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Your search keyword '"Eiji Okunishi"' showing total 62 results

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62 results on '"Eiji Okunishi"'

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1. Making the Most of 3D Electron Diffraction: Best Practices to Handle a New Tool

2. Material structure, properties, and dynamics through scanning transmission electron microscopy

3. Selective growth of single phase VO2(A, B, and M) polymorph thin films

4. Materials News: Interfacial chemistry and atomic arrangement of ZrO2 − La2/3Sr1/3MnO3 pillar-matrix structures

6. Illuminating the Electronic Properties of WS2 Polytypism with Electron Microscopy

7. Structure determination of small molecule compounds by an electron diffractometer for 3D ED/MicroED

8. Distribution of Alloying Quadrivalent Zirconium in TiO2−x Magnèli Phase

9. Dissociation reaction of the 1/3$$ \left\langle {\bar{1}101} \right\rangle $$ edge dislocation in α-Al2O3

10. Synergy ED: a new electron diffractometer for micro-ED

11. Annular Bright-Field Scanning Transmission Electron Microscopy: Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials

12. Analytical and in situ Applications Using Aberration Corrected Scanning Transmission Electron Microscope

13. Corrosion of gold by a nanoscale gold and copper beltlike structure

14. Structure determination of small molecule compounds by an electron diffractometer for 3D ED/MicroED.

15. Atomic-scale chemical mapping of copper dopants in Bi2Te2.7Se0.3 thermoelectric alloy

16. Dynamic Structural Evolution of Metal–Metal Bonding Network in Monolayer WS2

17. Atomic-scale investigation of the heterogeneous structure and ionic distribution in an ionic liquid using scanning transmission electron microscopy

21. Development of a monochromator for aberration-corrected scanning transmission electron microscopy

22. Strain-Dependent Edge Structures in MoS2 Layers

23. Strain-Dependent Edge Structures in MoS

24. Surface evolution of a Pt–Pd–Au electrocatalyst for stable oxygen reduction

25. Atomic Resolution Imaging and Analysis of Graphene at Low Acceleration Voltages using Aberration Corrected Microscope with Cold Field Emission Gun

26. Energy Selected Secondary Electron Image Revealing Surface Potential by High Accelerating Voltage Scanning Electron Microscope

27. Enhancement of noisy EDX HRSTEM spectrum-images by combination of filtering and PCA

31. Experimental verification of orbital engineering at the atomic scale: charge transfer and symmetry breaking in nickelate heterostructures

32. Direct observation of depth-dependent atomic displacements associated with dislocations in gallium nitride

33. Impurity induced non-bulk stacking in chemically exfoliated h-BN nanosheets

34. Atomic structure characterization of stacking faults on the {11¯00} plane in α-alumina by scanning transmission electron microscopy

36. Near Shadowless EDS Tomography for Sliced Sample Realized by X-ray Collection with One Large Sized SDD Detector

37. 3aA_MI-7Atomic Resolution Imaging and Analysis of 2D-materials at Low Acceleration Voltages using Aberration Corrected Microscope with Cold Field Emission Gun

38. Monolayer PtSe 2 , a New Semiconducting Transition-Metal-Dichalcogenide, Epitaxially Grown by Direct Selenization of Pt

39. Pseudo Atomic Column EELS & EDS Mapping of Silicon Reconstructed With K and L Electrons Using STEM-Moiré Method

40. Ultrahighly Efficient X-ray Detection System Of Two Very Large Sized SDDs for Aberration Corrected 300 kV Microscope

42. PM-02Atomic Resolution Observation and Analysis at Low Accelerating Voltage in Transmission Electron Microscopy with Auto Aberration Corrector and Cold-FEG

46. Practical Measurement of X-ray Detection Performance of Large-Angle Silicon Drift Detectors Toward Quantitative Analysis in the Newly Developed 300 kV Aberration-Corrected Grand ARM

47. Atomic Structure Characterization of Stacking Faults on the {1100} Plane in α-Alumina by Scanning Transmission Electron Microscopy.

48. B12-O-20In-situ Observation and Chemical Analyses under High Gas Pressure Conditions using Aberration Corrected 300 kV Microscope with Gas-cell Type Specimen Holder

49. Selective growth of single phase VO2(A, B, and M) polymorph thin films

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