Near Shadowless EDS Tomography for Sliced Sample Realized by X-ray Collection with One Large Sized SDD Detector

Authors :: Takeo Sasaki
Eiji Okunishi
Yukihito Kondo
Yorinobu Iwasawa
Noriaki Endo
Ichiro Ohnishi
Yoshitaka Aoyama
Source :: Microscopy and Microanalysis. 23:1084-1085
Publication Year :: 2017
Publisher :: Oxford University Press (OUP), 2017.

Subjects :: 010302 applied physics
Materials science
business.industry
Detector
X-ray
02 engineering and technology
021001 nanoscience & nanotechnology
01 natural sciences
Sample (graphics)
Optics
0103 physical sciences
Tomography
0210 nano-technology
business
Instrumentation

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