130 results on '"Redin E"'
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2. Numerical modeling of total dose effects on CD4007 MOSFET during switched-bias irradiation
3. Influence of Interface Traps on MOSFET thermal coefficients and its effects on the ZTC current
4. Numerical modeling of radiation-induced charge neutralization in MOS devices
5. EXPERIÊNCIAS E REFLEXÕES EM CIÊNCIAS AGRÁRIAS
6. DESEMPENHO NO SERVIÇO PÚBLICO: UM ESTUDO SOBRE A EFICIÊNCIA X ESTABILIDADE
7. Experimental characterization and numerical modeling of total ionizing dose effects on field oxide MOS dosimeters
8. Numerical Modeling of Oxide and Interface Charge Buildup in Field Oxide Transistors During Irradiation and Annealing
9. OA19.03 Exportin 1 Inhibition Constraints Lineage Plasticity and Histological Transformation through Downregulation of SOX2
10. 6MV LINAC characterization of a MOSFET dosimeter fabricated in a CMOS process
11. YES1 as a Possible Liquid Biopsy Biomarker in Lung Cancer
12. PERCEPÇÃO DO BEM-ESTAR ANIMAL NA PECUÁRIA FAMILIAR DE LEITE EM UNAÍ, MINAS GERAIS /PERCEPTION OF ANIMAL WELFARE IN FAMILY DAIRY FARMING IN UNAÍ, MINAS GERAIS
13. A physics-based numerical modeling of total ionizing dose effects in CMOS integrated circuits
14. MA19.03 SMARCA4 Controls State Plasticity in SCLC Through Regulation of Neuroendocrine Transcription Factors and REST Splicing.
15. Experimental evidence and modeling of non-monotonic responses in MOS dosimeters
16. P1.03G.01 Lurbinectedin Synergizes with Selinexor by Inhibiting DNA Damage Repair and Enhancing Immune Cell Infiltration in Neuroendocrine Lung Tumors
17. Modeling Switched Bias Irradiations on Floating Gate Devices: Application to Dosimetry
18. Numerical modeling of radiation-induced charge neutralization in MOS devices
19. FP03.04 Dasatinib Improves the Antitumor Activity of Anti-PD-1 in NSCLC Models by Inhibiting Treg Conversion and Proliferation
20. Cancer Epigenetic Biomarkers in Liquid Biopsy for High Incidence Malignancies
21. Extension of the measurement range of MOS dosimeters using radiation induced charge neutralization
22. EP16.01-009 Two Novel Alternative Cell Line Models for the Study of Multiorganic Metastasis and Immunotherapy in Lung Squamous Cell Carcinoma
23. P2.03-38 Identification of a Novel Synthetic Lethal Vulnerability in Non-Small Cell Lung Cancer by Co-Targeting TMPRSS4 and DDR1
24. Radiation and bias switch-induced charge dynamics in Al2O3-based metal-oxide-semiconductor structures.
25. P1.03-24 TMPRSS4: A Novel Prognostic Biomarker and Therapeutic Target in NSCLC
26. Numerical Modeling of MOS Dosimeters Under Switched Bias Irradiations
27. Design of an on-chip ionizing radiation differential sensor
28. CMOS Differential and Amplified Dosimeter with Field Oxide N-Channel MOSFETs
29. Radiation and bias switch-induced charge dynamics in Al2O3-based metal-oxide-semiconductor structures
30. Application of a CMOS differential and amplified dosimeter with Field Oxide n-channel MOSFETs to Diagnosis X-Ray beams
31. Switched Bias Differential MOSFET Dosimeter
32. Field Oxide n-channel MOS Dosimeters Fabricated in CMOS Processes
33. Experimental evidence and modeling of two types of electron traps in Al2O3 for nonvolatile memory applications
34. New Fowler-Nordheim Injection, Charge Neutralization, and Gamma Tests on the REM RFT300 RADFET Dosimeter
35. Comparative Analysis of MIS Capacitance Structures With High-k Dielectrics Under Gamma, $^{16}$O and p Radiation
36. Comparative analysis of MIS capacitive structures with high-K dielectrics under gamma, 16O and p radiation
37. Temperature dependence and compensation in MOS dosimeters using bias controlled cycled measurement.
38. Extension of the measurement range of MOS dosimeters using radiation induced charge neutralization
39. SATISFAÇÃO DE DISCENTES SOBRE A FORMAÇÃO TÉCNICA E PROFISSIONAL EM INSTITUIÇÕES PÚBLICA E PRIVADA (RIO GRANDE DO SUL, 2013).
40. Ionizing radiation differential sensor based on thick gate oxide MOS transistors.
41. Radiation response of Al2O3-based MOS capacitors under different bias conditions.
42. Total ionizing dose numerical model for radiation effects estimation in floating gate devices.
43. Radiation effects in Al2O3-based MOS capacitors.
44. Electron trapping in Al2O3/HfO2 nanolaminate-based MOS capacitors.
45. Study of Floating Gate MOS devices transients during switched bias irradiations.
46. Radiation effects on high-K dielectrics. Measurement technique and first results.
47. Ring oscillators response to irradiation and application to dosimetry.
48. Stand alone MOS dosimetry system for high dose ionizing radiation.
49. Temperature effects on metal oxide semiconductor dosimeters during switched bias irradiation.
50. Temperature and interface traps compensation in MOS Bias Controlled Cycled Dosimeters.
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