TPA laser and heavy-ion SEE testing: complementary technques for SDRAM single-event evaluation

Subjects

Subjects :

SDRAM -- Testing
SDRAM -- Quality management
Lasers -- Usage
SDRAM
Laser
Business
Electronics
Electronics and electrical industries

Details

Language :

English

ISSN :

00189499

Volume :

56

Issue :

6

Database :

Gale General OneFile

Journal :

IEEE Transactions on Nuclear Science

Publication Type :

Academic Journal

Accession number :

edsgcl.217014398