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Your search keyword '"SCANNING electron microscopes"' showing total 8 results
8 results on '"SCANNING electron microscopes"'

1. NEW PRODUCTS.

Author

Mandelis, Andreas

Subjects
*NANOTECHNOLOGY equipment, *SCANNING electron microscopes, *TRANSMISSION electron microscopes, *EVALUATION
Abstract

The article offers brief information on several microscopy and nanotechnology equipment including the N-565 linear stages from Physik Instrumente LP (PI), the Apreo scanning electron microscope from FEI, and the JEM-F200 transmission electron microscope from JEOL USA Inc.

Published
2016

3. FEI's Tecnai Osiris S/TEM goes for speed in analytics.

Author

D. V.

Subjects
*SCANNING electron microscopes, *TRANSMISSION electron microscopes, *EVALUATION
Abstract

The article evaluates the Tecnai Osiris scanning/transmission electron microscope (S/TEM) from Fei Co.

Published
2009

5. FEI eyes 3D structures with intergated SEM/FIB platform.

Author

D. V.

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article evaluates the Helios NanoLabx50 DualBeam Series 450(S) and 650 structures for the integration of extreme high-resolution scanning electron microscope (XHR SEM) from Fei Co.

Published
2010

6. FEI Announces New Quanta 50 Series SEM.

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article evaluates the Quanta 50 Series scanning electron microscope (SEM) from FEI Co.

Published
2009

7. Quanta 3D SEM/FIB Dual Beam.

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article evaluates the Quanta 3D FEG analytical DualBeam from FEI Co.

Published
2007

8. Scanning Electron Microscope.

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article evaluates the Magellan extreme resolution scanning electron microscope (SEM) from FEI Co.

Published
2010

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