117 results on '"Lacaita, A.L."'
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2. Physical modeling of single-trap RTS statistical distribution in flash memories
3. A multistandard Σ-Δ fractional-N frequency synthesizer for 802.11a/b/g WLAN
4. Comprehensive numerical model for Phase-Change Memory simulations
5. Physics and Performance of Phase Change Memories
6. Impact of lateral charge migration on the retention performance of planar and 3D SONOS devices.
7. Behavioral phase-noise analysis of charge-pump phase-locked loops.
8. Time-to-digital converter with 3-ps resolution and digital linearization algorithm.
9. A multi-channel low-power IC for neural spike recording with data compression and narrowband 400-MHz MC-FSK wireless transmission.
10. A multi-channel low-power system-on-chip for single-unit recording and narrowband wireless transmission of neural signal.
11. Impact of material composition on the write performance of phase-change memory devices.
12. Investigation of the ISPP dynamics and of the programming efficiency of charge-trap memories.
13. Investigation of the threshold voltage instability after distributed cycling in nanoscale NAND Flash memory arrays.
14. Trade-off between data retention and reset in NiO RRAMS.
15. Random telegraph signal noise in phase change memory devices.
16. Reliability constraints for TANOS memories due to alumina trapping and leakage.
17. Variability effects on the VT distribution of nanoscale NAND Flash memories.
18. Granular electron injection and random telegraph noise impact on the programming accuracy of NOR Flash memories.
19. Statistical and scaling behavior of structural relaxation effects in phase-change memory (PCM) devices.
20. A glitch-corrector circuit for low-spur ADPLLs.
21. Distributed-Poole-Frenkel modeling of anomalous resistance scaling and fluctuations in phase-change memory (PCM) devices.
22. Physical mechanism and temperature acceleration of relaxation effects in phase-change memory cells.
23. Scaling trends for random telegraph noise in deca-nanometer Flash memories.
24. A new physics-based model for TANOS memories program/erase.
25. Evidence for threshold switching in the set process of NiO-based RRAM and physical modeling for set, reset, retention and disturb prediction.
26. Status and challenges of PCM modeling.
27. An integrated low-noise multichannel system for neural signals amplification.
28. A Physics-Based Crystallization Model for Retention in Phase-Change Memories.
29. Statistical Investigation of Random Telegraph Noise ID Instabilities in Flash Cells at Different Initial Trap-filling Conditions.
30. Physical interpretation, modeling and impact on phase change memory (PCM) reliability of resistance drift due to chalcogenide structural relaxation.
31. Conductive-filament switching analysis and self-accelerated thermal dissolution model for reset in NiO-based RRAM.
32. Statistical analysis and modeling of programming and retention in PCM arrays.
33. First evidence for injection statistics accuracy limitations in NAND Flash constant-current Fowler-Nordheim programming.
34. Reliability issues and scaling projections for phase change non volatile memories.
35. Electrical characterization of anomalous cells in phase change memory arrays.
36. Defects spectroscopy in SiO2 by statistical random telegraph noise analysis.
37. A Monte Carlo Investigation of Nanocrystal Memory Reliability.
38. Low-Power All-Analog Component Separator for an 802.11a/g LINC Transmitter.
39. Low-power CMOS IEEE 802.11a/g Signal Separator for Outphasing Transmitter.
40. Monitoring Flash EEPROM Reliability by Equivalent Cell Analysis
41. Degradation Dynamics for Deep Scaled p-MOSFET's during Hot-Carrier Stress
42. μtrench phase-change memory cell engineering and optimization.
43. Reliability assessment of discrete-trap memories for NOR applications.
44. Program and SILC constraints on NC memories scaling: a monte carlo approach.
45. Assessment of threshold switching dynamics in phase-change chalcogenide memories.
46. Impact of crystallization statistics on data retention for phase change memories.
47. A new charge-trapping technique to extract SILC-trap time constants in SiO/sub 2/.
48. Electrothermal and phase-change dynamics in chalcogenide-based memories.
49. High energy oxide traps and anomalous soft-programming in flash memories.
50. Differential tuning oscillators with reduced flicker noise upconversion.
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