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IDDQ sensing technique for high speed IDDQ testing.

Authors :
Takeda, T.
Hashizume, M.
Ichimiya, M.
Yotsuyanagi, H.
Miura, Y.
Kinoshita, K.
Source :
Proceedings 10th Asian Test Symposium; 2001, p111-116, 6p
Publication Year :
2001

Details

Language :
English
ISBNs :
9780769513782
Database :
Complementary Index
Journal :
Proceedings 10th Asian Test Symposium
Publication Type :
Conference
Accession number :
81647229
Full Text :
https://doi.org/10.1109/ATS.2001.990268