105 results on '"K. van Benthem"'
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52. Evaluation of Defect Structures from In Situ Dielectric Breakdown of SiO2-Based Gate Dielectric Layers
53. In situ Sintering of Ni Nanoparticles by Controlled Heating
54. Determination of Local Oxidations States in Ni-NiO Core-shell Structures Using White Line Intensity Ratios
55. In Situ Investigation of Dielectric Breakdown in Field Effect Transistors
56. Atomic Level Mechanisms of Solid-State Dewetting in Thin Metal Films Deposited on Silicon (100) Substrates
57. Investigation of Dielectric Breakdown on the Atomic Length-Scale Using In Situ STM-TEM
58. Atomic Resolution Investigation of Metal-Assisted Hydrogen Storage Mechanisms in Activated Carbon Fibers
59. Characterization of EuS Nanotubes in Quantum Confinement
60. Direct Imaging of Point Defect Configurations for Au inside Si Nanowires
61. Quantitative Image Contrast Variations in STEM
62. Quantitative Image Simulation for Scanning Transmission Electron Microscopy
63. Depth-related Contrast in Aberration-Corrected Confocal STEM
64. Image Formation Based on Atomic Resolution Core-loss Electron Energy Loss Spectroscopy
65. Aberration-Corrected STEM - More than just Higher Resolution
66. 3D Imaging with Single Atom Sensitivity using Confocal STEM
67. PtSi dominated Schottky barrier heights of Ni(Pt)Si contacts due to Pt segregation
68. Materials Applications of Aberration-Corrected STEM
69. High Resolution EELS with the Aberration Corrected STEM: Determining Interfacial Electronic Structures with High Accuracy
70. Seeing inside materials by aberration-corrected electron microscopy
71. The effect of interfacial layer properties on the performance of Hf-based gate stack devices
72. Critical notice
73. Point Talk and Period Talk
74. Ramsey Eliminability
75. Points and Periods
76. Primitive Notions
77. Periods
78. Events
79. Electronic structure investigations of Ni and Cr films on (100)SrTiO3 substrates using electron energy-loss spectroscopy
80. Towards ubiquitous and nonintrusive measurements of brain function in the real world: assessing blink-related oscillations during simulated flight using portable low-cost EEG.
81. Ion beam heating of kinetically constrained nanomaterials.
82. Reduction reactions and densification during in situ TEM heating of iron oxide nanochains.
83. Cross-sectional characterization of the dewetting of a Au/Ni bilayer film.
84. Preface.
85. Spark Plasma Sintering Apparatus Used for the Formation of Strontium Titanate Bicrystals.
86. Simultaneous Scanning Electron Microscope Imaging of Topographical and Chemical Contrast Using In-Lens, In-Column, and Everhart-Thornley Detector Systems.
87. Sacrificial Silver Nanoparticles: Reducing GeI2 To Form Hollow Germanium Nanoparticles by Electroless Deposition.
88. High speed direct imaging of thin metal film ablation by movie-mode dynamic transmission electron microscopy.
89. Consolidation of Partially Stabilized ZrO_{2} in the Presence of a Noncontacting Electric Field.
90. Quantitative analysis for in situ sintering of 3% yttria-stablized zirconia in the transmission electron microscope.
91. Ultra-long Magnetic Nanochains for Highly Efficient Arsenic Removal from Water.
92. In-situ observation of equilibrium transitions in Ni films; agglomeration and impurity effects.
93. Occupational therapists' capacity-building needs related to older driver screening, assessment, and intervention: a Canadawide survey.
94. Aberration-corrected scanning transmission electron microscopy: from atomic imaging and analysis to solving energy problems.
95. Older driver retraining: an updated systematic review of evidence of effectiveness.
96. Point defect configurations of supersaturated Au atoms inside Si nanowires.
97. Optimal doping control of magnetic semiconductors via subsurfactant epitaxy.
98. Depth sectioning in scanning transmission electron microscopy based on core-loss spectroscopy.
99. Three-dimensional ADF imaging of individual atoms by through-focal series scanning transmission electron microscopy.
100. Limitations to the measurement of oxygen concentrations by HRTEM imposed by surface roughness.
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