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Synergistic Approach of Interfacial Layer Engineering and READ-Voltage Optimization in HfO2‑Based FeFETs for In-Memory-Computing Applications.

Authors :
Raffel, Yannick
De, Sourav
Lederer, Maximilian
Olivo, Ricardo Revello
Hoffmann, Raik
Thunder, Sunanda
Pirro, Luca
Beyer, Sven
Chohan, Talha
Kämpfe, Thomas
Seidel, Konrad
Heitmann, Johannes
Source :
ACS Applied Electronic Materials; 11/22/2022, Vol. 4 Issue 11, p5292-5300, 9p
Publication Year :
2022

Details

Language :
English
ISSN :
26376113
Volume :
4
Issue :
11
Database :
Supplemental Index
Journal :
ACS Applied Electronic Materials
Publication Type :
Academic Journal
Accession number :
160394497
Full Text :
https://doi.org/10.1021/acsaelm.2c00771