpenAIRE
- Journal :
- X-Ray Spectrometry
- Accession number :
- edsair.doi.dedup.....a2c0f90d0812679d268f7131cb5cb181
- Full Text :
- https://doi.org/10.1002/xrs.793