1,558 results on '"Hashizume, M."'
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202. Endoscopic image overlay surgical navigation using augmented and virtual reality technologies.
203. A Boundary Scan Circuit with Time-to-Digital Converter for Delay Testing.
204. In vitro and in vivo validation of robotic palpation-based needle insertion method for breast tumor treatment.
205. Waseda Bioinstrumentation system WB-3 as a wearable tool for objective laparoscopic skill evaluation.
206. An examination of sleep situation in college student of Japan and China
207. Output voltage estimation of a floating interconnect line caused by a hard open in 90nm ICs.
208. A method for diagnosing resistive open faults with considering adjacent lines.
209. Development of a tool manipulator driven by a flexible shaft for Single Port Endoscopic Surgery.
210. Test Data Reduction for BIST-Aided Scan Test Using Compatible Flip-Flops and Shifting Inverter Code.
211. Objective evaluation of laparoscopic surgical skills using Waseda bioinstrumentation system WB-3.
212. Anemia and Iron Deficiency among Schoolchildren in the Aral Sea Region, Kazakhstan
213. Remote-controlled laparoscope manipulator system, Naviot™, for endoscopic surgery
214. Development of Laparoscope using Wedge Prisms which has the Flexible Viewpoint
215. A Study on Force Feedback for a Remote Laparoscopic Surgery Robot System
216. Integrated system for RFA therapy with biomechanical simulation and needle insertion robot.
217. A robotic palpation-based needle insertion method for diagnostic biopsy and treatment of breast cancer.
218. New Class of Tests for Open Faults with Considering Adjacent Lines.
219. Development of Pseudo 3D Visualization System by Superimposing Ultrasound Images.
220. Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC.
221. A Novel Approach for Improving the Quality of Open Fault Diagnosis.
222. A remote surgery experiment between Japan and Thailand over Internet using a low latency CODEC system.
223. Feasibility Analysis of Bipolar Electric Scalpel Forceps Manipulator with 2-DOFs Bending Mechanisms.
224. Integration of MRI and ultrasound in surgical navigation for robotic surgery.
225. Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines.
226. Current Testable Design of Resistor String DACs.
227. Clues for Modeling and Diagnosing Open Faults with Considering Adjacent Lines.
228. Extremely high prevalence of hypercalciuria in children living in the Aral Sea region
229. A remote surgery experiment between Japan-Korea using the minimally invasive surgical system.
230. Development of High Dexterity Minimally Invasive Surgical System with Augmented Force Feedback Capability.
231. Modular Design of Master-Slave Surgical Robotic System with Reliable Real-Time Control Performance.
232. A power supply circuit recycling charge in adiabatic dynamic CMOS logic circuits.
233. On configuring scan trees to reduce scan shifts based on a circuit structure.
234. Practical fault coverage of supply current tests for bipolar ICs.
235. CMOS open fault detection by appearance time of switching supply current.
236. IDDQ test method based on wavelet transformation for noisy current measurement environment.
237. A BIST circuit for IDDQ tests.
238. Reducing scan shifts using folding scan trees.
239. Rupture of Jejunal Varices Treated by Percutaneous Transhepatic Obliteration and Endoscopic Injection Sclerotherapy with N-Butyl-2-Cyanoacrylate
240. Test time reduction for IDDQ testing by arranging test vectors.
241. Random pattern testability of the open defect detection method using application of time-variable electric field.
242. Test pattern for supply current test of open defects by applying time-variable electric field.
243. CMOS open defect detection based on supply current in time-variable electric field and supply voltage application.
244. IDDQ sensing technique for high speed IDDQ testing.
245. Sequential redundancy removal using test generation and multiple unreachable states.
246. CMOS open defect detection by supply current test.
247. IDDQ testable design of static CMOS PLAs.
248. Testability analysis of IDDQ testing with large threshold value.
249. High speed IDDQ test and its testability for process variation.
250. A real-time digital VCR encode/decode and MPEG-2 decode LSI implemented on a dual-issue RISC processor
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