17 results on '"Friendlich, Mark R."'
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2. TPA laser and heavy-ion SEE testing: complementary technques for SDRAM single-event evaluation
3. Impact of low-energy proton induced upsets on test methods and rate predictions
4. Low energy proton single-event-upset test results on 65 nm SOI SRAM
5. Device-orientation effects on multiple-bit upset in 65 nm SRAMs
6. Single Event Effects (SEE) Testing of Embedded DSP Cores within Microsemi RTAX4000D Field Programmable Gate Array (FPGA) Devices
7. Radiation and Reliability Concerns for Modern Nonvolatile Memory Technology
8. Ultra-Scaled CMOS Radiation Performance
9. Heavy Ion Testing at the Galactic Cosmic Ray Energy Peak
10. Device-Orientation Effects on Multiple-Bit Upset in 65-nm SRAMs
11. Single Event Response of the Samsung 16G NAND Flash
12. 32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI Latches
13. Heavy Ion Testing With Iron at 1 GeV/amu
14. Heavy ion testing at the galactic cosmic ray energy peak
15. Compendium of Total Ionizing Dose Results and Displacement Damage Results for Candidate Spacecraft Electronics for NASA
16. Retention Characteristics of Commercial NAND Flash Memory After Radiation Exposure.
17. TPA Laser and Heavy-Ion SEE Testing: Complementary Techniques for S DRAM Single-Event Evaluation.
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