1. Low Noise Amplification Reliability Issues.
- Author
-
BĂJENESCU, Titu-Marius I.
- Subjects
PRODUCT life cycle ,SKIN effect ,CONSUMERS ,NOISE - Abstract
The recent boom in wireless consumer applications has emphasized the requirement for low-cost, highly integrated RF parts. pHEMTs have become the technology of choice for current system requirements. A key requirement for all systems is high reliability components that do not fail or degrade in performance during the life cycle of the product. A confident use of these technologies relies on our capacity to better understand their fault mechanisms, and our ability to deduce related fault models. [ABSTRACT FROM AUTHOR]
- Published
- 2024
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