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Optical constants of magnetron sputtered Pt thin films with improved accuracy in the N- and O-electronic shell absorption regions

Authors :
Farhad Salmassi
Franck Delmotte
David Girou
Julia Meyer-Ilse
Nicolai Brejnholt
Sonny Massahi
Eric M. Gullikson
Regina Soufli
Finn Erland Christensen
Lawrence Livermore National Laboratory (LLNL)
Laboratoire Charles Fabry / Optique XUV
Laboratoire Charles Fabry (LCF)
Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut d'Optique Graduate School (IOGS)
Center for X-Ray Optics [LBNL Berkeley] (CXRO)
Lawrence Berkeley National Laboratory [Berkeley] (LBNL)
Danish Technical University
Source :
Journal of Applied Physics, Journal of Applied Physics, American Institute of Physics, 2019, 125 (8), pp.085106. ⟨10.1063/1.5067366⟩, Soufli, R, Delmotte, F, Meyer-Ilse, J, Salmassi, F, Brejnholt, N, Massahi, S, Girou, D, Christensen, F & Gullikson, E M 2019, ' Optical constants of magnetron sputtered Pt thin films with improved accuracy in the N-and O-electronic shell absorption regions ', Journal of Applied Physics, vol. 125, no. 8, 085106 . https://doi.org/10.1063/1.5067366
Publication Year :
2019
Publisher :
HAL CCSD, 2019.

Abstract

We present an experimental, self-consistent determination of the optical constants (refractive index) of Pt using a combination of photoabsorption and reflectance data in the photon energy range 25–778 eV, which includes the N- and O-shell electronic absorption edges of Pt. We compare our new experimental values with Pt optical constant data sets from the literature. Our Pt optical constant values reveal highly resolved absorption-edge fine structure around the O2,3 and N6,7 edges in both the absorptive and dispersive portions of the refractive index, which were missing in the earlier literature.We present an experimental, self-consistent determination of the optical constants (refractive index) of Pt using a combination of photoabsorption and reflectance data in the photon energy range 25–778 eV, which includes the N- and O-shell electronic absorption edges of Pt. We compare our new experimental values with Pt optical constant data sets from the literature. Our Pt optical constant values reveal highly resolved absorption-edge fine structure around the O2,3 and N6,7 edges in both the absorptive and dispersive portions of the refractive index, which were missing in the earlier literature.

Details

Language :
English
ISSN :
00218979 and 10897550
Database :
OpenAIRE
Journal :
Journal of Applied Physics, Journal of Applied Physics, American Institute of Physics, 2019, 125 (8), pp.085106. ⟨10.1063/1.5067366⟩, Soufli, R, Delmotte, F, Meyer-Ilse, J, Salmassi, F, Brejnholt, N, Massahi, S, Girou, D, Christensen, F & Gullikson, E M 2019, ' Optical constants of magnetron sputtered Pt thin films with improved accuracy in the N-and O-electronic shell absorption regions ', Journal of Applied Physics, vol. 125, no. 8, 085106 . https://doi.org/10.1063/1.5067366
Accession number :
edsair.doi.dedup.....83f6e3ad195067cbb661048a4bfd051b
Full Text :
https://doi.org/10.1063/1.5067366⟩