444 results on '"Bodermann, Bernd"'
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52. Characterization of the optical aberrations of a metrological UV microscope
53. Applicability simulations of inverted plasmonic lenses
54. Welcome and Introduction to SPIE Conference 11783
55. Comparison of far field characterisation of DOEs with a goniometric DUV-scatterometer and a CCD-based system
56. Measurement of layer thicknesses with an improved optimization method for depolarizing Mueller matrices
57. Quasi-bound states in the continuum for deep subwavelength structural information retrieval for DUV nano-optical polarizers
58. Efficient Bayesian inversion for shape reconstruction of lithography masks
59. Some aspects on the uncertainty calculation in Mueller ellipsometry
60. Large Area Metasurface Lenses in the NIR Region
61. Reconstructing phase aberrations for high-precision dimensional microscopy
62. Advanced methods for optical nanometrology (Conference Presentation)
63. Method for non-invasive hemoglobin oxygen saturation measurement using broadband light source and color filters
64. An improved method to derive best-fit parameters and their uncertainties from depolarizing Mueller-matrices (Conference Presentation)
65. Systematic approach on illustrating the challenges represented by optical bidirectional measurements using rigorous simulations
66. Mueller matrix ellipsometry for enhanced optical form metrology of sub-lambda structures
67. Ellipsometric characterizations of individual nanoform structures
68. Pixel-Wise Multispectral Sensing System Using Nanostructured Filter Matrix for Biomedical Applications
69. Determination of structural deviations in wire grid polarizers for DUV application wavelengths by transmission spectroscopy in the visible spectral range
70. Method for non-invasive hemoglobin oxygen saturation measurement using broadband light source and color filters.
71. Mueller matrix ellipsometry for enhanced optical form metrology of sub-lambda structures.
72. Systematic approach on illustrating the challenges represented by optical bidirectional measurements using rigorous simulations.
73. Mueller matrix ellipsometry for enhanced optical form metrology of sub-lambda structures
74. Efficient global sensitivity analysis for silicon line gratings using polynomial chaos
75. Systematic approach on illustrating the challenges represented by optical bidirectional measurements using rigorous simulations
76. Structural changes in niobium oxide during electron beam evaporation
77. Vectorial 3D modeling of coherence scanning interferometry
78. Machine learning aided profile measurement in high-aspect-ratio nanostructures
79. Speed enhancement of interferometric snapshot ellipsometry using a direct filtering phase method
80. Modelling of transmission for a stack of two Fizeau wedges with matched parameters
81. Using DNA origami nanorulers as traceable distance measurement standards and nanoscopic benchmark structures
82. Quantifying parameter uncertainties in optical scatterometry using Bayesian inversion
83. Rigorous modeling of a confocal microscope.
84. Metrology of nanoscale grating structures by UV scatterometry
85. Method for non-invasive hemoglobin oxygen saturation measurement using broadband light source and color filters
86. Evaluation of the aberrations of a PDMS lens
87. A method for improving the accuracy of an extinction coefficient measurement of weakly absorbing interference layers
88. Faster region-based convolutional neural network method for estimating parameters from Newton's rings
89. Extending wavefront sensing range of phase diversity
90. An improved control structure for the tracking of sine command in a motion simulator
91. Design of a two-mirror telescope using a free-form surface for the primary mirror
92. Measurement of errors by axial misalignment and tilt of the null screen used in experimental arrangements by deflectometry
93. A flexible and simplified calibration procedure for fringe projection profilometry
94. On modeling of heat transfer and molten pool behavior in multi-layer and multi-track laser additive manufacturing process
95. A fully coupled diffusional-mechanical formulation for growth kinetics of precipitates in laser powder bed fusion process using a phase field approach
96. Modelling and tolerance analysis of volume-phase gratings in complex dispersive units
97. Error estimation due to approximations in Shack-Hartmann sensor based measurement of high slope freeform wavefront
98. Calculation of intensity distribution from a wavefront using ray-counting method
99. Performance enhancement of a BSDF test bench using an algorithm fed with laser-tracker measurements
100. High-order transmissive diffraction grating for high-resolution spectral systems
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