Search

Your search keyword '"Olivo, Ricardo"' showing total 123 results

Search Constraints

Start Over You searched for: Author "Olivo, Ricardo" Remove constraint Author: "Olivo, Ricardo"
123 results on '"Olivo, Ricardo"'

Search Results

1. An Ultra-Compact Single FeFET Binary and Multi-Bit Associative Search Engine

4. In-Memory Nearest Neighbor Search with FeFET Multi-Bit Content-Addressable Memories

14. Ferroelectric Field Effect Transistors–Based Content‐Addressable Storage‐Class Memory: A Study on the Impact of Device Variation and High‐Temperature Compatibility

15. Heavy ion irradiation induced phase transitions and their impact on the switching behavior of ferroelectric hafnia.

17. Impact of High-K Deposition Process on the Noise Immunity of FeFETs and their Applicability Towards In-Memory-Computing

20. An Ultracompact Single‐Ferroelectric Field‐Effect Transistor Binary and Multibit Associative Search Engine

22. Multilevel Operation of Ferroelectric FET Memory Arrays Considering Current Percolation Paths Impacting Switching Behavior

23. Synergistic Approach of Interfacial Layer Engineering and READ-Voltage Optimization in HfO2-Based FeFETs for In-Memory-Computing Applications

24. Impact of Ferroelectric Layer Thickness on Reliability of Back‐End‐of‐Line‐Compatible Hafnium Zirconium Oxide Films

25. Interfacial Layer Engineering to Enhance Noise Immunity of FeFETs for IMC Applications

26. Structural and Electrical Response of Emerging Memories Exposed to Heavy Ion Radiation

28. Integration of BEoL Compatible 1T1C FeFET Memory Into an Established CMOS Technology

32. Impact of Ferroelectric Layer Thickness on Reliability of Back‐End‐of‐Line‐Compatible Hafnium Zirconium Oxide Films.

33. Tuning Hyrbrid Ferroelectric and Antiferroelectric Stacks for Low Power FeFET and FeRAM Applications by Using Laminated HSO and HZO films

38. RF-Characterization of HZO Thin Film Varactors

39. Impact of the Ferroelectric Stack Lamination in Si Doped Hafnium Oxide (HSO) and Hafnium Zirconium Oxide (HZO) Based FeFETs: Toward High-Density Multi-Level Cell and Synaptic Storage

44. Current percolation path impacting switching behavior of ferroelectric FETs

45. Impact of the Nonlinear Dielectric Hysteresis Properties of a Charge Trap Layer in a Novel Hybrid High-Speed and Low-Power Ferroelectric or Antiferroelectric HSO/HZO Boosted Charge Trap Memory

Catalog

Books, media, physical & digital resources