12 results on '"SCANNING electron microscopes"'
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2. From Transistors to Bumps: Preparing SEM Cross-Sections by Combining Site-specific Cleaving and Broad Ion Beam Milling.
3. Visualizing formation in BEOL.
4. 2D materials may be brittle.
5. FEI's Tecnai Osiris S/TEM goes for speed in analytics.
6. Versatile SEM/FIB.
7. FEI eyes 3D structures with intergated SEM/FIB platform.
8. Scanning electron microscope.
9. Quanta 3D SEM/FIB Dual Beam.
10. MEMS technology enables low-cost mini-SEM.
11. IBM's vertical transistor.
12. Parallel scanning probes: Another NGL option?
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