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Atomic Level Mechanisms of Solid-State Dewetting in Thin Metal Films Deposited on Silicon (100) Substrates
- Source :
- Microscopy and Microanalysis. 16:1462-1463
- Publication Year :
- 2010
- Publisher :
- Oxford University Press (OUP), 2010.
-
Abstract
- Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Details
- ISSN :
- 14358115 and 14319276
- Volume :
- 16
- Database :
- OpenAIRE
- Journal :
- Microscopy and Microanalysis
- Accession number :
- edsair.doi...........10c0ae677f6f3f2cc9491c4f6c011beb
- Full Text :
- https://doi.org/10.1017/s1431927610061258