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Analytical and in situ Applications Using Aberration Corrected Scanning Transmission Electron Microscope
- Source :
- e-Journal of Surface Science and Nanotechnology. 16:286-288
- Publication Year :
- 2018
- Publisher :
- Surface Science Society Japan, 2018.
- Subjects :
- 010302 applied physics
In situ
Materials science
business.industry
Bioengineering
02 engineering and technology
Surfaces and Interfaces
021001 nanoscience & nanotechnology
Condensed Matter Physics
01 natural sciences
Surfaces, Coatings and Films
law.invention
Optics
Mechanics of Materials
law
0103 physical sciences
Scanning transmission electron microscopy
Electron microscope
0210 nano-technology
business
Biotechnology
Subjects
Details
- ISSN :
- 13480391
- Volume :
- 16
- Database :
- OpenAIRE
- Journal :
- e-Journal of Surface Science and Nanotechnology
- Accession number :
- edsair.doi...........255d30efe44c701aa70fed1e3aa24f7a
- Full Text :
- https://doi.org/10.1380/ejssnt.2018.286