Energy Selected Secondary Electron Image Revealing Surface Potential by High Accelerating Voltage Scanning Electron Microscope

Authors :: Noriaki Endo
Takashi Suzuki
Shuji Kawai
Kei-ichi Fukunaga
Eiji Okunishi
Yukihito Kondo
Source :: Microscopy and Microanalysis. 24:1514-1515
Publication Year :: 2018
Publisher :: Oxford University Press (OUP), 2018.

Subjects :: 010302 applied physics
Surface (mathematics)
Materials science
Scanning electron microscope
business.industry
02 engineering and technology
021001 nanoscience & nanotechnology
01 natural sciences
Acceleration voltage
Secondary electrons
0103 physical sciences
Optoelectronics
0210 nano-technology
business
Instrumentation
Energy (signal processing)

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