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1. Using MRED to Screen Multiple-Node Charge-Collection Mitigated SOI Layouts

2. Post-irradiation annealing mechanisms of defects generated in hydrogenated bipolar oxides

3. Understanding the Implications of a LINAC’s Microstructure on Devices and Photocurrent Models

4. Analysis of TID Process, Geometry, and Bias Condition Dependence in 14-nm FinFETs and Implications for RF and SRAM Performance

5. Upsets in Erased Floating Gate Cells With High-Energy Protons

6. New Insights Gained on Mechanisms of Low-Energy Proton-Induced SEUs by Minimizing Energy Straggle

7. Outstanding Conference Paper Award: 2015 IEEE Nuclear and Space Radiation Effects Conference

8. The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate

9. Outstanding Conference PaperAward 2014 IEEE Nuclear and Space Radiation Effects Conference

10. Mapping of Radiation-Induced Resistance Changes and Multiple Conduction Channels in <formula formulatype='inline'> <tex Notation='TeX'>${\rm TaO}_{\rm x}$</tex></formula> Memristors

11. Hardness Assurance for Proton Direct Ionization-Induced SEEs Using<newline/> a High-Energy Proton Beam

12. SEGR in SiO${}_2$–Si$_3$N$_4$ Stacks

13. A Comparison of the Radiation Response of ${\rm TaO}_{\rm x}$ and ${\rm TiO}_2$ Memristors

14. Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Radiation Environments, Physical Mechanisms, and Foundations for Hardness Assurance

15. Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Test Guideline for Proton and Heavy Ion Single-Event Effects

16. Initial Assessment of the Effects of Radiation on the Electrical Characteristics of ${\rm TaO}_{\rm x}$ Memristive Memories

17. Statistical Analysis of Heavy-Ion Induced Gate Rupture in Power MOSFETs—Methodology for Radiation Hardness Assurance

18. SOI Substrate Removal for SEE Characterization: Techniques and Applications

19. Hardness Assurance Testing for Proton Direct Ionization Effects

20. Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains

21. Radiation Effects in 3D Integrated SOI SRAM Circuits

22. The Effects of Neutron Energy and High-Z Materials on Single Event Upsets and Multiple Cell Upsets

23. Direct Comparison of Charge Collection in SOI Devices From Single-Photon and Two-Photon Laser Testing Techniques

24. Heavy Ion Testing With Iron at 1 GeV/amu

25. Current and Future Challenges in Radiation Effects on CMOS Electronics

26. Effects of Moisture on Radiation-Induced Degradation in CMOS SOI Transistors

27. Charge Generation by Secondary Particles From Nuclear Reactions in BEOL Materials

28. An Embeddable SOI Radiation Sensor

29. Heavy-Ion Induced Charge Yield in MOSFETs

30. Radiation Response of a Gate-All-Around Silicon Nano-Wire Transistor

31. Development of a Radiation-Hardened Lateral Power MOSFET for POL Applications

32. Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM

33. Moisture Effects on the 1/F Noise Of Mos Devices

34. Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM

35. Enhanced Proton and Neutron Induced Degradation and Its Impact on Hardness Assurance Testing

36. Investigation of the Propagation Induced Pulse Broadening (PIPB) Effect on Single Event Transients in SOI and Bulk Inverter Chains

37. Post-Irradiation Annealing Mechanisms of Defects Generated in Hydrogenated Bipolar Oxides

38. Total Dose Radiation Response of NROM-Style SOI Non-Volatile Memory Elements

39. Effects of Moisture and Hydrogen Exposure on Radiation-Induced MOS Device Degradation and Its Implications for Long-Term Aging

40. Total Ionizing Dose and Single Event Effects Hardness Assurance Qualification Issues for Microelectronics

41. Test Procedures for Proton-Induced Single Event Latchup in Space Environments

42. Impact of Ion Energy and Species on Single Event Effects Analysis

43. New Insights Into Single Event Transient Propagation in Chains of Inverters—Evidence for Propagation-Induced Pulse Broadening

44. Proton- and Gamma-Induced Effects on Erbium-Doped Optical Fibers

45. Enhanced Degradation in Power MOSFET Devices Due to Heavy Ion Irradiation

46. Heavy Ion Energy Effects in CMOS SRAMs

47. Total Ionizing Dose Hardness Assurance Issues for High Dose Rate Environments

48. Total Ionizing Dose Effects in NOR and NAND Flash Memories

49. Radiation Response and Variability of Advanced Commercial Foundry Technologies

50. Implications of Characterization Temperature on Hardness Assurance Qualification

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