Test pattern for supply current test of open defects by applying time-variable electric field.

Details

Language :

English

ISBNs :

9780769512037

Database :

Complementary Index

Journal :

Proceedings 2001 IEEE International Symposium on Defect & Fault Tolerance in VLSI Systems

Publication Type :

Conference

Accession number :

81207129

Full Text :

https://doi.org/10.1109/DFTVS.2001.966781