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Impact of low-energy proton induced upsets on test methods and rate predictions

Authors :
Sierawski, Brian D.
Pellish, Jonathan A.
Reed, Robert A.
Schrimpf, Ronald D.
Warren, Kevin M.
Weller, Robert A.
Mendenhall, Marcus H.
Black, Jeffrey D.
Tipton, Alan D.
Xapsos, Michael A.
Baumann, Robert C.
Deng, Xiaowei
Campola, Michae J.
Friendlich, Mark R.
Kim, Hak S.
Phan, Anthony M.
Seidleck, Christina M.
Source :
IEEE Transactions on Nuclear Science. Dec, 2009, Vol. 56 Issue 6, p3085, 8 p.
Publication Year :
2009

Subjects

Subjects :
Protons -- Electric properties
Ionization -- Testing
Static random access memory -- Electric properties
Monte Carlo method -- Usage
Extraterrestrial radiation -- Electric properties
SRAM
Business
Electronics
Electronics and electrical industries

Details

Language :
English
ISSN :
00189499
Volume :
56
Issue :
6
Database :
Gale General OneFile
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
edsgcl.216999850

Tools

Authors Abstract Subjects Details