Distributed-Poole-Frenkel modeling of anomalous resistance scaling and fluctuations in phase-change memory (PCM) devices.

Details

Language :

English

ISBNs :

9781424456390

Database :

Complementary Index

Journal :

2009 IEEE International Electron Devices Meeting (IEDM)

Publication Type :

Conference

Accession number :

81602394

Full Text :

https://doi.org/10.1109/IEDM.2009.5424238