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Temperature and interface traps compensation in MOS Bias Controlled Cycled Dosimeters.

Authors :
Lipovetzky, J.
Inza, M.G.
Carbonetto, S.
Redin, E.
Faigon, A.
Source :
2008 Argentine School of Micro-Nanoelectronics, Technology & Applications; 2008, p23-28, 6p
Publication Year :
2008

Details

Language :
English
ISBNs :
9789876550031
Database :
Complementary Index
Journal :
2008 Argentine School of Micro-Nanoelectronics, Technology & Applications
Publication Type :
Conference
Accession number :
80990852

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